Test Specification
for S32K3 CAN Driver
Rev. 1.0 — 31 March 2022
TS34CANASR4.4 Rev0000R2.0.0
NXP Semiconductors
Test Specification
for S32K3 CAN Driver
Revision Date Author Description
1.0 31/03/2022 NXP RTD Team Updated version for ASR 4.4.0
S32K3R2.0.0 Release
Revision History
RTD_CAN_TS All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
Rev. 1.0 — 31 March 2022
TS34CANASR4.4 Rev0000R2.0.0 2 / 458
NXP Semiconductors
Test Specification
for S32K3 CAN Driver
1 Introduction
This manual describes NXP Semiconductors AUTOSAR Controller Area Network ( CAN )
for S32K3 test cases.
AUTOSAR CAN driver configuration parameters and deviations from the specification are
described in CAN Driver chapter of this document. AUTOSAR CAN driver requirements
and APIs are described in the AUTOSAR CAN driver software specification document.
1.1 Overview
AUTOSAR (AUTomotive Open System ARchitecture) is an industry partnership
working to establish standards for software interfaces and software modules for
automobile electronic control systems.
AUTOSAR
• paves the way for innovative electronic systems that further improve performance,
safety and environmental friendliness.
• is a strong global partnership that creates one common standard: "Cooperate on
standards, compete on implementation".
• is a key enabling technology to manage the growing electrics/electronics complexity.
It aims to be prepared for the upcoming technologies and to improve cost-efficiency
without making any compromise with respect to quality.
• facilitates the exchange and update of software and hardware over the service life of
the vehicle.
1.2 About this Manual
This Technical Reference employs the following typographical conventions:
Boldface type: Bold is used for important terms, notes and warnings.
Italic font: Italic typeface is used for code snippets in the text. Note that C language
modifiers such "const" or "volatile" are sometimes omitted to improve readability of the
presented code.
Notes and warnings are shown as below:
Note: This is a note.
1.3 Acronyms and Definitions
Term Definition
API Application Programming Interface
AUTOSAR Automotive Open System Architecture
ASM Assembler
BSMI Basic Software Make file Interface
DEM Diagnostic Event Manager
DET Development Error Tracer
C/CPP C and C++ Source Code
VLE Variable Length Encoding
N/A Not Applicable
Table 1. Acronyms and Definitions
RTD_CAN_TS All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
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NXP Semiconductors
Test Specification
for S32K3 CAN Driver
Term Definition
MCU Micro Controller Unit
CAN Controller Area Network
PORT Port
Table 1. Acronyms and Definitions...continued
1.4 Reference List
# Title Version
1 AUTOSAR 4.4 Rev0000 CAN Driver
Software Specification Document.
V4.4.0
2 S32K3 Reference Manual Rev. 3, 10/2021
3 S32K344 Mask Set Errata for Mask (0P55A
/1P55A)
Rev. 30/Sep/2021
4 S32K312 Mask Set Errata for Mask
(0P09C)
Rev. 10/Jan/2022
5 S32K342 Mask Set Errata for Mask
(0P97C)
Rev. 13 Dec 2021
6 S32K3 Datasheet Rev. 3, 10/2021
Table 2. Reference List
2 Test Environment and Constraints
2.1 Test Environment
Software Item Name Description Version
EB tresos Studio EB Automotive config. &
generation tool
EB Tresos Studio 28.2.0
b211016-0103
S32 Design Studio NXP Code generation &
integrated development
environment
S32 Design Studio IDE v3.4
Update 3
GHS Multi GreenHills Multi Green Hills Multi 7.1.6d /
Compiler 2021.1.4
IAR IAR compiler IAR ANSI C/C++ Compiler
v.8.50.10 (safety version)
GCC GCC compiler NXP GCC 10.2.0 20200723
(Build 1728 Revision
g5963bc8)
Lauterbach Trace32 patch Patch for this release Lauterbach trace32_n_2022_
01_000143860
Cygwin UNIX emulator for Windows V1.7.29 (0.272/5/3)
Table 3. Software Items
Hardware Item Name Description
Lauterbach Trace32 debugger Lauterbach Trace32 debugger
X-S32K3XXX-MB PCB 47386 RevA SCH RevA Mother Board
S32K344 MINI-MODULE XS32K3XXCVB-Q257
PCB 47020 RevA1 SCH RevX2
Mini module
Table 4. Hardware/Firmware Items
RTD_CAN_TS All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
Rev. 1.0 — 31 March 2022
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NXP Semiconductors
Test Specification
for S32K3 CAN Driver
Hardware Item Name Description
S32K344 P32K344EHVMMS 1P55A
CTSB2128B (257MAPBGA)
Silicon
S32K312 MINI-MODULE XS32K3X2CVB-Q172
PCB 48307 RevX1 SCH RevA
Mini module
S32K312 P32K312NHVPBS 0P09C
CTZM2132B (172MAXQFP)
Silicon
S32K342 MINI-MODULE XS32K3X2CVB-Q172
PCB 48307 RevX1 SCH RevA
Mini module
S32K342 P32K342EHVPBE 0P97C
CTZM2139A (172MAXQFP)
Silicon
Table 4. Hardware/Firmware Items...continued
The hardware are showed in the picture below.
RTD_CAN_TS All information provided in this document is subject to legal disclaimers. © NXP B.V. 2022. All rights reserved.
Rev. 1.0 — 31 March 2022
TS34CANASR4.4 Rev0000R2.0.0 5 / 458