In this work, we analyze and model the effect of a constant current stress on an ultraviolet light-emitting diode with a nominal wavelength of 285 nm. By carrying out electrical, optical, spectral, and steady-state photocapacitance (SSPC) analysis during stress, we demonstrate the presence of two different degradation mechanisms. The first one occurs in the first 1000 min of stress, is ascribed to the decrease in the injection efficiency, and is modeled by considering the defect generation dynam
