MIL–STD–750F
w/CHANGE 2
CONTENTS
PARAGRAPH PAGE
iv
FOREWORD ......................................................................................................................................... ii
SUMMARY OF CHANGE 1 MODIFICATIONS ..................................................................................... iii
1.
SCOPE ....................................................................................................................................... 1
1.1 Purpose ................................................................................................................................. 1
1.2 Numbering system ................................................................................................................ 1
1.2.1 Classification of tests ....................................................................................................... 1
1.2.2 Test method revisions ..................................................................................................... 1
1.3 Methods of reference ............................................................................................................ 1
2. APPLICABLE DOCUMENTS ...................................................................................................... 2
2.1 General ................................................................................................................................. 2
2.2 Government documents ........................................................................................................ 2
2.2.1 Specifications, standards, and handbooks ...................................................................... 2
2.3 Non-Government publications ............................................................................................... 2
2.4 Order of precedence ............................................................................................................. 3
3. DEFINITIONS ............................................................................................................................. 3
3.1 Acronyms, symbols, and definitions ...................................................................................... 3
3.1.1 Acronyms used in this standard ....................................................................................... 3
3.1.2 Symbols used in this standard ......................................................................................... 4
3.1.3 Definitions used in this standard ...................................................................................... 4
3.1.3.1 Accuracy .................................................................................................................... 4
3.1.3.2 Acquisition documents ............................................................................................... 4
3.1.3.3 Precision .................................................................................................................... 4
3.1.3.4 Standard reference material ...................................................................................... 4
3.1.3.5 Uncertainty ................................................................................................................. 4
4. GENERAL REQUIREMENTS ..................................................................................................... 5
4.1 Test conditions ...................................................................................................................... 5
4.1.1 Permissible temperature variation in environmental chambers ....................................... 5
4.1.2 Electrical test frequency .................................................................................................. 5
4.1.3 Sinusoidal pulse testing ................................................................................................... 5
4.1.4 Accuracy .......................................................................................................................... 5
4.1.4.1 Control based on uncertainty ..................................................................................... 6
4.1.4.2 Test methods and circuits .......................................................................................... 6
4.1.5 Calibration requirements ................................................................................................. 7
4.2 Identification of orientations, direction of forces applied and major plane for x-sectioning .... 7
4.3 General precautions .............................................................................................................. 9
4.3.1 Transients ........................................................................................................................ 9
4.3.2 Test conditions for electrical measurements ................................................................... 9
4.3.2.1 Thermal resistance measurements (test method series 3100) .................................. 9
4.3.2.2 Low frequency tests (test method series 3200) ......................................................... 10
4.3.2.3 High frequency tests (test method series 3300) ......................................................... 10
4.3.2.4 Electrical characteristics tests for MOS field effect transistors (series 3400) ............. 10
4.3.2.5 Steady-state dc measurements (test method series 4000) ........................................ 10
4.3.2.6 Pulse measurements (test method series 3000 and 4000) ........................................ 10
4.3.2.7 Electrical characteristics tests for microwave diodes (test method series 4100) ........ 10
4.3.3 Test circuits ..................................................................................................................... 11
4.3.3.1 Test method variation ................................................................................................ 11
4.3.4 Soldering ......................................................................................................................... 11
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