没有合适的资源?快使用搜索试试~ 我知道了~
MIL-PRF-38535J微电路制造通用规范
5星 · 超过95%的资源 需积分: 30 31 下载量 69 浏览量
2016-07-24
22:05:11
上传
评论
收藏 2.64MB PDF 举报
温馨提示
试读
202页
美国军用标准 MIL-PRF-38535J 微电路制造通用规范_信息与通信_工程科技_专业资料
资源推荐
资源详情
资源评论
MIL-PRF-38535J
w/AMENDMENT 1
14 May 2012
SUPERSEDING
MIL-PRF-38535J
28 December 2010
PERFORMANCE SPECIFICATION
INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING,
GENERAL SPECIFICATION FOR
AMSC N/A FSC 5962
INCH-POUND
Comments, suggestions, or questions on this document should be addressed to: DLA Land and Maritime,
ATTN: VAC, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to [email protected]. Since contact
information can change, you may want to verify the currency of this address information using the ASSIST
Online database at https://assist.daps.dla.mil.
The documentation and process conversion measures
necessary to comply with this AMENDMENT shall be
completed by June 30, 2012.
MIL-PRF-38535J
w/AMENDMENT 1
CONTENTS
PARAGRAPH PAGE
ii
1 SCOPE ...................................................................................................................................................................... 1
1.1 Scope ...................................................................................................................................................................... 1
2. APPLICABLE DOCUMENTS .................................................................................................................................... 1
2.1 General ................................................................................................................................................................... 1
2.2 Government documents .......................................................................................................................................... 2
2.2.1 Specifications, standards, and handbooks ........................................................................................................... 2
2.2.2 Other Government documents, drawings, and publications ................................................................................. 2
2.3 Non-Government publications ................................................................................................................................. 2
2.4 Order of precedence ............................................................................................................................................... 3
3. REQUIREMENTS ..................................................................................................................................................... 3
3.1 General ................................................................................................................................................................... 3
3.1.1 Reference to applicable device specification ........................................................................................................ 3
3.2 Item requirements ................................................................................................................................................... 3
3.2.1 Certification of conformance and acquisition traceability ...................................................................................... 4
3.3 Quality management (QM) program ........................................................................................................................ 5
3.3.1 Manufacturer's review system .............................................................................................................................. 5
3.3.2 QM plan................................................................................................................................................................ 5
3.3.3 Self-assessment program .................................................................................................................................... 5
3.3.4 Change control procedures .................................................................................................................................. 5
3.3.4.1 Discontinuation of products ............................................................................................................................... 5
3.4 Requirements for listing on a QML .......................................................................................................................... 5
3.4.1 QML certification requirements ............................................................................................................................ 6
3.4.1.1 Process capability demonstration ...................................................................................................................... 6
3.4.1.1.1 New technology insertion ............................................................................................................................... 6
3.4.1.2 Management and technology validation ............................................................................................................ 7
3.4.1.3 On-site validation .............................................................................................................................................. 7
3.4.1.3.1 Second and third party validations ................................................................................................................. 7
3.4.1.3.2 Radiation source of supply (RSS) validations ................................................................................................ 7
3.4.1.4 Technology validation ....................................................................................................................................... 7
3.4.1.4.1 Package design selection reviews ................................................................................................................. 8
3.4.1.5 Manufacturer self-validation .............................................................................................................................. 9
3.4.1.6 Change management system ........................................................................................................................... 9
3.4.1.7 Deficiencies and concerns ................................................................................................................................ 9
3.4.1.8 Letter of certification .......................................................................................................................................... 9
3.4.2 QML qualification requirements ............................................................................................................................ 9
3.4.2.1 Qualification extension ...................................................................................................................................... 9
3.4.3 Qualification to RHA levels ................................................................................................................................. 10
3.4.4 QML listing ......................................................................................................................................................... 10
3.4.5 Maintenance and retention of QML .................................................................................................................... 10
3.4.6 QML line shutdown ............................................................................................................................................ 10
3.4.7 Revalidation reviews .......................................................................................................................................... 10
3.4.8 Performance requirements for class T devices .................................................................................................. 10
3.4.8.1 Class T radiation requirements ....................................................................................................................... 11
3.5 Device specification .............................................................................................................................................. 11
3.6 Marking of microcircuits ........................................................................................................................................ 11
3.6.1 Index point .......................................................................................................................................................... 11
3.6.2 Part or identification number (PIN) ..................................................................................................................... 12
3.6.2.1 RHA designator ............................................................................................................................................... 13
3.6.2.2 Drawing designator ......................................................................................................................................... 13
3.6.2.2.1 Military designator ........................................................................................................................................ 13
3.6.2.3 Device class designator .................................................................................................................................. 13
3.6.2.4 Case outline .................................................................................................................................................... 13
3.6.2.5 Lead finish ....................................................................................................................................................... 13
3.6.3 Certification mark ............................................................................................................................................... 13
3.6.3.1 QD certification mark ....................................................................................................................................... 13
MIL-PRF-38535J
w/AMENDMENT 1
CONTENTS
PARAGRAPH PAGE
iii
3.6.3.2 JAN or J mark ................................................................................................................................................. 14
3.6.4 Manufacturer's identification ............................................................................................................................... 14
3.6.4.1 Code for assembly sites .................................................................................................................................. 14
3.6.5 Country of origin ................................................................................................................................................. 14
3.6.6 Date code ........................................................................................................................................................... 14
3.6.7 Marking location and sequence .......................................................................................................................... 14
3.6.7.1 Beryllium oxide package identifier ................................................................................................................... 14
3.6.7.2 Electrostatic discharge (ESD) sensitivity identifier .......................................................................................... 14
3.6.8 QML marked product ......................................................................................................................................... 15
3.6.9 Marking on container .......................................................................................................................................... 15
3.7 Remarking ............................................................................................................................................................. 15
3.8 Screening and test ................................................................................................................................................ 15
3.9 Technology conformance inspection (TCI) ............................................................................................................ 15
3.9.1 TCI assessment ................................................................................................................................................. 15
3.10 Solderability ......................................................................................................................................................... 15
3.11 Traceability .......................................................................................................................................................... 15
3.12 ESD control ......................................................................................................................................................... 15
3.13 Recycled, recovered, or environmentally preferable materials ............................................................................ 15
3.14 Alternate test requirements ................................................................................................................................. 16
3.15 Passive elements ................................................................................................................................................ 16
3.15.1 Capacitors ........................................................................................................................................................ 16
4. VERIFICATION ....................................................................................................................................................... 17
4.1 Verification ............................................................................................................................................................ 17
4.2 Screening .............................................................................................................................................................. 17
4.2.1 Screen testing failures ........................................................................................................................................ 17
4.2.2 Screening resubmission criteria ......................................................................................................................... 17
4.2.3 Electrostatic discharge (ESD) sensitivity ............................................................................................................ 17
4.3 Technology conformance inspection (TCI) ............................................................................................................ 17
4.4 Qualification inspection ......................................................................................................................................... 17
5. PACKAGING ........................................................................................................................................................... 23
5.1 Packaging ............................................................................................................................................................. 23
6. NOTES .................................................................................................................................................................... 23
6.1 Intended use ......................................................................................................................................................... 23
6.1.1 Class T ............................................................................................................................................................... 23
6.2 Acquisition requirements ....................................................................................................................................... 23
6.3 Qualification .......................................................................................................................................................... 23
6.4 Terms and definitions ............................................................................................................................................ 23
6.4.1 Microelectronics ................................................................................................................................................. 23
6.4.2 Element (of a microcircuit or integrated circuit) .................................................................................................. 23
6.4.3 Substrate (of a microcircuit or integrated circuit) ................................................................................................ 24
6.4.4 Integrated circuit (microcircuit) ........................................................................................................................... 24
6.4.4.1 Multichip microcircuit ....................................................................................................................................... 24
6.4.4.2 Monolithic microcircuit ..................................................................................................................................... 24
6.4.4.3 Microcircuit module ......................................................................................................................................... 24
6.4.5 Production lot ..................................................................................................................................................... 24
6.4.6 Inspection lot ...................................................................................................................................................... 24
6.4.7 Wafer lot ............................................................................................................................................................. 24
6.4.8 Percent defective allowable (PDA) ..................................................................................................................... 24
6.4.9 Delta limit ........................................................................................................................................................... 24
6.4.10 Rework ............................................................................................................................................................. 24
6.4.11 Final seal .......................................................................................................................................................... 24
6.4.12 Acquiring activity .............................................................................................................................................. 25
6.4.13 Qualifying activity (QA) ..................................................................................................................................... 25
6.4.14 Parts per million (PPM) .................................................................................................................................... 25
6.4.15 Device type ...................................................................................................................................................... 25
MIL-PRF-38535J
w/AMENDMENT 1
CONTENTS
PARAGRAPH PAGE
iv
6.4.16 Die type ............................................................................................................................................................ 25
6.4.17 Radiation hardness assurance (RHA) .............................................................................................................. 25
6.4.18 Electrostatic discharge (ESD) sensitivity .......................................................................................................... 25
6.4.19 Package family ................................................................................................................................................. 25
6.4.20 Technology flow ............................................................................................................................................... 25
6.4.21 Qualified Manufacturer's Listing (QML) ............................................................................................................ 25
6.4.22 Third party design center.................................................................................................................................. 25
6.4.23 Radiation source of supply (RSS) .................................................................................................................... 25
6.4.24 Form ................................................................................................................................................................. 26
6.4.25 Fit ..................................................................................................................................................................... 26
6.4.26 Function ........................................................................................................................................................... 26
6.4.27 Class M ............................................................................................................................................................ 26
6.4.28 Class N............................................................................................................................................................. 26
6.4.29 Class Q ............................................................................................................................................................ 26
6.4.30 Class V ............................................................................................................................................................. 26
6.4.31 Class B ............................................................................................................................................................. 26
6.4.32 Class S ............................................................................................................................................................. 26
6.4.33 Class T ............................................................................................................................................................. 26
6.4.34 Qualified manufacturer’s line ............................................................................................................................ 26
6.4.35 Test optimization .............................................................................................................................................. 26
6.4.36 Audit team ........................................................................................................................................................ 26
6.4.37 Class level B .................................................................................................................................................... 26
6.4.38 Class level S .................................................................................................................................................... 26
6.4.39 Class level vs Class ......................................................................................................................................... 27
6.4.40 Second party facility ......................................................................................................................................... 27
6.4.41 Third party facility ............................................................................................................................................. 27
6.4.42 New technology ................................................................................................................................................ 27
6.4.43 Mature technology ............................................................................................................................................ 27
6.4.44 Lot date code ................................................................................................................................................... 27
6.4.45 Storage temperature ........................................................................................................................................ 27
6.5 Discussion ............................................................................................................................................................. 28
6.6 Additional reference documents ............................................................................................................................ 30
6.7 Subject term (key word) listing .............................................................................................................................. 31
6.8 List of acronyms .................................................................................................................................................... 32
6.9 Environmentally preferable material ...................................................................................................................... 34
6.10 Changes from previous issue .............................................................................................................................. 34
A.1 SCOPE ................................................................................................................................................................. 35
A.1.1 Scope................................................................................................................................................................. 35
A.2 APPLICABLE DOCUMENTS ................................................................................................................................ 35
A.2.1 General .............................................................................................................................................................. 35
A.2.2 Government documents..................................................................................................................................... 35
A.2.2.1 Specifications, standards, and handbooks...................................................................................................... 35
A.2.2.2 Other Government documents, drawings, and publications............................................................................ 36
A.2.3 Non-Government publications ........................................................................................................................... 36
A.2.4 Order of precedence .......................................................................................................................................... 37
A.3 REQUIREMENTS ................................................................................................................................................. 37
A.3.1 General .............................................................................................................................................................. 37
A.3.1.1 Reference to device specification or drawing .................................................................................................. 37
A.3.1.2 Conflicting requirements ................................................................................................................................. 38
A.3.1.3 Terms, definitions, and symbols ..................................................................................................................... 38
A.3.1.3.1 Microelectronics ........................................................................................................................................... 38
A.3.1.3.2 Element (of a microcircuit or integrated circuit) ............................................................................................ 38
A.3.1.3.3 Substrate (of a microcircuit or integrated circuit) .......................................................................................... 38
A.3.1.3.4 Microcircuit ................................................................................................................................................... 38
A.3.1.3.4.1 Multichip microcircuit ................................................................................................................................. 38
MIL-PRF-38535J
w/AMENDMENT 1
CONTENTS
PARAGRAPH PAGE
v
A.3.1.3.4.2 Hybrid microcircuit .................................................................................................................................... 38
A.3.1.3.4.3 Monolithic microcircuit (or integrated circuit) ............................................................................................. 38
A.3.1.3.4.4 Film microcircuit (or film integrated circuit) ................................................................................................ 38
A.3.1.3.5 Microcircuit module ...................................................................................................................................... 38
A.3.1.3.6 Production lot ............................................................................................................................................... 39
A.3.1.3.7 Inspection lot - class level S ......................................................................................................................... 39
A.3.1.3.8 Inspection lot - class level B ......................................................................................................................... 39
A.3.1.3.9 Inspection sublot - class level S ................................................................................................................... 39
A.3.1.3.10 Inspection lot split - class level B ............................................................................................................... 39
A.3.1.3.11 Wafer lot .................................................................................................................................................... 39
A.3.1.3.12 Package type ............................................................................................................................................. 39
A.3.1.3.13 Microcircuit group ...................................................................................................................................... 39
A.3.1.3.14 Percent defective allowable (PDA) ............................................................................................................ 39
A.3.1.3.15
Delta limit (∆)
............................................................................................................................................. 39
A.3.1.3.16 Rework ....................................................................................................................................................... 40
A.3.1.3.17 Final seal ................................................................................................................................................... 40
A.3.1.3.18 Acquiring activity ........................................................................................................................................ 40
A.3.1.3.19 Qualifying activity ....................................................................................................................................... 40
A.3.1.3.20 Device type ................................................................................................................................................ 40
A.3.1.3.21 Die type ...................................................................................................................................................... 40
A.3.1.3.22 Antistatic .................................................................................................................................................... 40
A.3.1.3.23 Conductive ................................................................................................................................................. 40
A.3.1.3.24 Insulating ................................................................................................................................................... 40
A.3.1.3.25 Dissipative ................................................................................................................................................. 40
A.3.1.3.26 Radiation hardness assurance (RHA)........................................................................................................ 40
A.3.1.3.27 Electrostatic discharge (ESD) sensitivity .................................................................................................... 40
A.3.1.3.28 Custom microcircuit ................................................................................................................................... 41
A.3.1.3.29 Die family ................................................................................................................................................... 41
A.3.1.3.30 Package family .......................................................................................................................................... 41
A.3.1.3.31 Military operating temperature range ......................................................................................................... 41
A.3.1.3.32 Process monitor ......................................................................................................................................... 41
A.3.1.3.33 Device specification ................................................................................................................................... 41
A.3.1.3.34 Class level B .............................................................................................................................................. 41
A.3.1.3.35 Class level S .............................................................................................................................................. 41
A.3.2 Item requirements .............................................................................................................................................. 41
A.3.2.1 Electrical test requirements ............................................................................................................................. 41
A.3.2.2 Alternate die/fabrication requirements ............................................................................................................ 42
A.3.2.2.1 Example C of C ............................................................................................................................................ 42
A.3.2.2.2 Die evaluation requirements ........................................................................................................................ 43
A.3.3 Classification of requirements ............................................................................................................................ 43
A.3.3.1 Certification of conformance and acquisition traceability ................................................................................ 44
A.3.4 Quality assurance requirements ........................................................................................................................ 45
A.3.4.1 Qualification .................................................................................................................................................... 45
A.3.4.1.1 Compliance validation .................................................................................................................................. 45
A.3.4.1.2 Process monitor programs ........................................................................................................................... 45
A.3.4.1.2.1 Inspection by scanning electron microscope (SEM) ................................................................................. 45
A.3.4.1.2.2 Wire bonding ............................................................................................................................................. 45
A.3.4.1.2.3 Die attachment .......................................................................................................................................... 45
A.3.4.1.2.4 Lid seal ..................................................................................................................................................... 45
A.3.4.1.2.5 Particle detection ...................................................................................................................................... 45
A.3.4.1.2.6 Lead trimming and final lead finish thickness ............................................................................................ 46
A.3.4.1.3 Qualification to RHA levels .......................................................................................................................... 46
A.3.4.1.4 Qualification to ESD classes ........................................................................................................................ 47
A.3.4.2 Changes and notification of change to product or quality assurance program ............................................... 48
A.3.4.2.1 Discontinuation of products .......................................................................................................................... 48
剩余201页未读,继续阅读
资源评论
- w3474512012020-04-16不错 谢谢分享
dying1988
- 粉丝: 0
- 资源: 6
上传资源 快速赚钱
- 我的内容管理 展开
- 我的资源 快来上传第一个资源
- 我的收益 登录查看自己的收益
- 我的积分 登录查看自己的积分
- 我的C币 登录后查看C币余额
- 我的收藏
- 我的下载
- 下载帮助
最新资源
- NVIDIA驱动、CUDA和Pytorch及其依赖
- html动态爱心代码一(附源码)
- c40539bc-071a-486c-9d52-9d0c18d62dac 4.html
- 基于物理的非视域成像(NLOS)算法,利用了nerf+python源码+文档说明
- yuluer知更鸟.7z(1).001
- python课程设计-基于tensorflow实现的图文生成程序,数据集flickr30k-images+源代码+文档说明+截图
- python作业-基于Flickr30k数据集实现图像文本跨模态搜索python源码+数据集+测试界面+项目说明(高分课程设计)
- 基于Qt实现医院信息管理系统c++源码+文档说明+数据库(期末大作业)
- 基于python实现的医院信息管理系统完整源码+sql数据库+详细注释(高分课程设计)
- 基于python的眼底图像视杯视盘分割项目源码+文档说明+截图演示+详细注释(高分课程设计)
资源上传下载、课程学习等过程中有任何疑问或建议,欢迎提出宝贵意见哦~我们会及时处理!
点击此处反馈
安全验证
文档复制为VIP权益,开通VIP直接复制
信息提交成功