Luminescence sensing is an attractive approach for in-situ monitoring the health and integrity of multilayered surface protective coatings on highly active metals. In this work, we demonstrate the potential of erbium (Er) doped aluminum nitride (AlN) films to be applied as luminescence sensing layer in the Al/AlN multilayered coating system. The AlN:Er films were prepared by radio-frequency magnetron sputtering from Al targets doped with varied concentrations (from 0.5 at.% to 2.5 at.%) of Er. T
