没有合适的资源?快使用搜索试试~ 我知道了~
MIL-STD-750-5_CHG-1.055869.pdf
1.该资源内容由用户上传,如若侵权请联系客服进行举报
2.虚拟产品一经售出概不退款(资源遇到问题,请及时私信上传者)
2.虚拟产品一经售出概不退款(资源遇到问题,请及时私信上传者)
版权申诉
0 下载量 42 浏览量
2023-08-04
14:08:58
上传
评论
收藏 256KB PDF 举报
温馨提示
![preview](https://dl-preview.csdnimg.cn/88167013/0001-b7502525792b90b982577f564a5123ce_thumbnail.jpeg)
![preview-icon](https://csdnimg.cn/release/downloadcmsfe/public/img/scale.ab9e0183.png)
试读
19页
MIL-STD-750-5_CHG-1.055869.pdf
资源推荐
资源详情
资源评论
![zip](https://img-home.csdnimg.cn/images/20210720083736.png)
![pdf](https://img-home.csdnimg.cn/images/20210720083512.png)
![](https://csdnimg.cn/release/download_crawler_static/88167013/bg1.jpg)
AMSC N/A FSC 5961
INCH–POUND
MIL–STD–750–5
w/CHANGE 1
10 August 2018
SUPERSEDING
MIL–STD–750–5
3 January 2012
(see 6.4)
DEPARTMENT OF DEFENSE
TEST METHOD STANDARD
HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES
PART 5: TEST METHODS 5000 THROUGH 5999
The documentation and process
conversion measured necessary to
comply with this revision shall be
completed by 10 December 2018.
Downloaded from http://www.everyspec.com
![](https://csdnimg.cn/release/download_crawler_static/88167013/bg2.jpg)
MIL–STD–750–5
w/CHANGE 1
ii
FOREWORD
1. This standard is approved for use by all Departments and Agencies of the Department of Defense.
2. This subpart standard establishes uniform test methods for high reliability space applications.
3. Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Logistics Agency, DLA Land and Maritime, ATTN: VAC, P.O. Box 3990, Columbus, OH 43218–3990, or
emailed to 750.TestMethods@dla.mil. Since contact information can change, you may want to verify the
currency of this address information using the ASSIST Online database at https://assist.dla.mil.
Downloaded from http://www.everyspec.com
![](https://csdnimg.cn/release/download_crawler_static/88167013/bg3.jpg)
MIL–STD–750–5
w/CHANGE 1
iii
SUMMARY OF CHANGE 1 MODIFICATIONS
1. Paragraph 1.3 has been modified to comply with current format requirements.
2. Paragraph 2.2.1 has been modified to comply with current format requirements.
3. Paragraph 2.3 has been modified to comply with current format requirements. Documents that have been
canceled that were referenced in this test method standard have been removed. Documents not referenced
in this test method standard have been removed.
4. Paragraph 3.2 has been modified to remove acronyms not used in this test method standard.
5. Paragraph 6.4 has been modified.
6. Paragraph 6.5 has been added.
7. Test method 5010, paragraph 3.2, deleted canceled reference document.
8. The following modifications to MIL–STD–750–5 have been made:
Paragraph Modification
1.3 Changed.
2.2.1 Changed.
2.3 Changed.
3.2 Changed.
6.4 Changed.
6.5 Added.
Test method Paragraph Modification
5010 3.2 Changed
Downloaded from http://www.everyspec.com
![](https://csdnimg.cn/release/download_crawler_static/88167013/bg4.jpg)
MIL–STD–750–5
w/CHANGE 1
iv
CONTENTS
PARAGRAPH PAGE
FOREWORD..………………………………………………………………………………………………………..ii
1.
SCOPE ..................................................................................................................................... 1
1.1 Purpose ............................................................................................................................... 1
1.2 Numbering system .............................................................................................................. 1
1.2.1 Classification of tests ..................................................................................................... 1
1.2.2 Test method revisions ................................................................................................... 1
1.3 Methods of reference .......................................................................................................... 1
2.
APPLICABLE DOCUMENTS .................................................................................................... 1
2.1 General ............................................................................................................................... 1
2.2 Government documents ...................................................................................................... 1
2.2.1 Specifications, standards, and handbooks .................................................................... 1
2.3 Non-Government publications ............................................................................................. 2
2.4 Order of precedence ........................................................................................................... 2
3.
DEFINITIONS ........................................................................................................................... 2
3.1 Abbreviations, symbols, and definitions .............................................................................. 2
3.2 Acronyms used in this standard .......................................................................................... 2
4.
GENERAL REQUIREMENTS ................................................................................................... 3
4.1 General ............................................................................................................................... 3
4.2 Test circuits ......................................................................................................................... 3
4.3 Laboratory suitability ........................................................................................................... 3
5.
DETAILED REQUIREMENTS ................................................................................................... 3
6.
NOTES...................................................................................................................................... 3
6.1 Intended use ....................................................................................................................... 3
6.2 International standardization agreement ............................................................................. 3
6.3 Subject term (key word) listing ............................................................................................ 3
6.4 Supersession data............................................................................................................... 3
6.5 Change notations ................................................................................................................ 3
FIGURE TITLE
5002–1
Diagram of equipment set-up for measuring relationship of metal-insulator-semiconductor
structures
5002–2 Capacitance–voltage traces
5002–3 Mobile ion density versus voltage shift (V
FB
)
TEST METHOD NO. TITLE
5001.2
Wafer lot acceptance testing
5002 Capacitance voltage measurements to determine oxide quality
5010.2 Clean room and workstation airborne particle classification and measurement
Downloaded from http://www.everyspec.com
剩余18页未读,继续阅读
资源评论
![avatar-default](https://csdnimg.cn/release/downloadcmsfe/public/img/lazyLogo2.1882d7f4.png)
![avatar](https://profile-avatar.csdnimg.cn/807743f7da1e4eeeafb6487e63d8009b_qq_45527691.jpg!1)
AbelZ_01
- 粉丝: 919
- 资源: 5441
上传资源 快速赚钱
我的内容管理 展开
我的资源 快来上传第一个资源
我的收益
登录查看自己的收益我的积分 登录查看自己的积分
我的C币 登录后查看C币余额
我的收藏
我的下载
下载帮助
![voice](https://csdnimg.cn/release/downloadcmsfe/public/img/voice.245cc511.png)
![center-task](https://csdnimg.cn/release/downloadcmsfe/public/img/center-task.c2eda91a.png)
安全验证
文档复制为VIP权益,开通VIP直接复制
![dialog-icon](https://csdnimg.cn/release/downloadcmsfe/public/img/green-success.6a4acb44.png)