TI-EMB1499Q.pdf

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

driver. VINA and VINP should be connected together at the

that floats with the transformer secondary except the

secondary side gate drivers. PVINF and VINF should be

connected together at the board level.

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

device reliability and/ or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or

other conditions beyond those indicated in the recommended Operating Ratings is not implied. The recommended Operating Ratings

indicate conditions at which the device is functional and should not be operated beyond such conditions.

(2) The human body model is a 100pF capacitor discharged through a 1.5 kΩ resistor into each pin. Test method is per JESD22 –A114.