MIL–STD–750–1
w/CHANGE 1
v
CONTENTS
FIGURE TITLE
1015–1
Resistor sampling circuits
1015–2 Current transformer circuit
1018–1 Correction factor moisture acceptance criteria expressed graphically
1019–1 Flow diagram for ionizing radiation test procedure
1020–1 ESD classification test circuit (human body model)
1020–2 ESD classification test circuit waveforms (human body model)
1021–1 Graphical representation of moisture-resistance test
1038–1 Voltage requirement
1040–1 AC blocking voltage circuit
1040–2 DC forward blocking voltage circuit
1042–1 High temperature reverse bias test circuit
1042–2 High temperature gate bias circuit
1046–1 Salt solution filter
1046–2 Location of salt solution filter
1046–3 Variations of specific gravity of salt (NaCl) solution with temperature
1051–1 Timing diagram showing one cycle
1054–1 Potted diodes
1055–1 Monitored mission cycle temperature and operating profile
1055–2 Monitored mission cycle test circuit
1071–1 Opaque construction
1071–2 Metal can construction
1071–3 Transparent glass or straight through construction
1071–4 Transparent glass double plug construction
1071–5 Smallest detectable leak
1071–6 Largest detectable leak
1080–1 Basic SEB/SEGR test circuit
1080–2 SEB circumvention and monitoring circuit
1080–3 Typical test plan flowcharts
TABLE TITLE
I
Destructive tests
II Non-destructive tests
1020–I Simulator charging voltage (V
S
) steps versus peak current (I
P
)
1020–II Junction polarities for ESD conditions test
1020–III Device ESD failure threshold classification
1051–I Temperature–cycling test conditions
1056–I Physical property requirements of perfluorocarbon fluids
1056–II Thermal shock temperature tolerances and suggested fluids
1057–I Conditions and temperatures
1071–I. Required test sequence
1071–II. Physical property requirements of perfluorocarbon fluids
1071–III Condition C and K pressurization conditions
1071–IV Test limits for radioisotope fine leak method
1071–V Fixed Conditions for test condition H
1
and CH
1
1071–VI Purge time
1071–VII Failure criteria for optical fine leak method L
2
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