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STD-JIS

5321-ENGL

1777

4733bûô

05~7902

4T2

JIS

JAPANESE

STR

STANDARD

Translated and

Published

Japanese Standards Association

Methods of test for

high

frequency

inductors and intermediate frequency

transformers for electronic equipment

ICs

29.180

Descriptors

electronic equipment and components, communication equipment, electrical

components,

high

frequencies, inductors, intermediate frequencies,

transformers, testing

Reference number

JIS

5321

1997

(E)

5321

1997

Foreword

This translation has been made based on the original Japanese Industrial

%andard revised by the Minister

International Trade and Industry through

deliberations at Japanese Industrial Standards Committee in accordance with

the Industrial Standardization Law. Consequently, JIS C

5321

1990

has

been revised and replaced with this Standard.

In this revision, addition and modification of provisions are carried out for the

purpose of enlarging the application of this Standard to chips inductors, choke

coils, etc.

Attention

drawn to the possibility that some parts of this Standard may

conflict with

patent right, application for

patent after opening to the

public, utility model right or application for registration of utility model after

opening to the public which have technical properties. The relevant Minister

and the Japanese Industrial Standards Committee are not responsible for

identifying the patent right, application for

patent after opening to the

public, utility model right (including the application

for

registration of utility

model after opening to the public applied before December

31,1993)

application

for registration of utility model after opening

the public which have the said

technical properties.

Date of Establishment:

1973-08-01

Date of Revision:

1997-10-20

Date of Public Notice in Official Gazette:

1997-10-20

Investigated by: Japanese Industrial Standards Committee

Divisional Council on Electronics

JIS

5321

1997,

First English edition published in

1998-04

Translated and published by: Japanese Standards Association

4-1-24,

Akasaka, Minato-ku, Tokyo,

107-8440

JAPAN

In the event

any doubts arising as to the contents,

the original JIS is to be the final authority.

JCA

1998

this publication may be reproduced

utilized in any form

by any means, electronic

mechanical, including photocopying and microfilm,

without permission in writing

from

the publisher.

Printed in Japan

STD-JIS

5321-ENGL

1997

4733b08

OSLI7704

275

4.1

4.2

4.3

5.1

5.2

5.3

6.1

6.2

6.3

6.4

6.5

6.6

6.7

6.8

6.9

6.10

6.11

6.12

6.13

6.14

6.15

6.16

6.17

5321

1997

Contents

Page

Scope

.....................................................................................................................

Normative references

.........................................................................................

Definitions

...........................................................................................................

Test conditions

....................................................................................................

Standard conditions

.........................................................................................

Reference conditions

........................................................................................

Referee conditions

............................................................................................

Tests for appearance. marking and dimensions

...........................................

Marking

..............................................................................................................

Dimensions

........................................................................................................

Appear ance

........................................................................................................

Electrical performance test

..............................................................................

Common precautions for carrying out tests

................................................

Inductance

..........................................................................................................

..........................................................................................................................

Resonance frequency

........................................................................................

Distributed capacitance

...................................................................................

Coupling coefficient

..........................................................................................

Voltage ratio

......................................................................................................

Dielectric withstand voltage (voltage proof)

................................................

Insulation resistance

........................................................................................

Bandwidth

...........................................................................................................

Insertion loss

......................................................................................................

Spurious characteristic

.....................................................................................

Large-input characteristic

...............................................................................

Characteristic test of coil for FM detection

..................................................

Magnetic field characteristic

...........................................................................

D.C. resistance

...................................................................................................

D.C. superposition characteristics

..................................................................

STD0JT.S

5321-ENGL

1777

4733b08

0549905

101

5321

1997

7.1

7.2

7.3

7.4

7.5

7.6

7.7

7.8

7.9

7.10

7.11

7.12

8.1

8.2

8.3

8.4

8.5

8.6

Mechanical performance test

...........................................................................

mounting coils)

..................................................................................................

Vibration

............................................................................................................

Resistance

soldering heat

...........................................................................

Solderability (applicable

coils other than surface of mounting coils)

Rotating torque

.................................................................................................

Resistance

shock

..........................................................................................

Strength of adjusting mechanism

..................................................................

mounting

coils)

..................................................................................................

Robustness of body (applicable

surface mounting coils)

......................

Resistance

soldering heat (applicable

surface mounting coils)

......

Solderability (applicable

surface mounting coils)

..................................

mounting coils)

..................................................................................................

Robustness of termination (applicable

coils

other than surface

Robustness of termination (electrode) (applicable

surface

Resistance

soldering loss of electrode (applicable

surface

Climatic tests

......................................................................................................

Cold

.....................................................................................................................

Dry heat

.............................................................................................................

Change of temperature

....................................................................................

Temperature characteristics

...........................................................................

Damp heat (steady state)

................................................................................

Resistance

electrolytic corrosion

...............................................................

Annex (normative) Mounting

surface mounting coil

testing

printed-circuit board

...............................................................

STDmJIS

5321-ENGL

1997

4433b08

054990b

048

JAPANESE INDUSTRIAL STANDARD

JIS

5321

1997

Methods

test

for

high frequency inductors and

intermediate frequency transformers

for electronic equipment

Introduction

This

the Japanese Industrial Standard prepared by adding the

provisions

JIS

5321

published in 1990 because its test methods become insuf-

ficient for present situation and by reviewing the previous provisions.

Scope

This Japanese Industrial Standard specifies methods of test for high fre-

quency coils and intermediate frequency transformers (hereafter referred

as “coils”

in this Standard generically) which are mainly used in electronic equipment. If there

is any discrepancy between this Standard and the detail specifications, the provi-

sion of the detail specifications shall take precedence.

Normative references

The following standards contain provisions which, through

reference

this Standard, constitute provisions

this

Standard.

the normative

references the standard appended with the year

issue means such that the edi-

tion

the stated year only constitutes provisions of this Standard, and the revised

edition and amendment thereafter are out

such constitution. For the normative

references

not

appended

with

the year

issue, the most recent editions

the stan-

dards shall be applied (including

the

amendments).

JIS

7502-1994

JIS

7507-1993

JIS

0010-1993

JIS

0020-1995

JIS

0021-1995

JIS

0022-1987

JIS

0025-1988

JIS

0040-1995

JIS

0041-1995

JIS

0050-1985

JIS

0051-1994

JIS

1303-1972

Micrometer callipers

Vernier, dial and digital callipers

Environmental testing. Part

General and guidance

Environmental testing procedures Part

Tests, Tests

Cold