AEC - Q100 - REV-H
September 11, 2014
Component Technical Committee
Automotive Electronics Council
Revision Summary (continued)
• Table 2 – Qualification Test Methods (continued):
o Test C4 – Physical Dimension: Removed Ppk requirement; modified Cpk accept criteria to
Cpk>1.67; added reference to AEC-Q003
o Test C5 – Solder Ball Shear: Removed Ppk requirement; modified Cpk accept criteria to
Cpk>1.67; added reference to AEC-Q003
o Test E2 – Electrostatic Discharge Human Body Model/Machine Model: Eliminated Machine
Model (MM) ESD entry; added reference to Section 1.3.1
o Test E3 – Electrostatic Discharge Charged Device Model: Added reference to Section 1.3.1
o Test E5 – Electrical Distribution: Added Cpk>1.67 accept criteria and reference to AEC-Q003
o Eliminated Test E8 – Electrothermally Induced Gate Leakage entry
o NEW Test E12 – Lead (Pb) Free: Added new test entry
o Test F1 – Part Average Testing: Modified Additional Requirements providing guidance on
sample sizes and accept criteria
o Test F2 – Statistical Bin/Yield Analysis: Modified Additional Requirements providing
guidance on sample sizes and accept criteria
o Test G1 – Mechanical Shock: Modified sample size/lot and number of lots
o Test G2 – Variable Frequency Vibration: Modified sample size/lot and number of lots
o Test G3 – Constant Acceleration: Modified sample size/lot and number of lots
o Test G4 – Gross/Fine Leak: Modified sample size/lot and number of lots
o Test G8 – Internal Water Vapor: Modified sample size/lot
o Table 2 Legend: Added Note L reference for Pb-Free devices
• Table 3 – Process Change Qualification Guidelines for the Selection of Tests: Removed MM (Machine
Model) ESD and GL (Gate Leakage) entries; added LF (Lead Free) entry
• Appendix 1 – Definition of a Product Qualification Family: Complete revision
o NEW Section A1.1 – Product: Added new section and text
o NEW Section A1.4 – Qualification/Requalification Lot Requirements: Relocated original
AEC-Q100 Rev G Table 1 to Appendix 1 and renumbered as Table A1.1
o Revised Table A1.1 – Part Qualification/Requalification Lot Requirements: Deleted row titled
“A new part that has some applicable generic data”; added NEW entry where “The part to be
qualified is slightly more complex”
o NEW Table A1.2 – Examples for Generic Data Use: Added new Table and content
• Appendix Template 4A – AEC-Q100 Qualification Test Plan:
o Test C3, SD - Solderability: Added reference to J-STD-002D and requirement of steam aging
o Test E2, HBM/MM – ESD Human Body/machine Model: Eliminated MM entry
o Test E8, GL – Electrothermally Induced Gate Leakage: Eliminated GL entry
o Tests G1-G4, MECH – Hermetic Package Tests: Modified sample size and lot requirements
• Appendix Template 4B – AEC-Q100 Generic Data:
o Test C3, SD: Added reference to J-STD-002D and requirement of steam aging
o Test E2, HBM/MM: Eliminated MM entry
o Test E8, GL: Eliminated GL entry
o Test G1, MS: Modified sample size and lot requirements
o Test G2, VFV: Modified sample size and lot requirements
o Test G3, CA: Modified sample size and lot requirements
o Test G4, GFL: Modified sample size and lot requirements
o Complete revision of Generic Data Part Attributes Section
• NEW Appendix 7 – Guideline on Relationship of Robustness Validation to AEC-Q100: Added NEW
Section and text, including NEW Figures A7.1 & A7.2 and NEW Table A7.1
