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MIL-STD-750_1_CHG-4.052222.pdf
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INCH–POUND
MIL–STD–750–1
w/CHANGE 4
22 August 2014
SUPERSEDING
MIL–STD–750-1
w/CHANGE 3
1 October 2013
(see 6.4)
DEPARTMENT OF DEFENSE
TEST METHOD STANDARD
ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES
PART 1: TEST METHODS 1000 THROUGH 1999
AMSC N/A FSC 5961
The documentation and process
conversion measures necessary to
comply with this revision shall be
completed by 22 October 2014.
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MIL–STD–750–1
w/CHANGE 4
FOREWORD
1. This standard is approved for use by all Departments and Agencies of the Department of Defense.
2. This entire standard has been revised. This revision has resulted in many changes to the format, but the most
significant one is the splitting the document into parts. See MIL–STD–750 for the change summary.
3. Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Logistics Agency, DLA Land and Maritime, ATTN: VAC, P.O. Box 3990, Columbus, OH 43218–3990, or
emailed to semiconductor@dla.mil. Since contact information can change, you may want to verify the
currency of this address information using the ASSIST Online database at https://assist.dla.mil.
ii
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MIL–STD–750–1
w/CHANGE 4
SUMMARY OF CHANGE 4 MODIFICATIONS
1. Test method 1018, paragraph 3, was revised to institute a standard procedure for dealing with package
volume discrepancies.
2. Test method 1018, paragraph 4, was revised to clarify the requirements for attaining suitability.
3. Test method 1020, table 1020-I, was revised to add a step to the simulator charging table.
4. Test method 1020, table 1020-III, was added to correctly define class 0 classification.
5. Test method 1051, paragraph 1.1.6, was revised to correct the definition of ramp rate.
6. Test method 1051, paragraph 1.1.11, was revised to clarify the worst case load temperature requirements.
7. Test method 1051, table 1051-I, was revised to correct load the load temperature tolerance requirements.
8. Test method 1071, paragraph 2.1, was revised to redefine the definition of standard leak rate.
9. Test method 1071, paragraph 2.2, was revised to redefine the definition of equivalent standard leak rate.
10. Test method 1071, paragraph 2.3, was revised to redefine the definition of measured leak rate.
11. Test method 1071, paragraph 2.5, was revised to redefine the krypton to air conversion factor.
12. Test method 1071, paragraph 2.7, was revised to clarify testing limitations.
13. Test method 1071, paragraph 2.8, was revised to clarify the defition of internal free cavity volume.
14. Test method 1071, paragraph 4.1, was revised to clairify the use of the red dye penetrant solution efficiency
procedure.
15. Test method 1071, paragraph 4.2, was revised to clarify step 2 of the test procedure.
16. Test method 1071, paragraph 4.3, was revised to clarify step 6 of the getter efficiency procedure.
17. Test method 1071, paragraph 5.1, was revised to add apparatus requirements.
18. Test method 1071, paragraph 5.2, was revised to correct the re-test pressurization time requirement.
19. Test method 1071, paragraph 9.5, was revised to clarify the counting station functional verification
requirements.
20. Test method 1071, paragraph 9.5.2, was revised to clarify the documentation requirements.
21. Test method 1071, paragraph 9.6.5, was revised to clarify that the condition results are not quantitative.
22. Test method 1071, paragraph 10, was revised to require result conversion to determine acceptability.
23. Test method 1071, paragraph 10.1, was revised to clarify the calibration documentation requirements.
24. Test method 1071, paragraph 10.2, was revised to require flexible methods by default.
25. Test method 1071, paragraph 10.2.1, was revised to clarify the surface sorption documentation
requirements.
iii
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MIL–STD–750–1
w/CHANGE 4
26. Test method 1071, paragraph 10.2.1.3, was revised to remove the reference to ASTM F134.
27. Test method 1071, paragraph 13, was revised to clarify appropriate packages.
28. Test method, paragraph 14.5.1, was revised to clarify ideal packages.
29. Test method 1071, paragraph 15, was revised to require flexible methods by default.
Test method Paragraph Modification
1018 3 Changed
1018 4 Changed
1020 TABLE 1020-I Changed
1020 TABLE 1020-III Changed
1051 1.1.6 Changed
1051 1.1.11 Changed
1051 TABLE 1051-I Changed
1071 2.1 Changed
1071 2.2 Changed
1071 2.3 Changed
1071 2.5 Changed
1071 2.7 Changed
1071 2.8 Changed
1071 4.1 Changed
1071 4.2 Changed
1071 4.3 Changed
1071 5.1 Changed
1071 5.2 Changed
1071 9.5 Changed
1071 9.5.2 Changed
1071 9.6.5 Changed
1071 10 Changed
1071 10.1 Changed
1071 10.2 Changed
1071 10.2.1.3 Changed
1071 14.5.1 Changed
1071 15 Changed
iv
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MIL–STD–750–1
w/CHANGE 4
CONTENTS
PARAGRAPH PAGE
FOREWORD..…………………………………………………………..……………………………………….…..ii
SUMMARY OF CHANGE 4 MODIFICATIONS….………………………………………………………………iii
1.
SCOPE ..................................................................................................................................... 1
1.1 Purpose ............................................................................................................................... 1
1.2 Numbering system .............................................................................................................. 1
1.2.1 Classification of tests ..................................................................................................... 1
1.2.2 Test method revisions ................................................................................................... 1
2.
APPLICABLE DOCUMENTS .................................................................................................... 2
2.1 General ............................................................................................................................... 2
2.2 Government documents ...................................................................................................... 2
2.2.1 Specifications, standards, and handbooks .................................................................... 2
2.3 Non-Government publications ............................................................................................. 2
2.4 Order of precedence ........................................................................................................... 3
3. DEFINITIONS ........................................................................................................................... 4
3.1 Acronyms, symbols, and definitions .................................................................................... 4
3.2 Acronyms used in this standard .......................................................................................... 4
4. GENERAL REQUIREMENTS ................................................................................................... 5
4.1 General ............................................................................................................................... 5
4.2 Test circuits ......................................................................................................................... 5
4.3 Destructive tests .................................................................................................................. 5
4.4 Non–destructive tests .......................................................................................................... 6
4.5 Laboratory suitability ........................................................................................................... 6
4.6 Methods of reference .......................................................................................................... 6
5.
DETAILED REQUIREMENTS ................................................................................................... 6
6.
NOTES...................................................................................................................................... 6
6.1 Intended use ....................................................................................................................... 6
6.2 International standardization agreement ............................................................................. 6
6.3 Subject term (key word) listing ............................................................................................ 7
6.4 Supersession data............................................................................................................... 7
6.5 Changes from previous issue .............................................................................................. 7
v
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