JEDEC 工业标准
环境应力试验
[JDa1] JESD22-A100-B Cycled Temperature-Humidity-Bias Life Test 上电温湿度循环寿命试验,
(Revision of JESD22-A100-A) April 2000 [Text-jd001]
[JDa2] JESD22-A101-B Steady State Temperature Humidity Bias Life Test 上电温湿度稳态寿命试
验, (Revision of JESD22-A101-A) April 1997 [Text-jd002]
[JDa3] JESD22-A102-C Accelerated Moisture Resistance -Unbiased Autoclave 高加速蒸煮试验,
(Revision of JESD22-A102-B) December 2000 [Text-jd003]
[JDa4] JESD22-A103-A Test Method A103-A High Temperature Storage Life 高温储存寿命试验,
(Revision of Test Method A103 Previously Published in JESD22-B) July 1989 [Text-jd004]
[JDa5] JESD22-A103-B High Temperature Storage Life 高温储存寿命试验, (Revision of
JESD22-A103-A) August 2001 [Text-jd005]
[JDa6] JESD22-A104-B Temperature Cycling 温度循环, (Revision of JESD22-A104-A) July 2000
(参见更新版本 A104C) [Text-jd006]
[JDa7] EIA/JESD22-A105-B Test Method A105-B Power and Temperature Cycling 上电和温度循
环, (Revision of Test Method A105-A) February 1996 [Text-jd007]
[JDa8] JESD22-A106-A Test Method A106-A Thermal Shock 热冲击, (Revision of Test Method
A106-Previously Published in JESD22-B) April 1995 [Text-jd008]
[JDa9] JESD22-A107-A Salt Atmosphere 盐雾试验, (Revision of Test Method A107-Previously
Published in JESD22-B) December 1989 [Text-jd009]
[JDa10] JESD22-A108-B Temperature, Bias, and Operating Life 高温环境条件下的工作寿命试验,
(Revision of JESD22-A108-A) December 2000
[JDa11] JESD22-A110-B Test Method A110-B Highly-Accelerated Temperature and Humidity Stress
Test (HAST)高加速寿命试验, (Revision of Test Method A110-A) February 1999
[Text-jd010]
[JDa12] JESD22-A113-B Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability
Testing 非密封表贴器件在可靠性试验以前的预处理, (Revision of Test Method A113-A)
March 1999 [Text-jd011]
[JDa13] JESD22-A118 Accelerated Moisture Resistance - Unbiased HAST 不上电的高加速湿气渗
透试验, December 2000 [Text-jd012]
[JDa14] JESD22-B106-B Test Method B106-B Resistance to Soldering Temperature for
Through-Hole Mounted Devices 插接器件的抗焊接温度试验, (Revision of Test Method
B106-A) February 1999 [Text-jd013]
[JDa15] EIA/JESD47 Stress-Test-Driven Qualification of Integrated Circuits 集成电路施加应力的产
品验收试验, July 1995 [Text-jd031]
[JDa16] JESD22-A104C Temperature Cycling, (Revision of JESD22-A104-B) May 2005
[Text-jd040]
电应力和电测试试验
[JDb1] JESD22-A114-B Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model
(HBM)人体模型条件下的静电放电敏感度试验, (Revision of JESD22-A114-A) June 2000
[Text-jd014]
[JDb2] EIA/JESD22-A115-A Electrostatic Discharge (ESD) Sensitivity Testing Machine Model
(MM)机器模型条件下的静电放电敏感度试验, (Revision of EIA/JESD22-A115) October
1997 [Text-jd015]
[JDb3] JESD22-A117 Electrically Erasable Programmable ROM (EEPROM) Program/Erase
Endurance and Data Retention Test EEPROM 的擦涂和数据保存试验, January 2000
[Text-jd016]
[JDb4] EIA/JESD78 IC Latch-Up Test 集成电路器件闩锁试验, March 1997 [Text-jd017]
[JDb5] JESD22-C101-A Field-Induced Charged-Device Model Test Method for
Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components 微电子器件在
电荷感应模型条件下的抗静电放电试验, (Revision of JESD22-C101) June
2000 [Text-jd018]
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