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TPS51116-EP
www.ti.com.cn
ZHCSAC9A –OCTOBER 2012–REVISED NOVEMBER 2012
完完整整 DDR,,DDR2,,DDR1 和和 LPDDR3 存存储储器器电电源源解解决决方方案案
同同步步降降压压控控制制器器,,1A 低低压压降降稳稳压压器器 (LDO),,经经缓缓冲冲基基准准
查查询询样样品品: TPS51116-EP
1
特特性性
2
• 同同步步降降压压控控制制器器 (VDDQ)
应应用用范范围围
– 宽宽输输入入电电压压范范围围: 3.0V 至至 28V
• DDR/DDR2/DDR3/LPDDR3 内内存存电电源源
– 负负载载阶阶跃跃响响应应为为 100ns 的的 D−CAP™ 模模式式
• SSTL-2,,SSTL-18,,SSTL-15 和和 HSTL 终终止止
– 电电流流模模式式选选项项支支持持陶陶瓷瓷输输出出电电容容器器
支支持持国国防防、、航航空空航航天天、、和和医医疗疗应应用用
– 支支持持 S4/S5 状状态态内内的的软软关关闭闭
• 受受控控基基线线
– R
DS((接接通通))
或或电电阻阻器器的的电电流流感感测测
• 一一个个组组装装和和测测试试场场所所
– 2.5V (DDR),,1.8V (DDR2),,可可调调节节至至
1.5V (DDR3) 或或 1.2V (LPDDR3) 或或
• 一一个个制制造造场场所所
0.75V 至至 3.0V 的的输输出出电电压压范范围围
• 支支持持军军用用((-55°C 至至 125°C))温温度度范范围围
– 配配备备有有电电源源正正常常、、过过压压保保护护和和欠欠压压保保护护
• 延延长长的的产产品品生生命命周周期期
• 1A LDO (VTT),,经经缓缓冲冲基基准准 (VREF)
• 延延长长的的产产品品变变更更通通知知
– 灌灌电电流流和和拉拉电电流流的的能能力力达达到到 1A
• 产产品品可可追追溯溯性性
– 提提供供 LDO 输输入入以以优优化化功功率率损损耗耗
– 只只需需 20μF 陶陶瓷瓷输输出出电电容容器器
– 经经缓缓冲冲的的低低噪噪声声 10mA VREF 输输出出
– 针针对对 VREF 和和 VTT 的的 ±20mV 精精度度
– 在在 S3 中中支支持持高高阻阻抗抗 (high-Z),,在在 S4/S5 中中支支
持持软软关关闭闭
– 过过热热保保护护
说说明明
TPS51116 为 DDR/SSTL-2,DDR2/SSTL-18,DDR3/SSTL-15 和 LPDDR3 内存系统提供一个完整的电源。 它集
成了一个具有 1A 灌电流/拉电流跟踪线性稳压器和经缓冲低噪声基准的同步降压控制器。 TPS51116 在空间非常
宝贵的系统中提供最低的总体解决方案成本。 TPS51116 同步控制器运行具有自适应接通时间控制的定频
400kHz,伪恒定频率脉宽调制 (PWM),此控制可在 D-CAP™ 模式中进行配置,此模式可简化使用并实现最快瞬
态响应或者在电流模式中支持陶瓷输出电容器。 1A 灌电流/拉电流 LDO 只需 20μF (2 × 10μF) 陶瓷输出电容器即
可保持快速瞬态响应。 此外,LDO 电源输入是外部可用的,这样可大大减少总体功耗。 TPS51116 支持所有睡眠
状态控制,此类控制在 S3(挂起到 RAM)中将 VTT 置于 high-Z 状态并且在 S4/S5(挂起到硬盘)中将
VDDQ,VTT 和 VTTREF(软关闭)放电。 TPS51116 具有所有保护特性,其中包括热关断并采用 20 引脚散热薄
型小外形尺寸 (HTSSOP) PowerPAD™ 封装。
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2D-CAP, PowerPAD are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2012, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not English Data Sheet: SLUSB52
necessarily include testing of all parameters.
TPS51116-EP
ZHCSAC9A –OCTOBER 2012–REVISED NOVEMBER 2012
www.ti.com.cn
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
ORDERABLE TOP-SIDE
T
A
PACKAGE VID NUMBER
PART NUMBER MARKING
TPS51116MPWPREP V62/12602-01XE
–55°C to 125°C Plastic HTSSOP PowerPAD (PWP)
(2)
51116M
TPS51116MPWPEP V62/12602-01XE-T
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) With Cu NIPDAU lead/ball finish
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range unless otherwise noted
MIN MAX UNIT
VBST –0.3 36
VBST wrt LL –0.3 6
V
IN
Input voltage range V
CS, MODE, S3, S5, VTTSNS, VDDQSNS, V5IN, VLDOIN, VDDQSET –0.3 6
PGND, VTTGND –0.3 0.3
DRVH –1.0 36
LL –1.0 30
V
OUT
Output voltage range V
LL, pulse width < 20 ns –5 30
COMP, DRVL, PGOOD, VTT, VTTREF –0.3 6
T
J
Operating ambient temperature range –55 150
°C
T
stg
Storage temperature –65 150
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage
values are with respect to the network ground terminal unless otherwise noted.
THERMAL INFORMATION
TPS51116-EP
THERMAL METRIC
(1)
PWP UNITS
20 PINS
θ
JA
Junction-to-ambient thermal resistance
(2)
41.2
θ
JCtop
Junction-to-case (top) thermal resistance
(3)
27.4
θ
JB
Junction-to-board thermal resistance
(4)
23.9
°C/W
ψ
JT
Junction-to-top characterization parameter
(5)
1.1
ψ
JB
Junction-to-board characterization parameter
(6)
23.7
θ
JCbot
Junction-to-case (bottom) thermal resistance
(7)
3.6
(1) 有关传统和新的热 度量的更多信息,请参阅IC
封装热度量
应用报告, SPRA953。
(2) 在 JESD51-2a 描述的环境中,按照 JESD51-7 的指定,在一个 JEDEC 标准高 K 电路板上进行仿真,从而获得自然 对流条件下的结至环
境热阻。
(3) 通过在封装顶部模拟一个冷板测试来获得结至芯片外壳(顶部)的热阻。 不存在特定的 JEDEC 标准测试,但 可在 ANSI SEMI 标准 G30-
88 中能找到内容接近的说明。
(4) 按照 JESD51-8 中的说明,通过 在配有用于控制 PCB 温度的环形冷板夹具的环境中进行仿真,以获得结板热阻。
(5) 结至顶部特征参数, ψ
JT
,估算真实系统中器件的结温,并使用 JESD51-2a(第 6 章和第 7 章)中 描述的程序从仿真数据中 提取出该参
数以便获得 θ
JA
。
(6) 结至电路板特征参数, ψ
JB
,估算真实系统中器件的结温,并使用 JESD51-2a(第 6 章和第 7 章)中 描述的程序从仿真数据中 提取出该
参数以便获得 θ
JA
。
(7) 通过在外露(电源)焊盘上进行冷板测试仿真来获得 结至芯片外壳(底部)热阻。 不存在特定的 JEDEC 标准 测试,但可在 ANSI SEMI
标准 G30-88 中能找到内容接近的说明。
空白
2 Copyright © 2012, Texas Instruments Incorporated
TPS51116-EP
www.ti.com.cn
ZHCSAC9A –OCTOBER 2012–REVISED NOVEMBER 2012
RECOMMENDED OPERATING CONDITIONS
MIN MAX UNIT
Supply voltage, V5IN 4.75 5.25 V
VBST, DRVH –0.1 34
LL –0.6 28
VLDOIN, VTT, VTTSNS, VDDQSNS –0.1 3.6
Voltage range V
VTTREF –0.1 1.8
PGND, VTTGND –0.1 0.1
S3, S5, MODE, VDDQSET, CS, COMP, PGOOD,
–0.1 5.25
DRVL
Operating free-air temperature, T
A
–55 125 °C
ELECTRICAL CHARACTERISTICS
over operating free-air temperature range, V
V5IN
= 5 V, VLDOIN is connected to VDDQ output (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SUPPLY CURRENT
No load, V
S3
= V
S5
= 5 V,
I
V5IN1
Supply current 1, V5IN 0.8 2 mA
COMP connected to capacitor
No load, V
S3
= 0 V,
I
V5IN2
Supply current 2, V5IN 300 610
V
S5
= 5 V, COMP connected to capacitor
No load, V
S3
= 0 V,
I
V5IN3
Supply current 3, V5IN 240 508
V
S5
= 5 V, V
COMP
= 5 V
μA
I
V5INSDN
Shutdown current, V5IN No load, V
S3
= V
S5
= 0 V 0.1 1.81
I
VLDOIN1
Supply current 1, VLDOIN No load, V
S3
= V
S5
= 5 V 1 10
I
VLDOIN2
Supply current 2, VLDOIN No load, V
S3
= 5 V, V
S5
= 0 V, 0.1 10.5
I
VLDOINSDN
Standby current, VLDOIN No load, V
S3
= V
S5
= 0 V 0.1 1.5
Copyright © 2012, Texas Instruments Incorporated 3
TPS51116-EP
ZHCSAC9A –OCTOBER 2012–REVISED NOVEMBER 2012
www.ti.com.cn
ELECTRICAL CHARACTERISTICS (continued)
over operating free-air temperature range, V
V5IN
= 5 V, VLDOIN is connected to VDDQ output (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VTTREF OUTPUT
V
VTTREF
Output voltage, VTTREF V
VDDQSNS
/2 V
-10 mA < I
VTTREF
< 10 mA, V
VDDQSNS
= 2.5 V,
-20 20
Tolerance to V
VDDQSNS
/2
-10 mA < I
VTTREF
< 10 mA, V
VDDQSNS
= 1.8 V,
-19 19
Tolerance to V
VDDQSNS
/2
V
VTTREFTOL
Output voltage tolerance mV
-10 mA < I
VTTREF
< 10 mA, V
VDDQSNS
= 1.5 V,
-16 16
Tolerance to V
VDDQSNS
/2
-10 mA < I
VTTREF
< 10 mA, V
VDDQSNS
= 1.2 V,
–13 13
Tolerance to V
VDDQSNS
/2
V
VTTREFSRC
Source current V
VDDQSNS
= 2.5 V, V
VTTREF
= 0 V -19 -40 -83.5
mA
V
VTTREFSNK
Sink current V
VDDQSNS
= 2.5 V, V
VTTREF
= 2.5 V 19 40 83.5
VDDQ OUTPUT
T
A
= 25°C, V
VDDQSET
= 0 V, No load 2.465 2.500 2.535
-55°C ≤ T
A
≤ 125°C, V
VDDQSET
= 0 V, No load 2.43 2.50 2.56
V
VDDQ
Output voltage, VDDQ T
A
= 25°C, V
VDDQSET
= 5 V, No load 1.776 1.800 1.830 V
-55°C ≤ T
A
≤ 125°C, V
VDDQSET
= 5 V, No load 1.762 1.800 1.838
-55°C ≤ T
A
≤ 125°C, Adjustable mode, No load 0.75 3.0
T
A
= 25°C, Adjustable mode 742.5 750 760.5
V
VDDQSET
VDDQSET regulation voltage mV
-55°C ≤ T
A
≤ 125°C, Adjustable mode 737 750 763
V
VDDQSET
= 0 V 215 kΩ
R
VDDQSNS
Input impedance, VDDQSNS V
VDDQSET
= 5 V 180
Adjustable mode 460
V
VDDQSET
= 0.78 V, COMP = Open -0.04
I
VDDQSET
Input current, VDDQSET μA
V
VDDQSET
= 0.78 V, COMP = 5 V -0.06
V
S3
= V
S5
= 0 V, V
VDDQSNS
= 0.5 V,
I
VDDQDisch
Discharge current, VDDQ 10 40 mA
V
MODE
= 0 V
V
S3
= V
S5
= 0 V, V
VDDQSNS
= 0.5 V,
I
VLDOINDisch
Discharge current, VLDOIN 700 mA
V
MODE
= 0.5 V
VTT OUTPUT
V
S3
= V
S5
= 5 V, V
VLDOIN
= V
VDDQSNS
= 2.5 V 1.25
V
VTTSNS
Output voltage, VTT V
S3
= V
S5
= 5 V, V
VLDOIN
= V
VDDQSNS
= 1.8 V 0.9 V
V
S3
= V
S5
= 5 V, V
VLDOIN
= V
VDDQSNS
= 1.5 V 0.75
V
VDDQSNS
= V
VLDOIN
= 2.5 V, V
S3
= V
S5
= 5 V,
-21 21
I
VTT
= 0 A
VTT output voltage tolerance V
VDDQSNS
= V
VLDOIN
= 2.5 V, V
S3
= V
S5
= 5 V,
V
VTTTOL25
-31 31 mV
to VTTREF |I
VTT
| < 1.5 A
V
VDDQSNS
= V
VLDOIN
= 2.5 V, V
S3
= V
S5
= 5 V,
-41 41
|I
VTT
| < 3 A
V
VDDQSNS
= V
VLDOIN
= 1.8 V, V
S3
= V
S5
= 5 V,
-21 21
I
VTT
= 0 A
VTT output voltage tolerance V
VDDQSNS
= V
VLDOIN
= 1.8 V, V
S3
= V
S5
= 5 V,
V
VTTTOL18
-31 31 mV
to VTTREF |I
VTT
| < 1 A
V
VDDQSNS
= V
VLDOIN
= 1.8 V, V
S3
= V
S5
= 5 V,
-41 41
|I
VTT
| < 2 A
V
VDDQSNS
= V
VLDOIN
= 1.5 V, V
S3
= V
S5
= 5 V,
-21 21
I
VTT
= 0 A
VTT output voltage tolerance V
VDDQSNS
= V
VLDOIN
= 1.5 V, V
S3
= V
S5
= 5 V,
V
VTTTOL15
-31 31 mV
to VTTREF |I
VTT
| < 1 A
V
VDDQSNS
= V
VLDOIN
= 1.5 V, V
S3
= V
S5
= 5 V,
-41 41
|I
VTT
| < 2 A
4 Copyright © 2012, Texas Instruments Incorporated
TPS51116-EP
www.ti.com.cn
ZHCSAC9A –OCTOBER 2012–REVISED NOVEMBER 2012
ELECTRICAL CHARACTERISTICS (continued)
over operating free-air temperature range, V
V5IN
= 5 V, VLDOIN is connected to VDDQ output (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
VDDQSNS
= V
VLDOIN
= 1.2 V, V
S3
= V
S5
= 5 V,
-21 21
I
VTT
= 0 A
VTT output voltage tolerance V
VDDQSNS
= V
VLDOIN
= 1.2 V, V
S3
= V
S5
= 5 V,
V
VTTTOL12
-31 31 mV
to VTTREF |I
VTT
| < 1 A
V
VDDQSNS
= V
VLDOIN
= 1.2 V, V
S3
= V
S5
= 5 V,
-41 41
|I
VTT
| < 1.5 A
V
VLDOIN
= V
VDDQSNS
= 2.5 V,
2.7 3.8 6.2
V
VTT
= V
VTTSNS
= 1.19 V, PGOOD = HI
I
VTTTOCLSRC
Source current limit, VTT
V
VLDOIN
= V
VDDQSNS
= 2.5 V, V
VTT
= 0 V 1.4 2.2 3.2
A
V
VLDOIN
= V
VDDQSNS
= 2.5 V,
2.65 3.6 6
V
VTT
= V
VTTSNS
= 1.31 V, PGOOD = HI
I
VTTTOCLSNK
Sink current limit, VTT
V
VLDOIN
= V
VDDQSNS
= 2.5 V, V
VTT
= V
VDDQ
1.4 2.2 3
I
VTTLK
Leakage current, VTT V
S3
= 0 V, V
S5
= 5 V, V
VTT
= V
VDDQSNS
/2 -11 11
I
VTTBIAS
Input bias current, VTTSNS V
S3
= 5 V, V
VTTSNS
= V
VDDQSNS
/2 -1.1 1.1 μA
I
VTTSNSLK
Leakage current, VTTSNS V
S3
= 0 V, V
S5
= 5 V, V
VTT
= V
VDDQSNS
/2 -1 1
I
VTTDisch
Discharge current, VTT V
S3
= V
S5
= V
VDDQSNS
= 0 V, V
VTT
= 0.5 V 9.5 17 mA
TRANSCONDUCTANCE AMPLIFIER
gm Gain 232 300 364 μS
V
S3
= 0 V, V
S5
= 5 V, V
VDDQSET
= 0 V,
I
COMPSNK
COMP maximum sink current 13
V
VDDQSNS
= 2.7 V, V
COMP
= 1.28 V
μA
COMP maximum source V
S3
= 0 V, V
S5
= 5 V, V
VDDQSET
= 0 V,
I
COMPSRC
-13
current V
VDDQSNS
= 2.3 V, V
COMP
= 1.28 V
V
S3
= 0 V, V
S5
= 5 V, V
VDDQSET
= 0 V,
V
COMPHI
COMP high clamp voltage 1.3 1.34 1.38
V
VDDQSNS
= 2.3 V, V
CS
= 0 V
V
V
S3
= 0 V, V
S5
= 5 V, V
VDDQSET
= 0 V,
V
COMPLO
COMP low clamp voltage 1.17 1.21 1.25
V
VDDQSNS
= 2.7 V, V
CS
= 0 V
DUTY CONTROL
t
ON
Operating on-time V
IN
= 12 V, V
VDDQSET
= 0 V 520
t
ON0
Startup on-time V
IN
= 12 V, V
VDDQSNS
= 0 V 125
ns
t
ON(min)
Minimum on-time T
A
= 25°C 100
t
OFF(min)
Minimum off-time T
A
= 25°C 350
ZERO CURRENT COMPARATOR
Zero current comparator
V
ZC
-6 0 6 mV
offset
OUTPUT DRIVERS
Source, I
DRVH
= –100 mA 3 6
R
DRVH
DRVH resistance
Sink, I
DRVH
= 100 mA 0.9 3
Ω
Source, I
DRVL
= –100 mA 3 6
R
DRVL
DRVL resistance
Sink, I
DRVL
= 100 mA 0.9 3
LL-low to DRVL-on 10
t
D
Dead time ns
DRVL-off to DRVH-on 20
Copyright © 2012, Texas Instruments Incorporated 5
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