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TI-TLV990-28.pdf
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TI-TLV990-28.pdf
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SLAS300A − AUGUST 2000 − REVISED MARCH 2004
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
features
D Single-Chip CCD Analog Front-End
D 10-Bit, 28-MSPS, Single 3-V Supply
Operation A/D Converter
D Very Low Power: 150-mW Typical, 2-mW
Power-Down Mode
D Differential Nonlinearity Error:
< ±0.5 LSB Typical
D Integral Nonlinearity Error:
< ±0.75 LSB Typical
D Programmable Gain Amplifier (PGA) With
0-dB to 36-dB Gain Range (0.045 dB/Step)
D Automatic or Programmable Optical Black
Level and Offset Calibration With Digital
Filter and Bad Pixel Limits
D Additional DACs for External Analog
Setting
D Serial Interface for Register Configuration
D Internal-Reference Voltages
D 48-Pin TQFP Package
application
D Digital Still Camera
D Video Camcorder
description
The TLV990-28 is a complete CCD signal
processor/digitizer designed for digital still
camera and PC camera applications. The
TLV990-28 performs all the analog-processing
functions necessary to maximize the dynamic range, corrects various errors associated with the CCD sensor,
and then digitizes the results with an on-chip high-speed analog-to-digital converter (ADC).
The key components of the TLV990-28 include: an input clamp circuit for CCD signal, a correlated double
sampler (CDS), a programmable-gain amplifier (PGA) with 0 to 36-dB gain range, two internal digital-to-analog
converters (DAC) for automatic or programmable optical black level and offset calibration, a 10-bit, 28-MSPS
pipeline ADC, a parallel data port for easy microprocessor interface, a serial port for configuring internal control
registers, two additional DACs for external system control, and internal reference voltages.
Designed in advanced CMOS process, the TLV990-28 operates from a single 3-V power supply with a normal
power consumption of 150 mW at 28 MSPS and 2 mW in power-down mode.
Its very high throughput rate, single 3-V operation, very low-power consumption, and fully-integrated
analog-processing circuitry make the TLV990-28 an ideal CCD signal-processing solution for digital still
cameras and electronic video camcorder applications.
This device is available in a 48-pin TQFP package and is specified over a –20°C to 75°C operating-temperature
range.
Copyright 2004, Texas Instruments Incorporated
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
23
OE
SCKP
DACO
2
DACO
1
AGND
3
AV
DD3
DIGND
DIV
DD
D9
D8
D7
D6
24
23
22
21
20
19
18
17
16
15
14
13
4
37
38
39
40
41
42
43
44
45
46
47
48
AGND5
RBD
RMD
RPD
AV
DD5
V
SS
AV
DD1
AGND1
SR
SV
CLCCD
CLREF
567 8
RESET
CS
SDIN
SCLK
35 34 33 32 3136 30
BLKG
CP
CP
AV
AGND4
D3
D4
D5
DD2
D0
D1
D2
28 27 2629
9 10 11 12
25
1
ADCCLK
OBCLP
STBY
NC
CCDIN
AGND2
PFB PACKAGE
(TOP VIEW)
AV
DGND
DD
DV
DD4
TLV990−28PFB
SLAS300A − AUGUST 2000 − REVISED MARCH 2004
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
AVAILABLE OPTIONS
PACKAGE DEVICE
T
A
TQFP
(PFB)
−20°C to 75°C TLV990-28PFB
functional block diagram
Σ
10-Bit
ADC
PGA
8-Bit
CDAC
Offset
Register
PGA
Regulator
10
Σ
8-Bit
FDAC
Offset
Register
INT. REF.
Optical
Black
Pixel Limits
Digital
Averager/
Filter
Three
State
Latch
Timing
and
Control
Logic
Serial
Port
DAC
REG
8-Bit
DAC
DAC
REG
8-Bit
DAC
Clamp
1.2 V REF
CCDIN
DACO1
DACO2
CLCCD CLREF
AVDD1−5
RPD RBD RMD
OE
D0
D9
RESET
CLK
SV
SR
BLKG
OBCLP
STBY
CS
SCLK
SDIN
DIGNDDGND
AGND1−5
VSS
SCKP
CDS/
MUX
DV
DD
DIV
DD
SLAS300A − AUGUST 2000 − REVISED MARCH 2004
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Terminal Functions
TERMINAL I/O DESCRIPTION
NAME NO.
ADCCLK 25 I ADC clock input
AGND1 44 Analog ground for internal CDS circuits
AGND2 4 Analog ground for internal PGA circuits
AGND3 20 Analog ground for internal DAC circuits
AGND4 32 Analog ground for internal ADC circuits
AGND5 37 Analog ground for internal REF circuits
AV
DD1
43 Analog supply voltage for internal CDS circuits, 3 V
AV
DD2
3 Analog supply voltage for internal PGA circuits, 3 V
AV
DD3
19 Analog supply voltage for internal DAC circuits, 3 V
AV
DD4
33 Analog supply voltage for internal ADC circuits, 3 V
AV
DD5
41 Analog supply voltage for internal ADC circuits, 3 V
BLKG 36 I Control input. The CDS operation is disabled when BLKG is pulled low.
CLCCD 47 I CCD signal clamp control input
CCDIN 1 I CCD input
CLREF 48 O Clamp-reference-voltage output
CP 34, 35 I Connect these pins to AV
DD
CS 28 I Chip select. A logic low on this input enables the serial port.
D0 – D9 7–16 O 10-bit 3-state ADC output data or offset DACs test data
DACO1 21 O Digital-to-analog converter output1
DACO2 22 O Digital-to-analog converter output2
DGND 5 Digital ground
DIGND 18 Digital-interface-circuit ground
DIV
DD
17 Digital-interface-circuit supply voltage, 1.8 V− 4.4 V
DV
DD
6 Digital-supply voltage, 3 V
NC 2 I No connect
OBCLP 31 I Optical black-level and offset-calibration control input, active low
OE 24 I Output-data enable, active low
RBD 38 O Internal bandgap reference for external decoupling
RESET 29 I Hardware-reset input, active low. This signal forces a reset of all internal registers.
RMD 39 O Ref− output for external decoupling
RPD 40 O Ref+ output for external decoupling
SDIN 27 I Serial-data input to configure the internal registers
SCKP 23 I This pin selects the polarity of SCLK. 0 – active low (high when SCLK is not running), 1 – active high (low
when SCLK is not running).
SCLK 26 I Serial-clock input. This clock synchronizes the serial data transfer.
SR 45 I CCD reference-level-sample clock input
STBY 30 I Hardware power-down control input, active low
SV 46 I CCD signal-level sample clock input
V
SS
42 Silicon substrate, normally connected to analog ground
SLAS300A − AUGUST 2000 − REVISED MARCH 2004
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
†
Supply voltage, AV
DD
, DV
DD
, DIV
DD
−0.3 V to 6.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog input voltage range −0.3 V to AV
DD
+0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range −0.3 V to DV
DD
+0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating
virtual junction temperature range, T
J
−40°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
−20°C to 75°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
−65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
power supplies
MIN NOM MAX UNIT
Analog supply voltage AV
DD
2.7 3 3.3 V
Digital supply voltage DV
DD
2.7 3 3.3 V
Digital interface supply voltage DIV
DD
1.8 4.4 V
digital inputs, DIV
DD
= 3 V
MIN NOM MAX UNIT
High-level input voltage, V
IH
0.8DIV
DD
V
Low-level input voltage, V
IL
0.2DIV
DD
V
Input ADCCLK frequency 28 MHz
ADCCLK pulse duration, clock high, t
w(MCLKH)
17.8 ns
ADCCLK pulse duration, clock low, t
w(MCLKL)
17.8 ns
Input SCLK frequency 40 MHz
SCLK pulse duration, clock high, t
w(SCLKH)
12.5 ns
SCLK pulse duration, clock low, t
w(SCLKL)
12.5 ns
SLAS300A − AUGUST 2000 − REVISED MARCH 2004
5
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range, T
A
= 25°C, AV
DD
= DV
DD
= 3 V, ADCCLK = 28 MHz (unless otherwise noted)
total device
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
AV
DD
operating current 34 mA
DV
DD
operating current 4 mA
Device power consumption 150 mW
Power consumption in power-down mode 2 mW
INL Full CCD channel integral nonlinearity
AV
DD
=DV
DD
= 2.7 V – 3.3 V,
Using best fit method
±0.75 ±2 LSB
DNL Full CCD channel differential nonlinearity AV
DD
=DV
DD
= 2.7 V – 3.3 V ±0.5 ±0.99 LSB
No missing code Assured
Full channel output latency 6
CLK
cycles
analog-to-digital converter (ADC)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ADC resolution in CCD mode 10 Bits
Full-scale input span 2 V
P-P
Conversion rate 28 MHz
correlated double sample (CDS) and programmable gain amplifier (PGA)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
CDS and PGA sample rate 28 MHz
CDS full-scale input span Single-ended input 1 V
Input capacitance of CDS 4 pF
Minimum PGA gain 0 1 dB
Maximum PGA gain 35 36 37 dB
PGA gain resolution 0.045 dB
PGA programming code resolution 10 Bits
internal digital-to-analog converters (DAC) for offset correction
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
DAC resolution 8 Bits
INL Integral nonlinearity ±0.5 LSB
DNL Differential nonlinearity ±0.5 LSB
Output settling time To 1% accuracy 80 ns
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