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Applied Logistic Regression
Applied Logistic Regression
Third Edition
DAVID W. HOSMER, JR.
Professor of Biostatistics (Emeritus)
Division of Biostatistics and Epidemiology
Department of Public Health
School of Public Health and Health Sciences
University of Massachusetts
Amherst, Massachusetts
STANLEY LEMESHOW
Dean, College of Public Health
Professor of Biostatistics
College of Public Health
The Ohio State University
Columbus, Ohio
RODNEY X. STURDIVANT
Colonel, U.S. Army
Academy and Associate Professor
Department of Mathematical Sciences
United States Military Academy
West Point, New York
Copyright © 2013 by John Wiley & Sons, Inc. All rights reserved.
Published by John Wiley & Sons, Inc., Hoboken, New Jersey.
Published simultaneously in Canada.
No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form
or by any means, electronic, mechanical, photocopying, recording, scanning, or otherwise, except as
permitted under Section 107 or 108 of the 1976 United States Copyright Act, without either the prior
written permission of the Publisher, or authorization through payment of the appropriate per-copy fee
to the Copyright Clearance Center, Inc., 222 Rosewood Drive, Danvers, MA 01923, (978) 750-8400,
fax (978) 750-4470, or on the web at www.copyright.com. Requests to the Publisher for permission
should be addressed to the Permissions Department, John Wiley &Sons, Inc., 111 River Street,
Hoboken, NJ 07030, (201) 748-6011, fax (201) 748-6008, or online at
http://www.wiley.com/go/permission.
Limit of Liability/Disclaimer of Warranty: While the publisher and author have used their best efforts
in preparing this book, they make no representations or warranties with respect to the accuracy or
completeness of the contents of this book and specifically disclaim any implied warranties of
merchantability or fitness for a particular purpose. No warranty may be created or extended by sales
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suitable for your situation. You should consult with a professional where appropriate. Neither the
publisher nor author shall be liable for any loss of profit or any other commercial damages, including
but not limited to special, incidental, consequential, or other damages.
For general information on our other products and services or for technical support, please contact our
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Wiley also publishes its books in a variety of electronic formats. Some content that appears in print
may not be available in electronic formats. For more information about Wiley products, visit our web
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Library of Congress Cataloging-in-Publication Data Is Available
Hosmer, David W.
Applied Logistic Regression / David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant. -
3rd ed.
Includes bibliographic references and index.
ISBN 978-0-470-58247-3 (cloth)
Printed in the United States of America
10987654321
To our wives, Trina, Elaine, and Mandy,
and our sons, daughters,
and grandchildren
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