没有合适的资源?快使用搜索试试~ 我知道了~
资源推荐
资源详情
资源评论
Copyright © 2007-2018 MIPI Alliance, Inc.
All rights reserved.
Confidential
Conformance Test Suite
for
D-PHY
SM
v2.1
CTS Version
1.0
22 October
2018
MIPI Board Approved 8 December 2018
This is an informative document, not a MIPI Specification.
Various rights and obligations that apply solely to MIP
I Specifications (as defined in the MIPI
Membership Agreement and MIPI Bylaws)
including, but not limited to, patent license rights and
obligations, do not apply to this document.
This document is
subject to further editorial and technical development.
Conformance Test Suite for D-PHY v2.1 CTS Version 1.0
22-Oct-2018
ii Copyright © 2007-2018 MIPI Alliance, Inc.
All rights reserved.
Confidential
NOTICE OF DISCLAIMER
The material contained herein is provided on an “AS IS” basis. To the maximum extent permitted by
applicable law, this material is provided AS IS AND WITH ALL FAULTS, and the authors and developers
of this material and MIPI Alliance Inc. (“MIPI”) hereby disclaim all other warranties and conditions, either
express, implied or statutory, including, but not limited to, any (if any) implied warranties, duties or
conditions of merchantability, of fitness for a particular purpose, of accuracy or completeness of responses,
of results, of workmanlike effort, of lack of viruses, and of lack of negligence. ALSO, THERE IS NO
WARRANTY OR CONDITION OF TITLE, QUIET ENJOYMENT, QUIET POSSESSION,
CORRESPONDENCE TO DESCRIPTION OR NON-INFRINGEMENT WITH REGARD TO THIS
MATERIAL.
IN NO EVENT WILL ANY AUTHOR OR DEVELOPER OF THIS MATERIAL OR MIPI BE LIABLE TO
ANY OTHER PARTY FOR THE COST OF PROCURING SUBSTITUTE GOODS OR SERVICES, LOST
PROFITS, LOSS OF USE, LOSS OF DATA, OR ANY INCIDENTAL, CONSEQUENTIAL, DIRECT,
INDIRECT, OR SPECIAL DAMAGES WHETHER UNDER CONTRACT, TORT, WARRANTY, OR
OTHERWISE, ARISING IN ANY WAY OUT OF THIS OR ANY OTHER AGREEMENT RELATING TO
THIS MATERIAL, WHETHER OR NOT SUCH PARTY HAD ADVANCE NOTICE OF THE
POSSIBILITY OF SUCH DAMAGES.
The material contained herein is not a license, either expressly or impliedly, to any IPR owned or controlled
by any of the authors or developers of this material or MIPI. Any license to use this material is granted
separately from this document. This material is protected by copyright laws, and may not be reproduced,
republished, distributed, transmitted, displayed, broadcast or otherwise exploited in any manner without the
express prior written permission of MIPI Alliance. MIPI, MIPI Alliance and the dotted rainbow arch and all
related trademarks, service marks, tradenames, and other intellectual property are the exclusive property of
MIPI Alliance Inc. and cannot be used without its express prior written permission. The use or
implementation of this material may involve or require the use of intellectual property rights (“IPR”)
including (but not limited to) patents, patent applications, or copyrights owned by one or more parties,
whether or not members of MIPI. MIPI does not make any search or investigation for IPR, nor does MIPI
require or request the disclosure of any IPR or claims of IPR as respects the contents of this material or
otherwise.
Without limiting the generality of the disclaimers stated above, users of this material are further notified that
MIPI: (a) does not evaluate, test or verify the accuracy, soundness or credibility of the contents of this
material; (b) does not monitor or enforce compliance with the contents of this material; and (c) does not
certify, test, or in any manner investigate products or services or any claims of compliance with MIPI
specifications or related material.
Questions pertaining to this material, or the terms or conditions of its provision, should be addressed to:
MIPI Alliance, Inc.
c/o IEEE-ISTO
445 Hoes Lane, Piscataway New Jersey 08854, United States
Attn: Managing Director
CTS Version 1.0 Conformance Test Suite for D-PHY v2.1
22-Oct-2018
Copyright © 2007-2018 MIPI Alliance, Inc. iii
All rights reserved.
Confidential
Contents
Contents ............................................................................................................................ iii
Figures ............................................................................................................................. viii
Tables ............................................................................................................................... xvi
Release History .............................................................................................................. xvii
Introduction ........................................................................................................................1
Purpose ........................................................................................................................................ 1
References ................................................................................................................................... 1
Resource Requirements.............................................................................................................. 1
Last Technical Modification ...................................................................................................... 2
Discussion .................................................................................................................................... 2
Test Setup .................................................................................................................................... 2
Procedure .................................................................................................................................... 2
Observable Results ..................................................................................................................... 2
Possible Problems ....................................................................................................................... 2
Terminology ........................................................................................................................3
Use of Special Terms ................................................................................................................... 3
Abbreviations .............................................................................................................................. 3
Acronyms ..................................................................................................................................... 4
References ...........................................................................................................................5
Section 1 TX Timers and Signaling ............................................................................7
Overview ...................................................................................................................................... 7
Group 1 Data Lane LP-TX Signaling Requirements ......................................................... 8
Test 1.1.1 Data Lane LP-TX Thevenin Output High Level Voltage (V
OH
) ........................... 9
Test 1.1.2 Data Lane LP-TX Thevenin Output Low Level Voltage (V
OL
) .......................... 13
Test 1.1.3 Data Lane LP-TX 15%-85% Rise Time (T
RLP
) .................................................. 15
Test 1.1.4 Data Lane LP-TX 15%-85% Fall Time (T
FLP
) .................................................... 19
Test 1.1.5 Data Lane LP-TX Slew Rate vs. C
LOAD
(δV/δt
SR
) .............................................. 21
Test 1.1.6 Data Lane LP-TX Pulse Width of Exclusive-OR Clock (T
LP-PULSE-TX
) ............... 30
Test 1.1.7 Data Lane LP-TX Period of Exclusive-OR Clock (T
LP-PER-TX
) ........................... 34
Group 2 Clock Lane LP-TX Signaling Requirements ...................................................... 36
Test 1.2.1 Clock Lane LP-TX Thevenin Output High Level Voltage (V
OH
) ....................... 37
Test 1.2.2 Clock Lane LP-TX Thevenin Output Low Level Voltage (V
OL
) ........................ 39
Test 1.2.3 Clock Lane LP-TX 15%-85% Rise Time (T
RLP
) ................................................ 41
Test 1.2.4 Clock Lane LP-TX 15%
-85% Fall Time (T
FLP
) .................................................. 43
Test 1.2.5 Clock Lane LP-TX Slew Rate vs. C
LOAD
(δV/δt
SR
) ............................................ 45
Group 3 Data Lane HS-TX Signaling Requirements ....................................................... 46
Test 1.3.1 Data Lane HS Entry: Data Lane T
LPX
Value ....................................................... 47
Test 1.3.2 Data Lane HS Entry: T
HS-PREPARE
Value .............................................................. 49
Test 1.3.3 Data Lane HS Entry: T
HS-PREPARE
+ T
HS-ZERO
Value ............................................. 51
Test 1.3.4 Data Lane HS-TX Differential Voltages (V
OD(0)
, V
OD(1)
). ................................... 53
Test 1.3.5 Data Lane HS-TX Differential Voltage Mismatch (ΔV
OD
) ................................. 58
Test 1.3.6 Data Lane HS-TX Single-Ended Output High Voltages (V
OHHS(DP)
, V
OHHS(DN)
) . 60
Test 1.3.7 Data Lane HS-TX Static Common-Mode Voltages (V
CMTX(1)
, V
CMTX(0)
) ............ 64
Conformance Test Suite for D-PHY v2.1 CTS Version 1.0
22-Oct-2018
iv Copyright © 2007-2018 MIPI Alliance, Inc.
All rights reserved.
Confidential
Test 1.3.8 Data Lane HS-TX Static Common-Mode Voltage Mismatch (ΔV
CMTX(1,0)
) ....... 68
Test 1.3.9 Data Lane HS-TX Dynamic Common-Level Variations Between
50 MHz – 450 MHz (ΔV
CMTX(LF)
) ....................................................................... 70
Test 1.3.10 Data Lane HS-TX Dynamic Common-Level Variations Above
450 MHz (ΔV
CMTX(HF)
) ........................................................................................ 74
Test 1.3.11 Data Lane HS-TX 20%-80% Rise Time (t
R
) ...................................................... 76
Test 1.3.12 Data Lane HS-TX 80%-20% Fall Time (t
F
) ....................................................... 82
Test 1.3.13 Data Lane HS Exit: T
HS-TRAIL
Value .................................................................... 85
Test 1.3.14 Data Lane HS Exit: 30%-85% Post-EoT Rise Time (T
REOT
) .............................. 87
Test 1.3.15 Data Lane HS Exit: T
EOT
Value ........................................................................... 89
Test 1.3.16 Data Lane HS Exit: T
HS-EXIT
Value ...................................................................... 91
Group 4 Clock Lane HS-TX Signaling Requirements ..................................................... 94
Test 1.4.1 Clock Lane HS Entry: T
LPX
Value ...................................................................... 95
Test 1.4.2 Clock Lane HS Entry: T
CLK-PREPARE
Value .......................................................... 97
Test 1.4.3 Clock Lane HS Entry: T
CLK-PREPARE
+T
CLK-ZERO
Value ......................................... 99
Test 1.4.4 Clock Lane HS-TX Differential Voltages (V
OD(0)
, V
OD(1)
) ................................ 101
Test 1.4.5 Clock Lane HS-TX Differential Voltage Mismatch (ΔV
OD
) ............................. 105
Test 1.4.6 Clock Lane HS-TX Single-Ended Output High Voltages
(V
OHHS(DP)
, V
OHHS(DN)
) ........................................................................................ 107
Test 1.4.7 Clock Lane HS-TX Static Common-Mode Voltages (V
CMTX(1)
, V
CMTX(0)
) ........ 111
Test 1.4.8 Clock Lane HS-TX Static Common-Mode Voltage Mismatch (ΔV
CMTX(1,0)
) ... 113
Test 1.4.9 Clock Lane HS-TX Dynamic Common-Level Variations Between
50 MHz – 450 MHz (ΔV
CMTX(LF)
) ..................................................................... 114
Test 1.4.10 Clock Lane HS-TX Dynamic Common-Level Variations Above
450 MHz (ΔV
CMTX(HF)
) ...................................................................................... 116
Test 1.4.11 Clock Lane HS-TX 20%-80% Rise Time (t
R
) .................................................. 118
Test 1.4.12 Clock Lane HS-TX 80%-20% Fall Time (t
F
) ................................................... 121
Test 1.4.13 Clock Lane HS Exit: T
CLK-TRAIL
Value .............................................................. 124
Test 1.4.14 Clock Lane HS Exit: 30%-85% Post-EoT Rise Time (T
REOT
) .......................... 126
Test 1.4.15 Clock Lane HS Exit: T
EOT
Value ....................................................................... 127
Test 1.4.16 Clock Lane HS Exit: T
HS-EXIT
Value .................................................................. 129
Test 1.4.17 Clock Lane HS Clock Instantaneous UI (UI
INST
) ............................................. 131
Test 1.4.18 Clock Lane HS Clock Delta UI (ΔUI) .............................................................. 134
Test 1.4.19 TX Spread Spectrum Clocking (SSC) Requirements ....................................... 136
Test 1.4.20 Clock Lane HS Clock Period Jitter ................................................................... 140
Group 5 HS-TX Clock-To-Data Lane Timing Requirements ........................................ 142
Test 1.5.1 HS Entry: T
CLK-PRE
Value .................................................................................. 143
Test 1.5.2 HS Exit: T
CLK-POST
Value ................................................................................... 145
Test 1.5.3 HS Clock Rising Edge Alignment to First Payload Bit .................................... 147
Test 1.5.4 Data-to-Clock Skew (T
SKEW[TX]
) ....................................................................... 150
Test 1.5.5 Initial HS Skew Calibration Burst (T
SKEWCAL-SYNC
, T
SKEWCAL)
.......................... 154
Test 1.5.6 Periodic HS Skew Calibration Burst (T
SKEWCAL-SYNC
, T
SKEWCAL)
...................... 157
Test 1.5.7 HS-TX Data and Clock Eye Diagram............................................................... 158
Test 1.5.8 Alternate Calibration Sequence (T
ALTCAL-SYNC
, T
ALTCAL
) ................................... 163
Test 1.5.9 Preamble Sequence (T
PREAMBLE
, T
EXTSYNC
) ....................................................... 166
Test 1.5.10 Clock and Data Lane TX HS-Idle: T
HS-IDLE-POST
, T
HS-IDLE-CLKHS0,
T
HS-IDLE-PRE
Values ............................................................................................. 169
CTS Version 1.0 Conformance Test Suite for D-PHY v2.1
22-Oct-2018
Copyright © 2007-2018 MIPI Alliance, Inc. v
All rights reserved.
Confidential
Group 6 LP-TX INIT, ULPS, and BTA Requirements ................................................... 172
Test 1.6.1 INIT: LP-TX Initialization Period (T
INIT,MASTER
) .............................................. 173
Test 1.6.2 ULPS Entry: Verification of Clock Lane LP-TX ULPS support ...................... 175
Test 1.6.3 ULPS Exit: Transmitted T
WAKEUP
Interval ........................................................ 177
Test 1.6.4 BTA: TX-Side T
TA-GO
Interval Value ................................................................ 179
Test 1.6.5 BTA: RX-Side T
TA-SURE
Interval Value ............................................................. 181
Test 1.6.6 BTA: RX-Side T
TA-GET
Interval Value ............................................................... 183
Section 2 RX Timers and Electrical Tolerances .....................................................185
Overview .................................................................................................................................. 185
Group 1 LP-RX Voltage and Timing Requirements ....................................................... 186
Test 2.1.1 LP-RX Logic 1 Input Voltage (V
IH
) .................................................................. 187
Test 2.1.2 LP-RX Logic 0 Input Voltage, Non-ULP State (V
IL
) ....................................... 190
Test 2.1.3 LP-RX Logic 0 Input Voltage, ULP State (V
IL-ULPS
) (OBSOLETE) ................. 192
Test 2.1.4 LP-RX Input Hysteresis (V
HYST
) ...................................................................... 194
Test 2.1.5 LP-RX Minimum Pulse Width Response (T
MIN-RX
) .......................................... 197
Test 2.1.6 LP-RX Input Pulse Rejection (e
SPIKE
) (OBSOLETE) ....................................... 199
Test 2.1.7 LP-RX Interference Tolerance (V
INT
and f
INT
) .................................................. 203
Test 2.1.8 LP-CD Logic Contention Thresholds (V
IHCD
and V
ILCD
) (OBSOLETE) .......... 205
Group 2 LP-RX Behavioral Requirements ..................................................................... 208
Test 2.2.1 LP-RX Initialization period (T
INIT
) ................................................................... 209
Test 2.2.2 ULPS Exit: LP-RX T
WAKEUP
Timer Value ......................................................... 211
Test 2.2.3 Clock Lane LP-RX Invalid/Aborted ULPS Entry ............................................ 212
Test 2.2.4 Data Lane LP-RX Invalid/Aborted Escape Mode Entry .................................. 214
Test 2.2.5 Data Lane LP-RX Invalid/Aborted Escape Mode Command........................... 216
Test 2.2.6 Data Lane LP-RX Escape Mode Invalid Exit (OBSOLETE) ........................... 219
Test 2.2.7 Data Lane LP-RX Escape Mode, Ignoring of Post-Trigger-Command
Extra Bits .......................................................................................................... 221
Test 2.2.8 Data Lane LP-RX Escape Mode Unsupported/Unassigned Commands .......... 223
Group 3 HS-RX Voltage and Setup/Hold Requirements ............................................... 225
Test 2.3.1 HS-RX Common Mode Voltage Tolerance (V
CMRX(DC)
) ................................... 226
Test 2.3.2 HS-RX Differential Input High Threshold (V
IDTH
) ........................................... 229
Test 2.3.3 HS-RX Differential Input Low Threshold (V
IDTL
) ............................................ 232
Test 2.3.4 HS-RX Single-Ended Input High Voltage (V
IHHS
) ............................................ 234
Test 2.3.5 HS-RX Single-Ended Input Low Voltage (V
ILHS
) ............................................. 236
Test 2.3.6 HS-RX Common-Mode Interference 50 MHz – 450 MHz (ΔV
CMRX(LF)
) ......... 238
Test 2.3.7 HS-RX Common-Mode Interference Beyond 450 MHz (ΔV
CMRX(HF)
) ............ 241
Test 2.3.8 HS-RX Setup/Hold and Eye Diagram Tolerance .............................................. 243
Test 2.3.8.1 HS-RX Setup/Hold Time & Amplitude Test for Data Rates ≤ 1.5 Gbps ........... 243
Test 2.3.8.2 Jitter/Eye Diagram Tolerance Test for Data Rates >1.5 Gbps
and ≤ 2.5 Gbps ................................................................................................ 245
Test 2.3.8.3 Jitter/Eye Diagram Tolerance Test for Data Rates > 2.5 Gbps
and ≤ 4.5 Gbps ................................................................................................ 248
Test 2.3.9 HS-RX Spread Spectrum Clocking (SSC) Tolerance ....................................... 252
剩余397页未读,继续阅读
资源评论
qflook
- 粉丝: 437
- 资源: 19
上传资源 快速赚钱
- 我的内容管理 展开
- 我的资源 快来上传第一个资源
- 我的收益 登录查看自己的收益
- 我的积分 登录查看自己的积分
- 我的C币 登录后查看C币余额
- 我的收藏
- 我的下载
- 下载帮助
安全验证
文档复制为VIP权益,开通VIP直接复制
信息提交成功