High-contrast imaging for weakly diffracting specimens in cohere...

Coherent diffraction imaging (CDI) and ptychography techniques bypass the difficulty of having highquality optics in X-ray microscopy by using a numerical reconstruction of the image that is obtained by inverting the diffracted intensity recorded by a charge-coupled device array. However, the reconstruction of the image from the intensity data obtained from a weakly diffracting specimen is known to be difficult because of the obvious reduction in signal-to-noise ratio (SNR). In this case, the sp