MIL-STD-750-2A_CHG-3.055868.pdf

AMSC N/A FSC 5961

MIL–STD–750–2A

w/CHANGE 3

7 February 2018

SUPERSEDING

MIL–STD–750–2A

w/CHANGE 2

19 August 2016

(see 6.4)

DEPARTMENT OF DEFENSE

TEST METHOD STANDARD

1. This standard is approved for use by all Departments and Agencies of the Department of Defense.

2. This subpart standard establishes uniform test methods for the mechanical testing to determine resistance to

deleterious effects of natural elements and conditions surrounding military operations.

3. Comments, suggestions, or questions on this document should be addressed to: Commander, Defense

Logistics Agency, DLA Land and Maritime, ATTN: VAC, P.O. Box 3990, Columbus, OH 43218–3990, or

emailed to 750.TestMethods@dla.mil. Since contact information can change, you may want to verify the

1. Test method 2068, entire method was rewritten extensively to clarify existing and add new requirements.

2. Test method 2071, renumbered eleven paragraphs under failure criteria.

3. Test method 2071, paragraph 4.2, reorganized subparagraphs and add new subparagraph to add new failure

criteria.

4. Test method 2071, paragraph 4.4, changed paragraph title.

5. Test method 2071, paragraph 4.5.f, delete "shard or" and replace with "sharp or unspecified".

Test method Paragraph Modification

2068 All Revised entirely

2071 4.2 Revised.

2071 4.4 Revised.

2071 4.5.f Revised.

2071 4.10 Revised.

2101 Table 2101–II, footnote 3 Revised.

SCOPE ..................................................................................................................................... 1

1.1 Purpose ............................................................................................................................... 1

1.2 Numbering system .............................................................................................................. 1

1.2.1 Classification of tests ..................................................................................................... 1

1.2.2 Test method revisions ................................................................................................... 1

1.3 Methods of reference .......................................................................................................... 1

2. APPLICABLE DOCUMENTS .................................................................................................... 1

2.1 General ............................................................................................................................... 1

2.2 Government documents ...................................................................................................... 1

2.4 Order of precedence ........................................................................................................... 3

3.2 Acronyms used in this standard .......................................................................................... 3

4.

GENERAL REQUIREMENTS ................................................................................................... 4

4.1 General ............................................................................................................................... 4

4.2 Test circuits ......................................................................................................................... 4

4.3 Destructive tests .................................................................................................................. 4

4.4 Non–destructive tests .......................................................................................................... 5

4.5 Laboratory suitability ........................................................................................................... 5

6.2 International standardization agreement ............................................................................. 6

6.3 Subject term (key word) listing ............................................................................................ 6

6.4 Supersession data............................................................................................................... 6

6.5 Change notations ................................................................................................................ 6

CONCLUDING MATERIAL………………………………………………………………………………………C-1

FIGURE TITLE

2017–1

2017–2 Rotational capability

2037–1 Minimum bond pull limits

2037–2 Wire loop angle

2037–3 Flat loop wire pull testing

2038–1 Sample apparatus fixture with force measuring gauge

2038–2 Close up view of sample apparatus fixture

2038–3 Condition B

2038–4 Condition C

2038–5 Condition D

2052–1 Typical STU

2068–1 Critical glass and meniscus areas for nontransparent glass, double plug, noncavity diodes

2068–4 Acceptable body glass coverage

2069–1 Bond dimensions

2069–2 Torn bonds

2069–3 Acceptable and unacceptable voids and excessive pigtails

2069–4 Acceptable and unacceptable bonding material build-up

2069–5 Extraneous bonding material build-up

2069–6 Acceptable and unacceptable excess material

2070–1 Metallization scratches and voids (expanded contact)

2070–2 Cracks and chips

2070–3 Bond dimensions

2071–1 Radial cracks extending more than one-half the distance from pin to outer member

2071–2 Circumferential cracks

2071–3 Bubbles in glass exceeding one-third of the sealing area

2071–4 Single bubble or void

2071–5 Two bubbles in a line

2071–10 Braze separation/delamination

2071–11 Crack in braze metallization

2071–12 Discontinuous braze metallization

2071–13 Ceramic feedthrough visual inspection criteria

2071–14 Rejectable foreign material conditions

2071–15 Plug to terminal interface depicting acceptable filler metal

2071–16 Plug to terminal interface depicting acceptable filler metal