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STIL标准测试接口语言IEEE STD 1450-1999
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STIL标准测试接口语言IEEE STD 1450-1999
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The Institute of Electrical and Electronics Engineers, Inc.
3 Park Avenue, New York, NY 10016-5997, USA
Copyright © 1999 by the Institute of Electrical and Electronics Engineers, Inc.
All rights reserved. Published 1 September 1999. Printed in the United States of America.
Print:
ISBN 0-7381-1646-7 SH94734
PDF:
ISBN 0-7381-1647-5 SS94734
No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior
written permission of the publisher.
IEEE Std 1450-1999
IEEE Standard Test Interface
Language (STIL) for Digital Test
Vector Data
Sponsor
Test Technology Standards Committee
of the
IEEE Computer Society
Approved 18 March 1999
IEEE-SA Standards Board
Abstract:
Standard Test Interface Language (STIL) provides an interface between digital test gen-
eration tools and test equipment. A test description language is defined that: (a) facilitates the trans-
fer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and
timing information sufficient to define the application of digital test vectors to a DUT; and (c) sup-
ports the volume of test vector data generated from structured tests.
Keywords:
automatic test pattern generator (ATPG), built-in self-test (BIST), computer-aided en-
gineering (CAE), cyclize, device under test (DUT), digital test vectors, event, functional vectors, pat-
tern, scan vectors, signal, structural vectors, timed event, waveform, waveshape
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Copyright © 1999 IEEE. All rights reserved.
iii
Introduction
(This introduction is not part of IEEE Std 1450-1999, IEEE Standard Test Interface Language (STIL) for Digital Test
Vector Data.)
Standard Test Interface Language (STIL) was initially developed by an ad-hoc consortium of test equipment
vendors, computer-aided engineering (CAE) and computer-aided design (CAD) vendors, and integrated cir-
cuit (IC) manufacturers, to address the lack of a common solution for transferring digital test data from the
generation environment to the test equipment.
The need for a common interchange format for large volumes of digital test data was identified as an overrid-
ing priority for the work; as such, the scope of the work was constrained to those aspects of the test environ-
ment that contribute significantly to the volume issue, or are necessary to support the comprehension of that
data. Binary representations of data were a key consideration in these efforts, resulting in a proposal to incor-
porate the compression of files as part of this standard.
Limiting the scope of any standards project is a difficult thing to do, especially for a room full of engineers.
However, issues that did not impact the scope as identified were dropped from consideration in this version
of the standard. Subclause 1.1 covers, specifically, the capabilities that are not intended to be part of this first
standard.
Early work in this consortium consisted of identifying the requirements necessary to address this problem
and reviewing existing options and languages in the industry. All options proposed fell short of addressing
the requirements, and the consortium started to define a new language. This work was executed with heavy
leverage from some existing languages and environments, and STIL owes much to the groundwork estab-
lished by these other languages.
Participants
When the STIL Working Group approved this standard, it had the following membership:
Greg Maston,
Co-chair
Tony Taylor,
Co-chair
The technical subgroup consisted of the following members:
Other working group members were as follows:
Dave Dowding
Brady Harvey
Brad Hinckle
Larry Moran
Gary Murray
Chris Nelson
Don Organ
Mike Purtell
Jim Ward
Gregg Wilder
Srinivas Ajjarapu
Phil Barch
Ajit Bhave
Fred Berneche
Joe Carbone
Don Denburg
Givargis A. Danialy
Tom Munns
Eric Parker
Frank Peyton
Gary Raines
Tim Wagner
Tom Williams
Peter Wohl
Stefan Zschiegner
iv
Copyright © 1999 IEEE. All rights reserved.
The following members of the balloting committee voted on this standard:
The Working Group thanks those companies that contributed concepts and ideas to this effort, in addition to
people and time. These contributions helped to define the language presented in this standard. In particular,
the Working Group would like to thank: LTX Corporation, for providing information about the enVision
environment; Motorola, Incorporated, for providing information about the Universal Test Interface Code
(UTIC); Test Systems Strategies, Incorporated, for providing information about the Waveform Generation
Language (WGL); and Texas Instruments, Incorporated, for providing information about the Test Descrip-
tion Language (TDL).
When the IEEE-SA Standards Board approved this standard on 18 March 1999, it had the following
membership:
Richard J. Holleman,
Chair
Donald N. Heirman,
Vice Chair
Judith Gorman,
Secretary
**Member Emeritus
Also included is the following nonvoting IEEE-SA Standards Board liaison:
Robert E. Hebner
Janet Rutigliano
IEEE Standards Project Editor
Phil Barch
Kenneth M. Butler
Joe Carbone
Donald Denburg
Dave Dowding
Grady Giles
Gary Ginn
Gary Hancock
Brady Harvey
Mitsuaki Ishikawa
Brion Keller
Fadi Maamari
Gregory A. Maston
Colin Maunder
Larry L. Moran
Tom Munns
Wayne Needham
Chris Nelson
Jim O’Reilly
Frank Peyton
Mike Purtell
Hira Ranga
Gordon Robinson
John W. Sheppard
William R. Simpson
Tony Taylor
Jon Udell
Jim Ward
Gregg Wilder
Peter Wohl
Stefan Zschiegner
Satish K. Aggarwal
Dennis Bodson
Mark D. Bowman
James T. Carlo
Gary R. Engmann
Harold E. Epstein
Jay Forster*
Ruben D. Garzon
James H. Gurney
Lowell G. Johnson
Robert J. Kennelly
E. G. “Al” Kiener
Joseph L. Koepfinger*
L. Bruce McClung
Daleep C. Mohla
Robert F. Munzner
Louis-François Pau
Ronald C. Petersen
Gerald H. Peterson
John B. Posey
Gary S. Robinson
Akio Tojo
Hans E. Weinrich
Donald W. Zipse
Copyright © 1999 IEEE. All rights reserved.
v
Contents
1. Overview.............................................................................................................................................. 1
1.1 Scope............................................................................................................................................ 3
1.2 Purpose......................................................................................................................................... 4
2. References............................................................................................................................................ 4
3. Definitions, acronyms, and abbreviations............................................................................................ 4
3.1 Definitions.................................................................................................................................... 4
3.2 Acronyms and abbreviations........................................................................................................ 7
4. Structure of this standard ..................................................................................................................... 7
5. STIL orientation and capabilities tutorial (informative)......................................................................8
5.1 Hello Tester.................................................................................................................................. 8
5.2 Basic LS245............................................................................................................................... 13
5.3 STIL timing expressions/”Spec” information............................................................................ 17
5.4 Structural test (scan) .................................................................................................................. 22
5.5 Advanced scan ........................................................................................................................... 26
5.6 IEEE Std 1149.1-1990 scan....................................................................................................... 32
5.7 Multiple data elements per test cycle......................................................................................... 37
5.8 Pattern reuse/direct access test................................................................................................... 41
5.9 Event data/non-cyclized STIL information ............................................................................... 45
6. STIL syntax description..................................................................................................................... 55
6.1 Case sensitivity .......................................................................................................................... 55
6.2 Whitespace................................................................................................................................. 55
6.3 Reserved words.......................................................................................................................... 55
6.4 Reserved characters ................................................................................................................... 57
6.5 Comments .................................................................................................................................. 58
6.6 Token length .............................................................................................................................. 58
6.7 Character strings ........................................................................................................................ 58
6.8 User-defined name characteristics............................................................................................. 59
6.9 Domain names ........................................................................................................................... 59
6.10 Signal and group name characteristics.......................................................................................60
6.11 Timing name constructs............................................................................................................. 60
6.12 Number characteristics............................................................................................................... 60
6.13 Timing expressions and units (time_expr)................................................................................. 61
6.14 Signal expressions (sigref_expr)................................................................................................ 63
6.15 WaveformChar characteristics................................................................................................... 64
6.16 STIL name spaces and name resolution..................................................................................... 65
7. Statement structure and organization of STIL information............................................................... 67
7.1 Top-level statements and required ordering .............................................................................. 68
7.2 Optional top-level statements .................................................................................................... 70
7.3 STIL files ................................................................................................................................... 70
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