Electronic speckle pattern interferometry (ESPI) and digital speckle pattern interferometry are well-established non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional (2D) or three-dimensional (3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations
