Third-order optical nonlinearities of Zn_(1-x)MgxO thin films

The Zn_(1-x)MgxO thin films were deposited on sapphire substrates by reactive electron beam evaporation deposition (REBED). The X-ray diffraction (XRD) measurement demonstrates that these films undergo phase transition from hexagonal to cubic with increasing the Mg concentration. Absorption coefficients at 532 nm of the samples were obtained from the absorption spectra. Using optical Kerr effect, the third-order susceptibilities of the ternary films over a wide range of Mg concentrations were de