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MIL-SI!D-1235C
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1.
1.1
1 .1.1
2.
3.
3.1
3.2
3.3
3.4
I
3.5
3.6
3.7
3.8
3.9
3.10
3.11
;.;;
3:14
3.15
3.16
3.17
3.18
3.19
3.20
3.21
3.22
;.;;
3:25
3.26
3.27
3.28
3..3
;.?
3:32
3.33
3.34
3.35
3.36
4.
HI
4.1.2
4.2
~
SCOPE
.............................................
1
Purpoee
......................................... 1
Applicabili~
................................... 1
HEFERENtmDcKmmE3
..............................
1
DEFTTITIONS.......................................
1
Acceptable@s.liW Level(AIL).................. 1
Avere@Raction Inspected (AFT) . . . . . . . . . . . . . . . . 1
AveregeOutgoiMQueli~ (ACE).................. 2
Ave~ Out@ing QualityI&nit(AOQL)........... 2
CheckingInspection............................. 2
ClearanceNumber
................................
2
conformingunit
.................................
2
ContinuousSamplingInspection.................. 2
Cri_cicelDefect................................. 2
CriticalDefective......................’........
2
Defect
..........................................
2
Defecte Concerned . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Defective.......................................
2
PMnctionelCurve
................................
Inspection......................................
“$
Inspection~Attributee........................ 3
Inspectionby DefectC1.aee
.......................
3
InapectionbgIndividualDefect................. 3
MajorDefect..,................................. 3
MajorDefective................................. 3
Minort!efect.................................... 3
MinorDefective.................................’3
MovingProduct.........................
Multi-Level............................
N......................................
OperatingChuacteristic.9(OC)........o
OneHundredPercentInspection.........
ProceaeAve~ ........................
ProductionInterval....................
. . . . . . . .
. . . . . . . .
;
. . . . . . . .
3
........
3
........
3
........
4
........
4
24m@ngFrequency (f)
...........................
4
Sewilinukrcection............................. 4
semilir@Pi&l.,................................. 4
Screeni~.......................................
4
Singl*Iavel
....................................
4
TargetA02L................................
......
4
Unitof product................................. 4
G~ RllJDIFWENTS
..............................
4
Cleeeificationof Defectsand DefectiveS........ 4
Methodof Cleeei&ingIRfecte................. !5
Methodof Cleesifyi~Defective.............. 5
AcceptableQualityLevel(AQL) ................
5
iv
l\
1.
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