The analytical expression for the complex amplitude of light reflected from a wedge-shaped thin film is derived. For plane wave incidence, a simple ray tracing approach is used to calculate Goos-H?nchen (GH) shifts; and for non-plane wave incidence, for example, a Gaussian beam, the angular spectrum approach of plane wave is used in simulation. The two approaches predict that a wedge-shaped thin film can produce large negative longitudinal GH shifts. Although the reflectivity is small near the c