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TI-LM5109A.pdf
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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
LM5109A
SNVS412C –APRIL 2006–REVISED SEPTEMBER 2016
LM5109A High Voltage 1A Peak Half Bridge Gate Driver
1
1 Features
1
• Drives Both a High-Side and Low-Side N-Channel
MOSFET
• 1A peak Output Current (1.0A Sink / 1.0A Source)
• Independent TTL Compatible Inputs
• Bootstrap Supply Voltage to 108V DC
• Fast Propagation Times (30 ns Typical)
• Drives 1000 pF Load with 15ns Rise and Fall
Times
• Excellent Propagation Delay Matching (2 ns
Typical)
• Supply Rail Under-Voltage Lockout
• Low Power Consumption
• Pin Compatible with ISL6700
• Industry Standard SOIC-8 and Thermally
Enhanced WSON-8 Package
2 Applications
• Current Fed Push-Pull Converters
• Half and Full Bridge Power Converters
• Solid State Motor Drives
• Two Switch Forward Power Converters
3 Description
The LM5109A is a cost effective, high voltage gate
driver designed to drive both the high-side and the
low-side N-Channel MOSFETs in a synchronous
buck or a half bridge configuration. The floating high-
side driver is capable of working with rail voltages up
to 90V. The outputs are independently controlled with
TTL compatible input thresholds. The robust level
shift technology operates at high speed while
consuming low power and providing clean level
transitions from the control input logic to the high-side
gate driver. Under-voltage lockout is provided on both
the low-side and the high-side power rails. The
device is available in the SOIC and the thermally
enhanced WSON packages.
Device Information
(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
LM5109A
SOIC (8) 4.90 mm × 3.91 mm
WSON (8) 4.00 mm × 4.00 mm
(1) For all available packages, see the orderable addendum at
the end of the datasheet.
Simplified Application Diagram
2
LM5109A
SNVS412C –APRIL 2006–REVISED SEPTEMBER 2016
www.ti.com
Product Folder Links: LM5109A
Submit Documentation Feedback Copyright © 2006–2016, Texas Instruments Incorporated
Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description ............................................................. 1
4 Revision History..................................................... 2
5 Pin Configuration and Functions......................... 3
6 Specifications......................................................... 3
6.1 Absolute Maximum Ratings ...................................... 3
6.2 ESD Ratings.............................................................. 4
6.3 Recommended Operating Conditions....................... 4
6.4 Thermal Information.................................................. 4
6.5 Electrical Characteristics........................................... 4
6.6 Switching Characteristics.......................................... 5
6.7 Typical Performance Characteristics ........................ 6
7 Detailed Description.............................................. 8
7.1 Overview ................................................................... 8
7.2 Functional Block Diagram ......................................... 8
7.3 Feature Description................................................... 8
7.4 Device Functional Modes.......................................... 9
8 Application and Implementation ........................ 10
8.1 Application Information............................................ 10
8.2 Typical Application ................................................. 11
9 Power Supply Recommendations...................... 15
10 Layout................................................................... 16
10.1 Layout Guidelines ................................................. 16
10.2 Layout Example .................................................... 16
11 Device and Documentation Support ................. 17
11.1 Documentation Support ........................................ 17
11.2 Receiving Notification of Documentation Updates 17
11.3 Community Resource............................................ 17
11.4 Trademarks ........................................................... 17
11.5 Electrostatic Discharge Caution............................ 17
11.6 Glossary ................................................................ 17
12 Mechanical, Packaging, and Orderable
Information ........................................................... 17
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (March 2016) to Revision C Page
• Updated values in the Thermal Information table to align with JEDEC standards................................................................. 4
• Added Overview section......................................................................................................................................................... 8
• Added Feature Description section. ....................................................................................................................................... 8
• Added Device Functional Modes section. .............................................................................................................................. 9
• Added Typical Application section........................................................................................................................................ 11
• Added Power Supply Recommendations section. .............................................................................................................. 15
Changes from Revision A (March 2013) to Revision B Page
• Added Device Information table, ESD Ratings, Pin Configuration and Functions section, Detailed Description
section, Application and Implementation section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................ 1
Changes from Original (March 2013) to Revision A Page
• Changed layout of National Semiconductor Data Sheet to TI format .................................................................................. 10
HI
LI
V
SS
HO
HS
LO
HB
V
DD
1
2
3
4
8
7
6
5
HI
LI
V
SS
HO
HS
LO
HB
V
DD
1
2
3
4
8
7
6
5
3
LM5109A
www.ti.com
SNVS412C –APRIL 2006–REVISED SEPTEMBER 2016
Product Folder Links: LM5109A
Submit Documentation FeedbackCopyright © 2006–2016, Texas Instruments Incorporated
5 Pin Configuration and Functions
D Package
8-Pin SOIC
Top View
NGT Package
8-Pin WSON
Top View
(1) For WSON package it is recommended that the exposed pad on the bottom of the package be soldered to ground plane on the PCB
and the ground plane should extend out from underneath the package to improve heat dissipation.
Pin Functions
Pin #
NAME DESCRIPTION APPLICATION INFORMATION
SOIC WSON
(1)
1 1 V
DD
Positive gate drive supply
Locally decouple to V
SS
using low ESR/ESL capacitor located as
close to IC as possible.
2 2 HI High side control input
The HI input is compatible with TTL input thresholds. Unused HI input
should be tied to ground and not left open
3 3 LI Low side control input
The LI input is compatible with TTL input thresholds. Unused LI input
should be tied to ground and not left open.
4 4 V
SS
Ground reference All signals are referenced to this ground.
5 5 LO Low side gate driver output Connect to the gate of the low-side N- MOS device.
6 6 HS High side source connection
Connect to the negative terminal of the bootstrap capacitor and to the
source of the high-side N-MOS device.
7 7 HO High side gate driver output Connect to the gate of the high-side N-MOS device.
8 8 HB
High side gate driver positive
supply rail
Connect the positive terminal of the bootstrap capacitor to HB and
the negative terminal of the bootstrap capacitor to HS. The bootstrap
capacitor should be placed as close to IC as possible.
(1) Absolute Maximum Ratings indicate limits beyond which damage to the component may occur. Operating Ratings are conditions under
which operation of the device is specified. Operating Ratings do not imply performance limits. For performance limits and associated test
conditions, see the Electrical Characteristics.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
(3) In the application the HS node is clamped by the body diode of the external lower N-MOSFET, therefore the HS voltage will generally
not exceed –1V. However in some applications, board resistance and inductance may result in the HS node exceeding this stated
voltage transiently. If negative transients occur on HS, the HS voltage must never be more negative than V
DD
– 15V. For example, if
V
DD
= 10V, the negative transients at HS must not exceed –5V.
6 Specifications
6.1 Absolute Maximum Ratings
See
(1)(2)
MIN MAX UNIT
V
DD
to V
SS
–0.3 18 V
HB to HS −0.3 18 V
LI or HI to V
SS
−0.3 V
DD
+ 0.3 V
LO to V
SS
−0.3 V
DD
+ 0.3 V
HO to V
SS
V
HS
− 0.3 V
HB
+ 0.3 V
HS to V
SS
(3)
−5 90 V
HB to V
SS
108 V
Junction Temperature –40 150 °C
Storage Temperature Range −55 150 °C
4
LM5109A
SNVS412C –APRIL 2006–REVISED SEPTEMBER 2016
www.ti.com
Product Folder Links: LM5109A
Submit Documentation Feedback Copyright © 2006–2016, Texas Instruments Incorporated
(1) The human body model is a 100 pF capacitor discharged through a 1.5kΩ resistor into each pin.
6.2 ESD Ratings
VALUE UNIT
V
(ESD)
Electrostatic discharge Human-body model (HBM)
(1)
±1500 V
(1) In the application the HS node is clamped by the body diode of the external lower N-MOSFET, therefore the HS voltage will generally
not exceed –1V. However in some applications, board resistance and inductance may result in the HS node exceeding this stated
voltage transiently. If negative transients occur on HS, the HS voltage must never be more negative than V
DD
– 15V. For example, if
V
DD
= 10V, the negative transients at HS must not exceed –5V.
6.3 Recommended Operating Conditions
MIN NOM MAX UNIT
V
DD
8 14 V
HS
(1)
−1 90 V
HB V
HS
+ 8 V
HS
+ 14 V
HS Slew Rate < 50 V/ns
Junction Temperature −40 125 °C
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.4 Thermal Information
THERMAL METRIC
(1)
LM5109A
UNITD (SOIC) NGT (WSON)
8 PINS 8 PINS
R
θJA
Junction-to-ambient thermal resistance 117.6 42.3 °C/W
R
θJC(top)
Junction-to-case (top) thermal resistance 64.9 34 °C/W
R
θJB
Junction-to-board thermal resistance 58.1 19.3 °C/W
ψ
JT
Junction-to-top characterization parameter 17.4 0.4 °C/W
ψ
JB
Junction-to-board characterization parameter 57.6 19.5 °C/W
R
θJC(bot)
Junction-to-case (bottom) thermal resistance – 8.1 °C/W
(1) Minimum and maximum limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through
correlation using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).
6.5 Electrical Characteristics
Unless otherwise specified, V
DD
= V
HB
= 12V, V
SS
= V
HS
= 0V, No Load on LO or HO
(1)
. Typical limits are for T
J
= 25°C, and
minimum and maximum limits apply over the operating junction temperature range (–40°C to 125°C).
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SUPPLY CURRENTS
I
DD
V
DD
quiescent current LI = HI = 0V 0.3 0.6 mA
I
DDO
V
DD
operating current f = 500 kHz 1.8 2.9 mA
I
HB
Total HB quiescent current LI = HI = 0V 0.06 0.2 mA
I
HBO
Total HB operating current f = 500 kHz 1.4 2.8 mA
I
HBS
HB to V
SS
current, quiescent V
HS
= V
HB
= 90V 0.1 10 µA
I
HBSO
HB to V
SS
current, operating f = 500 kHz 0.5 mA
INPUT PINS LI and HI
V
IL
Low-level input voltage threshold 0.8 1.8 V
V
IH
High-level input voltage threshold 1.8 2.2 V
R
I
Input pulldown resistance 100 200 500 kΩ
UNDER-VOLTAGE PROTECTION
V
DDR
V
DD
rising threshold V
DDR
= V
DD
– V
SS
6.0 6.7 7.4 V
V
DDH
V
DD
threshold hysteresis 0.5 V
V
HBR
HB rising threshold V
HBR
= V
HB
– V
HS
5.7 6.6 7.1 V
LI
HI
t
HPLH
t
LPLH
t
HPHL
t
LPHL
LO
HO
LI
HI
t
MOFF
t
MON
LO
HO
5
LM5109A
www.ti.com
SNVS412C –APRIL 2006–REVISED SEPTEMBER 2016
Product Folder Links: LM5109A
Submit Documentation FeedbackCopyright © 2006–2016, Texas Instruments Incorporated
Electrical Characteristics (continued)
Unless otherwise specified, V
DD
= V
HB
= 12V, V
SS
= V
HS
= 0V, No Load on LO or HO
(1)
. Typical limits are for T
J
= 25°C, and
minimum and maximum limits apply over the operating junction temperature range (–40°C to 125°C).
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
HBH
HB threshold hysteresis 0.4 V
LO GATE DRIVER
V
OLL
Low-level output voltage I
LO
= 100 mA, V
OHL
= V
LO
– V
SS
0.38 0.65 V
V
OHL
High-level output voltage I
LO
= −100 mA, V
OHL
= V
DD
– V
LO
0.72 1.20 V
I
OHL
Peak pullup current V
LO
= 0V 1.0 A
I
OLL
Peak pulldown current V
LO
= 12V 1.0 A
HO GATE DRIVER
V
OLH
Low-level output voltage I
HO
= 100 mA, V
OLH
= V
HO
– V
HS
0.38 0.65 V
V
OHH
High-level output voltage I
HO
= −100 mA, V
OHH
= V
HB
– V
HO
0.72 1.20 V
I
OHH
Peak pullup current V
HO
= 0V 1.0 A
I
OLH
Peak pulldown current V
HO
= 12V 1.0 A
6.6 Switching Characteristics
Unless otherwise specified, V
DD
= V
HB
= 12V, V
SS
= V
HS
= 0V, No Load on LO or HO. Typical limits are for T
J
= 25°C, and
minimum and maximum limits apply over the operating junction temperature range (–40°C to 125°C).
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
LPHL
Lower turn-off propagation delay
(LI falling to LO falling)
30 56 ns
t
HPHL
Upper turn-off propagation delay
(HI falling to HO falling)
30 56 ns
t
LPLH
Lower turn-on propagation delay
(LI rising to LO rising)
32 56 ns
t
HPLH
Upper turn-on propagation delay
(HI rising to HO rising)
32 56 ns
t
MON
Delay matching: lower turn-on and upper
turn-off
2 15 ns
t
MOFF
Delay matching: lower turn-off and upper
turn-on
2 15 ns
t
RC
, t
FC
Either output rise or fall time C
L
= 1000 pF 15 - ns
t
PW
Minimum input pulse width that changes
the output
50 ns
Figure 1. Timing Diagram
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