Coherent optical adaptive technique improves the spatial resolut...

Stimulated emission depletion (STED) microscopy is one of far-field optical microscopy techniques that can provide sub-diffraction spatial resolution. The spatial resolution of the STED microscopy is determined by the specially engineered beam profile of the depletion beam and its power. However, the beam profile of the depletion beam may be distorted due to aberrations of optical systems and inhomogeneity of a specimen’s optical properties, resulting in a compromised spatial resolution. The sit