A91237-LaTeX创新奖1
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2022-08-03
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Team # 91237
Team Number : APMCM91237
Problem Chosen : A
2019 APMCM summary sheet
Melting Representation Model of Silicon Dioxide Analyzed Based on Image
The melting temperature of silicon dioxide is very high and the service life of
conventional testing equipment in the environment is very short.If we can figure
out the rate of melting from the picture, we can indirectly improved the direct
fiber forming technology of blast furnace slag. This paper based on SFS model
and Edge Detection makes a quantitative analysis of the actual melting rate of
silicon dioxide.And we has achieved the desired result.
For the Question1, First we convert the original image into a grayscale im-
age, and then we set up a loop that includes deepening the edges of the image
through the Adjustment of image pixel value. Next we extract the image edges
by Laplace transform. After that we added the inverse image of the grayscale
image to the image edges to generate an image with obvious edges. When get-
ting an image with obvious edges, we stop the loop. Besides we binarize the
image and remove the noise with pixel values less than a certain value to obtain a
complete silica image. Finally, we calculate the position of the centroid and draw
a trajectory image.
For the Question 2,based on the model established by the first question.We
analyzed the data for question 1 respectively calculated the relationship between
the cross-sectional area of silicon dioxide and time in the first 101 images.At the
same time we also calculate the relationship between the perimeter of silicon
dioxide melt and time.But we don’t think the perimeter is representative.
For the Question3, according to the physical data in question 1 and question
2, we got 2D data. If we want to build a 3D data model, we need to find the
height value of each pixel in the plane coordinate system, so as to draw the 3D
model. SFS is an algorithm to calculate the height value. By constructing the
relationship between the light source and the image, three important parameters
are calculated inclination φ, deflection θ and the derivative of the image gray
level. We can use these three parameters to calculate the predicted height value,
and then plot the calculation, we get the final result.
Keywords:Silicon dioxide;Edge detection;Convolution; Laplace; centroid; SFS
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