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UNH-IOL MIPI Alliance Test Program

D-PHY TX Conformance Test Report

InterOperability Lab — 121 Technology Drive, Suite 2 — Durham, NH 03824 — (603) 862-3749

Cover Letter

September 27, 2010

Engineer Name

Sample Company, Inc.

1010 Mobile Way

San Jose, CA 95101

Mr. Engineer:

Enclosed are the test results from the D-PHY TX Physical Layer Conformance testing performed on the:

Sample Company 1234 Camera Sensor 1-Lane CSI-2 Transmitter

The testing was performed according to v0.98 of the MIPI Alliance D-PHY Conformance Test Suite, which

is available to MIPI Alliance Members at:

https://members.mipi.org/mipi-testing/workspace/StartPage

Also note that most of the measurements in this report were performed on captured DSO waveform data

using the freely available DPHYGUI physical layer conformance software tool, which is available to all MIPI

members, and may be downloaded at the URL above. The raw waveform data files used for this report may be

obtained upon request, if duplication of results or further analysis of the data is desired. (Contact UNH IOL for

assistance.)

Any conformance failures observed during testing are listed below:

 NO CONFORMANCE ISSUES WERE OBSERVED DURING TESTING

Please feel free to contact me via email at aab@iol.unh.edu

with any questions you may have regarding this

report.

Sincerely,

Andy Baldman

iol

Digitally signed

by UNH-IOL

Date: 2010.09.23

00:28:28 -04'00'

The University of New Hampshire InterOperability Laboratory

DUT: Sample Company 1234 Camera Sensor 1-Lane CSI-2 Transmitter

UNH IOL MIPI Alliance Test Program

D-PHY Conformance Test Suite - SAMPLE REPORT

Document 1.0

Created September 27, 2010

Table 1-1: (Section 1, Group 1): Data Lane LP-TX Signaling Requirements:

Test/Parameter

Conformance

Range

Lane 0

Measured

Lane 1

Measured

Lane 2

Measured

Lane 3

Measured

Units Fig.

Test 1.1.1: Data Lane LP-TX Thevenin Output High Level Voltages (V

)

Measured V

for V

(50pF C

LOAD

): 1100 / 1300

1178.2

N/A N/A N/A mV 1

Measured V

for V

(50pF C

LOAD

): 1100 / 1300

1185.4

N/A N/A N/A mV 2

Measured V

for V

(No C

LOAD

): 1100 / 1300

1177.1

N/A N/A N/A mV 3

Measured V

for V

(No C

LOAD

): 1100 / 1300

1180.3

N/A N/A N/A mV 4

Test 1.1.2: Data Lane LP TX Thevenin Output Low Level Voltages (V

)

Measured V

for V

(50pF C

LOAD

): -50 / +50

-5.0

N/A N/A N/A mV 1

Measured V

for V

(50pF C

LOAD

): -50 / +50

-5.1

N/A N/A N/A mV 2

Measured V

for V

(No C

LOAD

): -50 / +50

-6.3

N/A N/A N/A mV 3

Measured V

for V

(No C

LOAD

): -50 / +50

-5.7

N/A N/A N/A mV 4

Test 1.1.3: Data Lane LP TX 15%-85% Rise Time (T

RLP

)

Measured T

RLP

for V

(50pF C

LOAD

): < 25

13.5

N/A N/A N/A ns 5

Measured T

RLP

for V

(50pF C

LOAD

): < 25

13.8

N/A N/A N/A ns 6

Measured T

RLP

for V

(No C

LOAD

): < 25

10.3

N/A N/A N/A ns 7

Measured T

RLP

for V

(No C

LOAD

): < 25

10.3

N/A N/A N/A ns 8

Test 1.1.4: Data Lane LP TX 15%-85% Fall Time (T

FLP

)

Measured T

FLP

for V

(50pF C

LOAD

): < 25

11.7

N/A N/A N/A ns 9

Measured T

FLP

for V

(50pF C

LOAD

): < 25

11.6

N/A N/A N/A ns 10

Measured T

FLP

for V

(No C

LOAD

): < 25

11.1

N/A N/A N/A ns 11

Measured T

FLP

for V

(No C

LOAD

): < 25

10.8

N/A N/A N/A ns 12

Test 1.1.5: Data Lane LP TX Slew Rate vs. C

LOAD

(δV/δt

)

(Falling Edges, C

LOAD

= 50pF):

MAX δV/δt

(entire edge): < 150

121.9

N/A N/A N/A mV/ns 9

MIN δV/δt

(400-930mV): > 30

60.0

N/A N/A N/A mV/ns 9

(Falling Edges, C

LOAD

= 50pF):

MAX δV/δt

(entire edge): < 150

113.8

N/A N/A N/A mV/ns 10

MIN δV/δt

(400-930mV): > 30

61.1

N/A N/A N/A mV/ns 10

(Rising Edges, C

LOAD

= 50pF):

MAX δV/δt

(entire edge): < 150

104.8

N/A N/A N/A mV/ns 5

MIN δV/δt

(400-700mV): > 30

55.6

N/A N/A N/A mV/ns 5

MIN δV/δt

margin (700-930mV): > 0

29.8

N/A N/A N/A mV/ns 5

(Rising Edges, C

LOAD

= 50pF):

MAX δV/δt

(entire edge): < 150

106.1

N/A N/A N/A mV/ns 6

MIN δV/δt

(400-700mV): > 30

57.5

N/A N/A N/A mV/ns 6

MIN δV/δt

margin (700-930mV): > 0

31.7

N/A N/A N/A mV/ns 6

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