Standard of Japan Electronics and Information Technology Industries Association
EIAJ ED
-
4701/001
Environmental and endurance test methods for
semiconductor devices
(General)
Established in August, 2001
Prepared by
Technical Standardization Committee on Semiconductor Devices
Published by
Japan Electronics and Information Technology Industries Association
11, Kanda Surugadai 3-chome, Chiyoda-ku, Tokyo 101-0062, Japan
Printed in Japan
Translation without guarantee in the event of any doubt arising, the original standard in Japanese is
to be evidence.
JEITA standards are established independently to any existing patents on the products, materials or
processes they cover.
JEITA assumes absolutely no responsibility toward parties applying these standards or toward patent owners.
2001 by the Japan Electronics and Information Technology Industries Association
All rights reserved. No part of this standards may be reproduced in any form or by any means
without prior permission in writing from the publisher.
EIAJ ED-4701/001
CONTENTS
Page
1. SCOPE OF APPLICATION................................................................................................................ 1
2. DEFINITION OF TERMS.................................................................................................................. 1
3. SPECIFICATION IN GENERAL CONDITION................................................................................. 3
4. PRECAUTIONS................................................................................................................................. 7
5. TEST METHODS............................................................................................................................... 9
COMMENTS ......................................................................................................................................... 11
EIAJ ED-4701/001
Standard of Japan Electronics and Information Technology Industries Association
Environmental and endurance test methods for semiconductor devices
(General)
1. SCOPE OF APPLICATION
These standards provide for environmental test methods and endurance test methods aimed at
evaluating the resistance and the endurance of discrete semiconductor devices and integrated circuits
(hereinafter generically called semiconductor devices) used in electronic equipment mainly for
general industrial applications and consumer applications, under the various environmental conditions
of various kinds that occur during their use, storage and transportation.
2. DEFINITION OF TERMS
The definition of the technical terms used in these standards and in the relevant specifications are
given in the followings.
(1) Specimen:
The semiconductor devices provided for the tests.
(2) Surface mounting semiconductor devices:
The semiconductor devices that are made with the object of being mounted on printed circuit
boards by means of the surface mounting method. Hereinafter called SMD (Surface Mounting
Devices).
(3) Equipment:
The equipment used to test the specimens.
(4) Materials:
The materials used to test the specimens.
(5) Steps of procedure:
The sequence according to which the various kinds of treatments, measurements, conditionings,
inspections, etc., required for the sake of testing the specimens are carried out.
(6) Preliminary treatment:
The treatment which the specimens are submitted to before carrying out the initial measurements
and tests.
(7) Humidity absorption:
The pre-treatment, equivalent to the humidity absorption which occurs during the storage period
until the actual mounting by soldering, which the specimens are submitted to before the
soldering process.
(8) Soldering heat:
The heating treatment, equivalent to the actual mounting by soldering, which the specimens are
submitted to.
(9) Initial measurements:
The visual inspection and the electrical and optical measurements which the specimens are
submitted to in the first place before carrying out the tests.
