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RHEED 数据处理
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教程RHEED,图像斑点处理及其物理原理,处理衍射ban'd
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REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION
Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for
characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive
to surface structure and morphology. However, there has been a need for a book which
explains how to analyze RHEED patterns.
This book serves as an introduction to RHEED for beginners and describes detailed ex-
perimental and theoretical treatments for experts. First the principles of electron diffraction
and many examples of the interpretation of RHEED patterns are described for beginners.
The second part contains detailed descriptions of RHEED theory. The third part applies
RHEED to the determination of surface structures, gives detailed descriptions of the ef-
fects of disorder and critically reviews the mechanisms contributing to RHEED intensity
oscillations.
This unified and coherent account will appeal to both graduate students and researchers
in the study of molecular beam epitaxial growth.
Ayahiko Ichimiya is Professor in the Department of Quantum Engineering, Nagoya
University. His specific areas of research interest are reflection high-enery electron diffrac-
tion, crystal growth, surface characterization, positron diffraction and scanning tunneling
microscopy.
Philip I. Cohen is Professor in the Department of Electrical and Computer Engineer-
ing, University of Minnesota. His research interests are mainly in molecular beam epitaxy,
electron diffraction, light-assisted film growth and ion-assisted film growth.
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REFLECTION HIGH-ENERGY
ELECTRON DIFFRACTION
AYAHIKO ICHIMIYA AND PHILIP I. COHEN
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published by the press syndicate of the university of cambridge
The Pitt Building, Trumpington Street, Cambridge, United Kingdom
cambridge university press
The Edinburgh Building, Cambridge CB2 2RU, UK
40 West 20th Street, New York, NY 10011–4211, USA
477 Williamstown Road, Port Melbourne, VIC 3207, Australia
Ruiz de Alarc´on 13, 28014 Madrid, Spain
Dock House, The Waterfront, Cape Town 8001, South Africa
http://www.cambridge.org
C
Cambridge University Press 2004
This book is in copyright. Subject to statutory exception
and to the provisions of relevant collective licensing agreements,
no reproduction of any part may take place without
the written permission of Cambridge University Press.
First published 2004
Printed in the United Kingdom at the University Press, Cambridge
Typeface Times 10/13 pt. System L
A
T
E
X2
ε
[tb]
A catalog record for this book is available from the British Library
Library of Congress Cataloging in Publication data
Ichimiya, Ayahiko, 1940–
Reflection high-energy electron diffraction/Ayahiko Ichimiya and Philip I. Cohen.
p. cm.
Includes bibliographical references and index.
ISBN 0 521 45373 9
1. Reflection high energy electron diffraction. 2. Thin films – Surfaces – Analysis.
I. Cohen, Philip I. II. Title.
QC176.84.S93124 2004
530.4
275 – dc22 2004045180
ISBN 0 521 45373 9 hardback
The publisher has used its best endeavors to ensure that the URLs for external websites referred to in this book
are correct and active at the time of going to press. However, the publisher has no responsibility for the websites
and can make no guarantee that a site will remain live or that the content is or will remain appropriate.
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