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TI-ADS130E08.pdf
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TI-ADS130E08.pdf
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EMI
Filters
and
Input
MUX
Control
and
SPI Interface
Voltage
Reference
Oscillator
Fault
Detection
Test
Device
Current
Sensing
Line A
Voltage
Sensing
Channel 1
Channel 2
Channel 3
PGA
û
ADC
PGA
û
ADC
PGA
û
ADC
Current
Sensing
Voltage
Sensing
Current
Sensing
Voltage
Sensing
Current
Sensing
Voltage
Sensing
PGA
û
ADC
PGA
û
ADC
PGA
û
ADC
Channel 4
Channel 5
Channel 6
Channel 7
Channel 8
PGA
û
ADC
PGA
û
ADC
Line B
Line C
Line N
Op
Amp
ADS130E08
www.ti.com.cn
ZHCS975A –JULY 2012–REVISED SEPTEMBER 2012
用用于于计计量量应应用用的的低低成成本本、、8 通通道道、、集集成成模模拟拟前前端端
查查询询样样品品: ADS130E08
1
特特性性
说说明明
23
• 8 个个差差分分电电流流和和电电压压输输入入
ADS130E08 是一款多通道、同步采样、16 位、三角
• 8 个个低低噪噪声声可可编编程程增增益益放放大大器器 (PGA) 与与
积分 (ΔΣ) 模数转换器 (ADC),此转换器带有内置可编
8 个个高高分分辨辨率率模模数数转转换换器器 (ADC)
程增益放大器 (PGA),内部基准,和一个外部振荡器
• 超超过过 1.0 类类性性能能
接口。
• 共共模模抑抑制制比比 (CMRR):: –110 dB
• 串串扰扰::-105dB
此器件组装有工业仪表计量应用中的常用特性。 凭借
• 总总谐谐波波失失真真 (THD)::-108dB
其高度的集成性及出色的性能,ADS130E08 系列产品
• 功功率率::每每通通道道 750µW
能够在大幅缩小尺寸、降低功耗与整体成本的同时,创
• 数数据据速速率率::8 每每秒秒千千次次采采样样 (kSPS)
建可扩展工业电源系统。
• 可可编编程程增增益益((1,,2,,和和 8))
ADS130E08 每通道上提供一个灵活的输入多路复用
• 直直流流耦耦合合::
器,此多路复用器可独立连接至内部生成的信号来实现
– 双双电电源源::+3V 至至 +5V 或或者者
测试、温度、和故障检测。 ADS130E08 运行数据速
+1.8V 至至 +3.6V
率为 8kSPS。 故障检测可在器件内部执行,此器件使
– 双双极极电电源源::±2.5V
用由数模转换器 (DAC) 控制触发电平的集成比较器。
• 内内置置测测试试信信号号
• 故故障障检检测测比比较较器器
可在菊花链配置的高通道数量系统中串联多个器件。
• 四四个个通通用用输输入入输输出出 (GPIO) 引引脚脚
这些完整的模拟前端 (AFE) 解决方案采用 TQFP-64 封
• 内内部部和和外外部部基基准准
装,额定工业温度范围为 -40°C 至 +105°C。
• 灵灵活活的的省省电电模模式式::STBY((待待机机))模模式式
• 串串行行外外设设接接口口 (SPI)™ 数数据据接接口口
• 封封装装::薄薄型型四四方方扁扁平平封封装装 (TQFQ)-64 (PAG)
• 工工作作温温度度范范围围::
-40°C 至至 +105°C
应应用用范范围围
• 工工业业电电源源应应用用::
– 三三相相仪仪表表计计量量
– 工工业业应应用用
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2串行外设接口 (SPI) is a trademark of Motorola.
3All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2012, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not English Data Sheet: SBAS574
necessarily include testing of all parameters.
ADS130E08
ZHCS975A –JULY 2012–REVISED SEPTEMBER 2012
www.ti.com.cn
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FAMILY AND ORDERING INFORMATION
(1)
OPERATING
NUMBER OF MAXIMUM SAMPLE TEMPERATURE
PRODUCT PACKAGE OPTION CHANNELS ACCURACY RATE (kSPS) RANGE
ADS130E08 TQFP-64 8 Class 1.0 8 –40°C to +105°C
ADS131E04 TQFP-64 4 Class 0.1 64 –40°C to +105°C
ADS131E06 TQFP-64 6 Class 0.1 64 –40°C to +105°C
ADS131E08 TQFP-64 8 Class 0.1 64 –40°C to +105°C
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE UNIT
AVDD to AVSS –0.3 to +5.5 V
DVDD to DGND –0.3 to +3.9 V
AVSS to DGND –2.75 to +0.2 V
V
REF
input to AVSS AVSS – 0.3 to AVDD + 0.3 V
Analog input to AVSS AVSS – 0.3 to AVDD + 0.3 V
Digital input voltage to DVDD –0.3 to DVDD + 0.3 V
Digital output voltage to DGND –0.3 to DVDD + 0.3 V
Momentary 100 mA
Input current
Continuous 10 mA
Operating, T
A
–40 to +105 °C
Temperature Storage, T
stg
–60 to +150 °C
Maximum junction, T
J
+150 °C
Human body model (HBM)
±1000 V
JEDEC standard 22, test method A114-C.01, all pins
Electrostatic discharge
(ESD) ratings
Charged device model (CDM)
±500 V
JEDEC standard 22, test method C101, all pins
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2 Copyright © 2012, Texas Instruments Incorporated
ADS130E08
www.ti.com.cn
ZHCS975A –JULY 2012–REVISED SEPTEMBER 2012
ELECTRICAL CHARACTERISTICS
Minimum and maximum specifications apply from –40°C to +105°C. Typical specifications are at +25°C. All specifications are
at DVDD = 1.8 V, AVDD = 3 V, AVSS = 0 V, V
REF
= 2.4 V, external f
CLK
= 2.048 MHz, data rate = 8 kSPS, and gain = 1,
unless otherwise noted.
ADS130E08
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ANALOG INPUTS
Full-scale differential input voltage
±V
REF
/ gain V
(AINP – AINN)
See the Input Common-Mode Range
Input common-mode range subsection of the PGA Settings and
Input Range section
C
I
Input capacitance 20 pF
I
IB
Input bias current 2 nA
DC input impedance 500 MΩ
PGA PERFORMANCE
Gain settings 1, 2, 8
BW Bandwidth See Table 1
ADC PERFORMANCE
Resolution No missing codes 16 Bits
DR Data rate f
CLK
= 2.048 MHz 8 kSPS
CHANNEL PERFORMANCE (DC Performance)
G = 1 86 89 dB
Dynamic range
G = 2 and 8 89 dB
INL Integral nonlinearity Full-scale with gain = 1, best fit 3 ppm
E
O
Offset error ±350 μV
Offset error drift 0.6 μV/°C
E
G
Gain error Excluding voltage reference error ±0.1 % of FS
Gain drift Excluding voltage reference drift 3 ppm/°C
Gain match between channels 0.2 % of FS
CHANNEL PERFORMANCE (AC Performance)
CMRR Common-mode rejection ratio f
CM
= 50 Hz and 60 Hz
(1)
–110 dB
PSRR Power-supply rejection ratio f
PS
= 50 Hz and 60 Hz 80 dB
Crosstalk f
IN
= 50 Hz and 60 Hz –105 dB
1:3000 dynamic range with a 1-second
Accuracy 0.5 %
measurement (V
RMS
/ I
RMS
)
SNR Signal-to-noise ratio f
IN
= 10-Hz input, –0.5 dBFs 89 dB
THD Total harmonic distortion 10 Hz, –0.5 dBFs –108 dB
OPEN-CIRCUIT DETECT AND ALARM
Comparator threshold accuracy ±30 mV
EXTERNAL REFERENCE
AVDD = 3 V, V
REF
= (VREFP – VREFN) 2.5 V
V
I(ref)
Reference input voltage
AVDD = 5 V, V
REF
= (VREFP – VREFN) 4 V
VREFN Negative input AVSS V
VREFP Positive input AVSS + 2.5 V
Input impedance 10 kΩ
(1) CMRR is measured with a common-mode signal of (AVSS + 0.3 V) to (AVDD – 0.3 V). The values indicated are the minimum of the
eight channels.
Copyright © 2012, Texas Instruments Incorporated 3
ADS130E08
ZHCS975A –JULY 2012–REVISED SEPTEMBER 2012
www.ti.com.cn
ELECTRICAL CHARACTERISTICS (continued)
Minimum and maximum specifications apply from –40°C to +105°C. Typical specifications are at +25°C. All specifications are
at DVDD = 1.8 V, AVDD = 3 V, AVSS = 0 V, V
REF
= 2.4 V, external f
CLK
= 2.048 MHz, data rate = 8 kSPS, and gain = 1,
unless otherwise noted.
ADS130E08
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
OPERATIONAL AMPLIFIER
Integrated noise 0.1 Hz to 100 Hz 7 µV
RMS
Noise density 2 kHz 120 nV/√Hz
GBP Gain bandwidth product 50 kΩ || 10-pF load 100 kHz
SR Slew rate 50 kΩ || 10-pF load 0.25 V/µs
Load current 50 µA
THD Total harmonic distortion f
IN
= 100 Hz 70 dB
CMIR Common-mode input range AVSS + 0.7 AVSS – 0.3 V
Quiescent power consumption 20 µA
INTERNAL REFERENCE
CONFIG3.VREF_4V = 0 2.4 V
V
O
Output voltage
CONFIG3.VREF_4V = 1 4 V
V
REF
accuracy ±0.2 %
Drift –40°C to +105°C 45 ppm/°C
Start-up time Settled to 0.2% 150 ms
SYSTEM MONITORS
Analog supply reading error 2 %
Digital supply reading error 2 %
From power-up to DRDY low 150 ms
Device wake up
STANDBY mode 125 µs
Voltage T
A
= +25°C 145 mV
Temperature sensor
reading
Coefficient 490 μV/°C
TEST SIGNAL
Hz
f
CLK
/ 2
21
Signal frequency See Register Map section for settings
Hz
f
CLK
/ 2
20
±1 mV
Signal voltage See Register Map section for settings
±2 mV
Accuracy ±2 %
CLOCK
Nominal frequency 2.048 MHz
Internal oscillator clock frequency T
A
= +25°C ±0.5 %
–40°C ≤ T
A
≤ +105°C ±2.5 %
Internal oscillator start-up time 20 μs
Internal oscillator power consumption 120 μW
External clock input frequency CLKSEL pin = 0 0.7 2.048 2.25 MHz
DIGITAL INPUT AND OUTPUT (DVDD = 1.8 V to 3.6 V)
V
IH
High 0.8 DVDD DVDD + 0.1 V
Logic level,
input voltage
V
IL
Low –0.1 0.2 DVDD V
V
OH
High I
OH
= –500 µA 0.9 DVDD V
Logic level,
output voltage
V
OL
Low I
OL
= +500 µA 0.1 DVDD V
I
IN
Input current 0 V < V
DigitalInput
< DVDD –10 +10 μA
4 Copyright © 2012, Texas Instruments Incorporated
ADS130E08
www.ti.com.cn
ZHCS975A –JULY 2012–REVISED SEPTEMBER 2012
ELECTRICAL CHARACTERISTICS (continued)
Minimum and maximum specifications apply from –40°C to +105°C. Typical specifications are at +25°C. All specifications are
at DVDD = 1.8 V, AVDD = 3 V, AVSS = 0 V, V
REF
= 2.4 V, external f
CLK
= 2.048 MHz, data rate = 8 kSPS, and gain = 1,
unless otherwise noted.
ADS130E08
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
POWER-SUPPLY REQUIREMENTS
AVDD Analog supply AVDD – AVSS 2.7 3 5.25 V
DVDD Digital supply 1.7 1.8 3.6 V
AVDD – DVDD –2.1 3.6 V
SUPPLY CURRENT (Operational Amplifier Turned Off)
AVDD – AVSS = 3 V 1.8 mA
I
AVDD
AVDD – AVSS = 5 V 2.2 mA
Normal operation
DVDD = 3.3 V 0.5 mA
I
DVDD
DVDD = 1.8 V 0.3 mA
POWER DISSIPATION
Normal mode 6 6.6 mW
Quiescent power dissipation
Power-down mode 10 µW
(analog supply = 3 V)
Standby mode 2 mW
Normal mode 11.5 mW
Quiescent power dissipation
Power-down mode 20 µW
(analog supply = 5 V)
Standby mode 4 mW
TEMPERATURE
Specified –40 +105 °C
Temperature range Operating –40 +105 °C
Storage –60 +150 °C
THERMAL INFORMATION
ADS130E08
THERMAL METRIC
(1)
PAG (TQFP) UNITS
64 PINS
θ
JA
Junction-to-ambient thermal resistance 35
θ
JCtop
Junction-to-case (top) thermal resistance 31
θ
JB
Junction-to-board thermal resistance 26
°C/W
ψ
JT
Junction-to-top characterization parameter 0.1
ψ
JB
Junction-to-board characterization parameter NA
θ
JCbot
Junction-to-case (bottom) thermal resistance NA
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
Copyright © 2012, Texas Instruments Incorporated 5
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