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ISO 7637-3:2016(E).pdf
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ISO 7637-3:2016(E).pdf
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©
ISO 2016
Road vehicles — Electrical
disturbances from conduction and
coupling —
Part 3:
Electrical transient transmission by
capacitive and inductive coupling via
lines other than supply lines
Véhicules routiers — Perturbations électriques par conduction et par
couplage —
Partie 3: Transmission des perturbations électriques par couplage
capacitif ou inductif le long des lignes autres que les lignes
d’alimentation
INTERNATIONAL
STANDARD
ISO
7637-3
Third edition
2016-07-01
Reference number
ISO 7637-3:2016(E)
Copyright International Organization for Standardization
Provided by IHS under license with ISO
No reproduction or networking permitted without license from IHS
--`,`,`,`````,,`,`,,,,,,,,,``,,`-`-`,,`,,`,`,,`---
ISO 7637-3:2016(E)
ii © ISO 2016 – All rights reserved
COPYRIGHT PROTECTED DOCUMENT
© ISO 2016, Published in Switzerland
the requester.
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
www.iso.org
Copyright International Organization for Standardization
Provided by IHS under license with ISO
No reproduction or networking permitted without license from IHS
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ISO 7637-3:2016(E)
Foreword ........................................................................................................................................................................................................................................iv
Introduction
..................................................................................................................................................................................................................................v
1 Scope ................................................................................................................................................................................................................................. 1
2 Normative references ...................................................................................................................................................................................... 1
..................................................................................................................................................................................... 1
4 Test methods ............................................................................................................................................................................................................. 2
4.1 General ........................................................................................................................................................................................................... 2
4.2 Standard test conditions ................................................................................................................................................................. 3
4.3 Ground plane ............................................................................................................................................................................................ 3
4.4 General test setup conditions ..................................................................................................................................................... 3
4.5 CCC method ................................................................................................................................................................................................ 3
4.5.1 General...................................................................................................................................................................................... 3
................................................................................................................................................. 3
4.5.3 Transient pulses level adjustment .................................................................................................................... 4
4.5.4 DUT test ................................................................................................................................................................................... 4
4.6 DCC method ............................................................................................................................................................................................... 5
4.6.1 General...................................................................................................................................................................................... 5
................................................................................................................................................. 6
4.6.3 Transient pulses level adjustment .................................................................................................................... 6
4.6.4 DUT test ................................................................................................................................................................................... 7
4.7 ICC method .............................................................................................................................................................................................. 11
4.7.1 General................................................................................................................................................................................... 11
.............................................................................................................................................. 11
4.7.3 Transient pulses level adjustment .................................................................................................................11
4.7.4 DUT test ................................................................................................................................................................................ 12
.................................................................................................................. 14
......................................................................................................................................................................................... 14
5.2 Oscilloscope ............................................................................................................................................................................................ 15
5.3 Transient pulses generator ....................................................................................................................................................... 15
5.3.1 General................................................................................................................................................................................... 15
5.3.2 Slow transient pulses test 2a .............................................................................................................................. 15
5.3.3 Fast transient pulses 3a and 3b test ............................................................................................................. 16
............................................................................................................................................................................................... 18
...............................................................................................................................................................................................20
.................................................................................................................................................................................................20
Annex A (normative) ........................................................................21
Annex B (informative) Example of test severity levels associated with functional
...................................................................................................................................................22
Annex C (informative) Estimation of the inductive coupling factor ..................................................................................24
© ISO 2016 – All rights reserved iii
Contents Page
Copyright International Organization for Standardization
Provided by IHS under license with ISO
No reproduction or networking permitted without license from IHS
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ISO 7637-3:2016(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
on the ISO list of patent declarations received (see www.iso.org/patents).
constitute an endorsement.
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical
Barriers to Trade (TBT) see the following URL: .
The committee responsible for this document is ISO/TC 22, Road vehicles, Subcommittee SC 32, Electrical
and electronic components and general system aspects.
This third edition cancels and replaces the second edition (ISO 7637–3:2007), which has been
ISO 7637 consists of the following parts, under the general title Road vehicles — Electrical disturbances
from conduction and coupling:
—
— Part 2: Electrical transient conduction along supply lines only
— Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than
supply lines
The following parts are under preparation:
— Part 4: Electrical transient conduction along shielded high voltage supply lines only
—
to ISO 7637‑2 [Technical Report]
Annex A forms an integral part of this part of ISO 7637.
Annex B and Annex C are informative.
iv © ISO 2016 – All rights reserved
Copyright International Organization for Standardization
Provided by IHS under license with ISO
No reproduction or networking permitted without license from IHS
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ISO 7637-3:2016(E)
Introduction
The fast transient pulse test uses bursts composed of a number of fast transient pulses, which are
coupled into lines (I/O lines in particular) of electronic equipment. The fast rise time, the repetition
The slow transient pulse test applies a number of single pulses, as used for conducted transient pulse
test, to the DUT.
© ISO 2016 – All rights reserved v
Copyright International Organization for Standardization
Provided by IHS under license with ISO
No reproduction or networking permitted without license from IHS
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