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JESD78F 2022 IC LATCH-UP TEST.pdf
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JESD78F 2022 IC LATCH-UP TEST.pdf
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JEDEC
STANDARD
IC Latch-Up Test
JESD78F
(Revision of JESD78E, April 2016)
JANUARY 2022
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The information included in JEDEC standards and publications represents a sound approach to
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JEDEC
JEDEC Standard No. 78F
-i-
IC LATCH-UP
TEST
Contents
1
Scope, Purpose, and Limitations .................................................................................................... 1
1.1 Scope ................................................................................................................................................. 1
1.2 Purpose .............................................................................................................................................. 1
1.3 Limitations ......................................................................................................................................... 1
2
Terms and Definitions ..................................................................................................................... 2
3
Latch-up Characterization ............................................................................................................. 7
3.1 Latch-up immunity ............................................................................................................................ 7
3.2 Temperature classification ................................................................................................................. 8
3.3 Overall requirements ......................................................................................................................... 8
4
Apparatus and material .................................................................................................................. 9
4.1 Latch-up tester ................................................................................................................................... 9
4.1.1 Hardware requirements & capabilities .............................................................................................. 9
4.1.2 Test board ........................................................................................................................................ 10
4.1.3 Temperature Control ....................................................................................................................... 10
5
Latch-up test procedure ................................................................................................................ 11
5.1 General latch-up test overview ........................................................................................................ 11
5.2 Device handling ............................................................................................................................... 13
5.3 Sample size ...................................................................................................................................... 14
5.4 Preparation of the latch-up test ........................................................................................................ 14
5.4.1 Pin types and grouping .................................................................................................................... 14
5.4.1 Pin types and grouping (cont’d) ...................................................................................................... 15
5.4.2 Power supply assignments ............................................................................................................... 15
5.4.3 Product pre-conditioning ................................................................................................................. 16
5.4.4 Device temperature set-up ............................................................................................................... 16
5.5 Latch-up detection criteria ............................................................................................................... 16
5.5.1 Latch-up detection ........................................................................................................................... 16
5.5.2 Power supply current limits ............................................................................................................. 17
5.6 Signal Pin Test ................................................................................................................................. 18
5.6.1 Signal Pin Test Flow ....................................................................................................................... 18
5.6.2 Waveforms for the positive Signal Pin Tests .................................................................................. 21
5.6.3 Waveforms for the negative Signal Pin Test – I-Test / E-Test ........................................................ 24
5.7 Supply Test ...................................................................................................................................... 26
5.7.1 Supply Test Flow ............................................................................................................................. 26
5.7.2 Waveforms for the Supply Test ....................................................................................................... 29
5.8 Functional and parametric test after latch-up stress ........................................................................ 30
5.9 Failure analysis ................................................................................................................................ 31
5.10 DUT disposition .............................................................................................................................. 31
6
Report Requirements .................................................................................................................... 31
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