DEPARTMENT OF DEFENSE
TEST METHOD STANDARD
MICROCIRCUITS
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices
suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine
resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical
and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed
necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the
purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits,
microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only
to microelectronic devices. The test methods, controls, and procedures described herein have been prepared to serve
several purposes:
