MIL-STD-883-1
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1. SCOPE
1.1 Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental
testing of microelectronic devices to determine resistance to deleterious effects of natural elements and conditions
surrounding military operations. For the purpose of this standard, the term "devices" includes such items as
monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and
arrays are formed. This standard is intended to apply only to microelectronic devices.
1.2 Numbering system. The test methods are designated by numbers assigned in accordance with the following
system:
1.2.1 Classification of tests. The environmental test methods included in this part of a multipart test method
standard are numbered 1001 to 1034 inclusive.
1.2.2 Test method revisions. Revisions are numbered consecutively using a period to separate the test method
number and the revision number. For example, 1001.2 designates the second revision of test method 1001.
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, and 5 of this standard. This
section does not include documents cited in other sections of this standard or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements documents cited in sections 3, 4, and 5 of this
standard, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-680 - Degreasing Solvent, Performance Specification For.
MIL-PRF-19500 - Semiconductor Devices, General Specification For.
MIL-PRF-38534 - Hybrid Microcircuits, General Specification For.
MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification For.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-202 - Electronic and Electrical Component Parts.
MIL-STD-750 - Test Methods for Semiconductor Devices.
MIL-STD-1686 - Electrostatic Discharge Control Program for Protection of Electrical and Electronic
Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive
Devices).
MIL-STD-1835 - Electronic Component Case Outlines.
MIL-STD-1916 - DOD Preferred Methods for Acceptance of Product.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-217 - Reliability Prediction of Electronic Equipment.
MIL-HDBK-505 - Definitions of Item Levels, Item Exchangeability, Models, and Related Terms.
MIL-HDBK-781 - Reliability Test Methods, Plans, and Environments for Engineering, Development
Qualification, and Production .
MIL-HDBK-1331 - Parameters to be Controlled for the Specification of Microcircuits.
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