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MIL-STD-750_4_CHG-3.056082.pdf
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MIL-STD-750_4_CHG-3.056082.pdf
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AMSC N/A FSC 5961
INCH-POUND
MIL−STD−750−4
w/CHANGE 3
30 December 2019
SUPERSEDING
MIL−STD−750−4
w/CHANGE 2
18 August 2017
DEPARTMENT OF DEFENSE
TEST METHOD STANDARD
DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES
PART 4: TEST METHODS 4000 THROUGH 4999
The documentation and process
conversion measu
res necessary to
comply with this revision shall be
completed by 27 April 2020.
Downloaded from http://www.everyspec.com
MIL−STD−750−4
w/CHANGE 3
ii
FOREWORD
1. This standard is approved for use by all Departments and Agencies of the Department of Defense.
2. This issue of MIL−STD−750−4 establishes uniform test methods for testing the electrical characteristics of
diodes, microwave diodes, rectifiers, thyristors, and tunnel diodes.
3. Comments, suggestions, or questions on this document should be addressed to: Commander,
Defense Logistics Agency, DLA Land and Maritime, ATTN: VAC, P.O. Box 3990, Columbus, OH 43218−3990,
or emailed 750.TestMethods@dla.mil. Since contact information can change, you may want to verify the
currency of this address information using the ASSIST Online database at https://assist.dla.mil.
Downloaded from http://www.everyspec.com
MIL−STD−750−4
w/CHANGE 3
iii
SUMMARY OF CHANGE 3 MODIFICATIONS
1. Test method 4016 was revised include a new test condition for dc pulse method for testing reverse current
leakage.
2. The following modifications to MIL−STD−750−4 have been made:
Paragraph Modification
2.2.1 Changed.
Test Method Modification
4016 Revised.
Downloaded from http://www.everyspec.com
MIL−STD−750−4
w/CHANGE 3
iv
CONTENTS
PARAGRAPH PAGE
FOREWORD………………………………………………………………………………………………………...ii
SUMMARY OF CHANGE 3 MODIFICATIONS………………………………………………………………….iii
1.
SCOPE ................................................................................................................................ 1
1.1 Purpose ......................................................................................................................... 1
1.2 Numbering system ......................................................................................................... 1
1.2.1 Classification of tests ................................................................................................ 1
1.2.2 Test method revisions ............................................................................................... 1
1.3 Methods of reference ..................................................................................................... 1
2.
APPLICABLE DOCUMENTS ................................................................................................ 1
2.1 General ......................................................................................................................... 1
2.2 Government documents ................................................................................................. 1
2.2.1 Specifications, standards, and handbooks ................................................................. 1
2.3 Non-Government publications ........................................................................................ 2
2.4 Order of precedence ...................................................................................................... 2
3.
DEFINITIONS ...................................................................................................................... 2
3.1 Acronyms, symbols, and terms ....................................................................................... 2
3.1.1 Acronyms used in this standard ...................................................................................... 2
3.1.2 Symbols used in this standard ........................................................................................ 3
3.1.3 Terms used in this standard ........................................................................................... 3
3.1.3.1 NPN ......................................................................................................................... 3
3.1.3.2 PNP ......................................................................................................................... 3
4.
GENERAL REQUIREMENTS ............................................................................................... 3
4.1 General ......................................................................................................................... 3
4.2 Test conditions for electrical measurements .................................................................... 3
4.2.1 Steady-state dc measurements (test method series 4000) ......................................... 3
4.2.2 Pulse measurements (test method series 4000) ........................................................ 3
4.2.3 Electrical characteristics tests for microwave diodes (test method series 4100)........... 4
4.2.4 Test circuits .............................................................................................................. 4
4.3 Non–destructive tests ..................................................................................................... 4
4.4 Destructive tests ............................................................................................................ 4
4.5 Laboratory suitability ...................................................................................................... 4
5.
DETAILED REQUIREMENTS ............................................................................................... 5
6.
NOTES ................................................................................................................................ 5
6.1 Intended use .................................................................................................................. 5
6.2 International standardization agreement ......................................................................... 5
6.3 Subject term (key word) listing ........................................................................................ 5
6.4 Change notations ........................................................................................................... 5
CONCLUDING MATERIAL………………………………………………………………………………….……C−1
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MIL−STD−750−4
w/CHANGE 3
v
CONTENTS
FIGURE TITLE
4001−1
Test circuit for capacitance
4011−1 Test circuits for forward voltage
4016−1 Steady state dc voltage reverse current leakage test circuit (dc method)
4016−2 Pulsed dc reverse current leakage test circuit (condition B)
4016−3 AC voltage test circuit for reverse current leakage (condition C)
4021−1 Test circuit for breakdown voltage (diodes)
4022−1 Test circuit for breakdown voltage (voltage regulators and voltage − reference diodes)
4023−1 Ideal reverse trace
4023−2 Soft knee
4023−3 Drift
4023−4 Slope
4023−5 Double break (reject criteria for sharp knee devices)
4023–6 Double trace
4023−7 Double trace, soft knee
4023−8 Unstable (jitter)
4023−9 Discontinuity
4023−10 Snap back − collapsing V
BR
4023−11 Floater
4023−12 Arcing
4026−1 Test circuit for forward recovery time and peak forward recovery voltage
4026−2 Input forward current pulse (top) and output voltage (bottom) waveforms
4031−1 Test circuit for condition A
4031−2 Response pulse waveforms for condition A
4031−3 Test circuit for condition B
4031−4 Suggested board layout for low L
1
/R
4
for condition B
4031−5 Current through DUT (condition B)
4031−6 Circuit for measuring reverse recovery characteristics (condition C)
4031−7 Test current waveforms for various types of rectifier diodes under test in the circuit for measuring
reverse recovery characteristics
4031−8 Test circuit for condition D
4031−9 Suggest board layout for low L
1
/R
4
for test condition D
4031−10 Generalized reverse recovery waveforms for test condition D
4036−1 Test circuit for measuring Q
4041−1 Test circuit for rectification efficiency
4046−1 Test circuit for reverse current, average
4051−1 Test circuit for small-signal reverse breakdown impedance
4056−1 Test circuit for small-signal forward impedance
4061−1 Test circuit for stored charge
4064−1 Test circuit 1
4064−2 Test circuit 1 response
4064−3 Test Circuit 2
4064−4 Test Circuit 2 response
4065−1 Rectangular current pulse test setup
4065−2 Rectangular 20µs current pulse waveform
4065−3 Voltage response
4066−1 Surge pulse applied to continuous halfwave conditions (condition A1)
4066−2 Surge pulse applied to continuous dc conditions (condition A2)
4066−3 Rectangular current pulse test setup
4066−4 Rectangular current pulse waveforms
4066−5 Clamping voltage test circuit
4066−6 Standard current impulse waveshape
Downloaded from http://www.everyspec.com
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