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cortex M3 入门资料
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Copyright © 2004-2006 ARM Limited. All rights reserved.
ARM DDI 0314C3
This is an extract from an unreleased version of the
CoreSight
™
Design Kit
Revision: r1p0
Technical Reference Manual
Beta
ii Copyright © 2004-2006 ARM Limited. All rights reserved. ARM DDI 0314C3
Beta
CoreSight Design Kit
Technical Reference Manual
Copyright © 2004-2006 ARM Limited. All rights reserved.
Release Information
Proprietary Notice
Words and logos marked with
®
or
™
are registered trademarks or trademarks owned by ARM Limited. Other
brands and names mentioned herein may be the trademarks of their respective owners.
Neither the whole nor any part of the information contained in, or the product described in, this document
may be adapted or reproduced in any material form except with the prior written permission of the copyright
holder.
The product described in this document is subject to continuous developments and improvements. All
particulars of the product and its use contained in this document are given by ARM in good faith. However,
all warranties implied or expressed, including but not limited to implied warranties of merchantability, or
fitness for purpose, are excluded.
This document is intended only to assist the reader in the use of the product. ARM Limited shall not be liable
for any loss or damage arising from the use of any information in this document, or any error or omission in
such information, or any incorrect use of the product.
Confidentiality Status
This document is Non-Confidential. The right to use, copy and disclose this document may be subject to
license restrictions in accordance with the terms of the agreement entered into by ARM and the party that
ARM delivered this document to.
Product Status
The information in this document is for a Beta product, that is a product under development.
Web Address
http://www.arm.com
Change history
Date Issue Confidentiality Change
29 September 2004 A Non-confidential First release for r0p0.
24 March 2005 B Non-confidential Updated for r0p1. Programmer’s model revised.
28 February 2006 C1b Confidential Updated for r1p0 (Alpha). Serial Wire information added to Chapter 3. Chapter 11
(SWV), Chapter 12 (SWO), Chapter 13 (ITM), and Appendix C (SWD and JTAG
Trace Connector) added.
20 March 2006 C2 Non-Confidential This is an extract from an unreleased version of the CoreSight Design Kit Technical
Reference Manual, and will be superseded on release of the full document.
10 April 2006 C3 Non-Confidential Values changed in SWD and JTAG select mecahnism.
Debug Access Port
1-2 Copyright © 2004-2006 ARM Limited. All rights reserved. ARM DDI 0314C3
Beta
1.1 SWJ-DP
SWJ-DP is a combined JTAG-DP and SW-DP that enables either a Serial Wire Debug
(SWD) or JTAG probe to be connected to a target. It is the standard CoreSight debug
port, and enables access either the JTAG-DP or SW-DP blocks. To make efficient use
of package pins, serial wire shares, or overlays, the JTAG pins, using an autodetect
mechanism that switches between JTAG-DP and SW-DP, depending on which probe is
connected. A special sequence on the TMS pin is used to switch between JTAG-DP and
SW-DP. The SWJ-DP behaves like a pure JTAG target if normal JTAG sequences are
sent to it.
Figure 1-1 shows the external connections to the SWJ-DP.
Figure 1-1 SWJ-DP external connections
The SWJ-DP is described in more detail in:
• Structure on page 1-3
• Operation on page 1-3
• JTAG and SWD interface on page 1-4
• Clock and reset control interface on page 1-4
• SWD and JTAG select mechanism on page 1-4.
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ARM DDI 0314C3 Copyright © 2004-2006 ARM Limited. All rights reserved. 1-3
Beta
1.1.1 Structure
The SWJ-DP consists of a wrapper around the JTAG-DP and SW-DP. Its function is to
select JTAG or SWD as the connection mechanism and enable either JTAG-DP or
SW-DP as the interface to the DAP.
1.1.2 Operation
SWJ-DP enables an Application Specific Integrated Circuit (ASIC) to be designed
which can be used in systems that require either a JTAG interface or a SWD interface.
There is a trade-off between the number of pins used and compatibility with existing
hardware and test equipment. There are several scenarios where the use of a JTAG
debug interface must be maintained:
• to enable inclusion in an existing scan chain, generally on-chip TAPs used for test
or other purposes.
• to enable the device to be cascaded with legacy devices which use JTAG for debug
• to enable use of existing debug hardware with the corresponding test TAPs, for
example, in Automatic Test Equipment (ATE).
An ASIC fitted with SWJ-DP support can be connected to legacy JTAG equipment
without any requirement to make changes. If a SWD tool is available, only two pins are
required, instead of the usual four used for JTAG. Two pins are therefore released for
alternative use.
These two pins can only be used when there is no conflict with their use in JTAG mode.
In addition, to support use of SWJ-DP in a scan chain with other JTAG devices, the
default state after reset must be to use these pins for their JTAG function. If the direction
of the alternative function is compatible with being driven by a JTAG debug device, the
transition to a shift state can be used to transition from the alternative function to JTAG
mode.
The alternate function cannot be used while the ASIC is being used in JTAG debug
mode.
The switching scheme is arranged so that, provided there is no conflict on the TDI and
TDO pins, a JTAG debugger is able to connect by sending a specific sequence.
The connection sequence used for SWD is safe when applied to the JTAG interface,
even if hot-plugged, enabling the debugger to continually retry its access sequence. A
sequence with
TMS=1
ensures that JTAG-DP, SW-DP, and the watcher circuit are in a
known reset state. The pattern used to select SWD has no effect on JTAG targets.
SWJ-DP is compatible with a free-running TCK, or a gated clock which is supplied by
the external tools.
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