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Library of Congress Cataloging-in-Publication Data Is Available
Hosmer, David W.
Applied Logistic Regression / David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant. -
3rd ed.
Includes bibliographic references and index.
ISBN 978-0-470-58247-3 (cloth)
Printed in the United States of America
10987654321
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