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MIL-STD-883E_NOTICE-1.025808.pdf
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MIL-STD-883E_NOTICE-1.025808.pdf
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I
I
DEPARTMENT’ OF DEFENSE
MIL-STD-BB3E
NOTICE 1
1 December 1997
TEST ME7HODS STANDARD
MICROCIRCUITS
TO ALL HOLDERS OF MIL—STD4B3E
1. THE FOLLOWING TEST METHODS OF MIL
—STBSS3E HAVE BEEN REWED AND SUPERSEDE THE TEST
MEIHODS LISIED
NEW MEIHOD DATE
SUPERSEOEO MEl_HOD DATE
I
1019.5 1 Deaxnber 1997
1019.4
15 November 19S1
2. THE FOliOWING PAGES OF MIL—STD—SW
E HAVE BEEN REVISED AND sUPERSEDE THE PAGES USTELX
MEIHOD
NEW PAGE
●
DATE SUPERSEDED PAGE
DATE
iii
31 Oecemberls
iii
REPRINTED WITHOUT CHANGE
“w
1 December 1997 iv
31 Dec?mta 19s6
v
31 0ecamerls96 REPRINTED WITHOUT CHANGE
vi
31hcember1996 ; REPRINTED VvlTHOUT CHANGE
2033.1 5
1 Jurre 1S93
5
REPRINTED WTHOUT CHANGE
6
1 oecember1997
6
1 June 19S3
7
1 June 1993
7
6
1 June 1SS3
1 December 19S7
8
1 June 19S3
13
1 June 1S93 13
REPRINTED WITHOUT CHANGE
I&
i December 19S7
NEW
14
1 June 1S93
~4
REPRIMED WITHOUT CHANGE
44a
1 December 1SS7
NEW
5005.13 5
19 August 19%$
5
REPRINTED WITHOUT CHANGE
6
1 oecember1997
6
7
19 August 1s94
1 0ecem&r19w
7
8
19 Allgustlss4
1 December lsS7 8
13
19 August ls94
1 Decembw19s7
13
19 Augustlw
14
1 DecemberlS97
14
15
19 Augu!alsB4
1 December19S7
15
19 Augu5tlw4
5011.4
7 31 0ct0berlS95 7
REPRINTEO WTIHOUT CHANGE
8 1 December lSS7 6
31 Odmber 1S95
AMSC WA
DISTRIBLMON sATEMENT A
●
FSC 596z
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MIL—SlBS63E
NOllCE 1
3. RETAIN nls NOTICE MO INSERT BEFoRE TrW-.E OF CCN4TENTS
4. Holdem of MIL-STD4s3E will verify that page changes, addtions, and corredions indicated above trava bean
enterad. TMs ncd.ce page will ba ratained as a check sheet. Thk iasusnce, togeher with appended pages., is a
separate publition. Esdr notka is to k retained by stccking points I@ the mihy standard is mmpletely
revised or canceled.
NOTE The margins of this notice are nssdd with sstar&s b indicate vdmre charges (additions, modikaiions,
comections, delelions) tim the previous notice wara made. This was done as a sonvenienca only and tie
Govemnsarrr assumes
no rk3b~ WtsSosver for any insoxrsciea in these nolalions. Sidders and rnnbadws are
catinad to evaluate tha m@emanS
dtisd~~ontie ~rn-i~~edtim~ti
notations and relslionsHIp to the Ia.s4previous notice.
I
Concluding rwTERw
cuatO&m-
,.
Army-CR
Navy-EC
Air FOrCe-17
Reviaw aclivika
Fwmy-AR, Ml, SM
Navy - OS;SH, TO, AS, CG, MC
Air Foru3-19, SS,99
I
Preparing aefiwy
DLA -CC
2
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I
MIL-ST0463E
NOTICE 1
CONTENTS
●
1.1
1.2
2.
2.1
22
23
2.4
3.
3.1
4.
4.1
42
4.3
4.4
4.5
4.6
5.
6.
Pwpose.............
......................................................................................................................
1
Intended use of or reference to MIL—3TB663 ......................................................................... 1
APPUCA6LE DOCUMENTS .................................................................................................... 3
General ................................................................................................................................... 3
Govemmenl documents .......................................................................................................... 3
Non-Gowrnment p~tiOffi ................................................................................................. 4
Omier of ptecedena3 ............................................................................................................... 5
ASBREVIAmONS, SYMSOLS, AND DEFfNmONS ................................................................. 6
Mxwiations, symtals, and definitkms .................................................................................. 6
GENERAL RECKNREMEWS ................................................................................................... 6
Numte!im3 syslem .................................................................................................................. 8
Te31 msuhs ............................................................................................................................. 9
Tesl sample &.n ........................................................................................................... 9
tienlalion ......................................................................................................................... ...
9
Teet rntitiom ........................................................................................................................ 12
Geneml pmtiOm ................................................................................................................ 14
DETAIL REQUIREMEFTIS ........................................................................................................ 15
NO. ...................................................................................................................................... 16
FIGURES
FIGuRE
. .
1. Ori_n of noncyliirical micnxkLrmic devices M
direction of applied fmce ........................................................................................................... 10
2 Cxientatbn of cyiiical micmeiectnndc deviu? to
dkctian of applied rum= ................................................... ....................................................... 11
REPRINTED WITHOIJT CHANGE
...
m
Downloaded from http://www.everyspec.com
MIL+TO-SS3E
NOTICE 1
METHOO NO.
1001
1002
1003
1004.7
lW.8
1006
1007
10US2
1009.8
1010.7
1011.9
10121
1013
1014.10
1015.9
1016
10172
10182
“ 1019.5
1020.1 -,
10212
1032
1023.2
1030.1
1031
10321
1033
1034
2ml.2
20023
xm7
2004.5
2CQS2
m.1
2W72
2oas.1
3009.9
3010.10
2011.7
20127
2013.1
2014
2015.11
2016
2017.7
2018.3
2019.5
2020.7
TEST METHODS
EWRONMENTAL TESIS
MOmemic p—, ErJuced (-
Opmiion)
Immersion
Irwlarjon resktance
Mo*re resktane
pay state Me
MermdMtlife
AgEe He
6bMdti0n Lake
~ ~ (=-n)
Temperabm qtirq
Ti-emd ShOck
Ttlemlal dmactefislk
&&pm
mm-in es!
WreGMily dmracter&im tests
Neutron inzdii
Internal water-vapor content
ionizing -on (total dose) test p-we
Oase rate induced IaWIup test pmaure
k * upset_ of dgital micmcbwte
Ma#et ttueshold vol@e
Dcsemte
~ofbrni--lh
- bum-in
Thin ~ -“on test
Pa.SCge induced soft error test procedure (due ID aipha parti.jes)
Er-dumrlce Ii6etest
Die penebanr rest (for Plastic devices)
MECHANICAL TESTS
CQn5tanl aaete@on
Mechanical Shdr
SOldemtmy
-m
VibdOrl fa@ue
Vibation noise
won, VariaM fmwenq
Vsrml and mechanical
Exlemal visual
Internal visual (mOrrOIHhic)
Bond sbwgth (desbuck “ bond pull test)
mm
Inb?mal visual inspe@m for DPA
Internal Vkual and mechanical
Iki5rarw=tosclwnfs
Physical dmeminm
Internal visual (hytlIid)
~~m====l=
(sEM) &pe@Orl of
mewzarim
C+eshearsbength
Pa!lideimnact lrOisede&tiOntest
iv
I
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I
MILSID-S63E
NOTICE 1
TES7 MEIHODS
,0
METHOO NO.
I
2021.3
2G22.2
2023.5
20242
2026.4
2026
20272
2028.4
2030
2031.1
2a3zl
2035
,.
●
Zm.1
3GQ21
3003.1
2004.1
2005.1
?026.1
2407.1
3W8.1
3m9.1
3010.1
3011.1
3012.1
3013.1
3014
2n15.7
3016
3017
=18
3019.i
3020
30X
3022
?423
3024
MECHANICAL 7E.STS
Gk5iv#cm layer integfily
Wetting balance scdderdbilily
NomlesOVctive bOfld pll[l
Lid torque for glass-frk-seakd packages
Adhesion of lead finish
Random Mbfion
Subcbate anach strength
Pin grid padcage destmctive lead PM ki
CerdMiCChip_rbORd 5bw@ll
Ultrasonic inspe@On of die **
F@ chip pulld tesl
Vi&pectiOn 0fpas5ivedements
UitRSOIIiC inspection of TAS bonds
ELECTRICAL TESTS (DIG~AL)
Drive source. dynamic
I-0a comlitiorls
Oelay measurements
Tmdtian time measwemenk
Pcmer supply an-rent
High level output voltage
Low level O@wt voltage
Breakdown voltage, input or output
Illpul ‘ament [w level
lnpul canent. high level
Output short circwit cunent
Terminal capatie
Noise margin meawmwds
for @ii mia—oekbm Ilk dl?wizs
Functional ting
~C~=-~
ActidOn time verikaIiOn
Micmekchmnics mdcace dkaital sbnal hmmksinn
Cm6Salk meawierrenk fcw-digi’la-mi
~C device fMdC3ge5
Ground and power supply impedance meawremenE for digti micmekclmnics device padGIges
High “PIP= (~) Icw-kvd output leakage an-rent
Wgh ‘bn@ance (oi%ate) hi@-W?l OUIPUIleakage OJt’mnt
Input damp Vonage
SiaclatclwQmeawaw& for dqital CMOs ndwe!ectmnic M-
Sii-U5 @tChing noise measurements for dii ~
.~
ELECTRICAL TESTS (LINEAR)
all ll-lpuiol%etvdclgeandnmentmdbiascullwd
4002.1
Phase margin and slew * meawemens
4C93.I
CanKtOn mode inpti voiiage range
CemmOn mode rejection do
SUPF4Yvuliage mjedion tio
@o.1.l
OP=*P=fO—
m.1 olitpti IxMwmance
4006.1 Pm#srgain andnoisefigure
4007
AmOmatkgain axttrt4range
REPRINIED WITHOUT CKANGE
v
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