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MIL-STD-883-4.056327.pdf
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MIL-STD-883-4.056327.pdf
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MIL-STD-883-4
16 September 2019
SUPERSEDING
MIL-STD-883K
w/CHANGE 3
3 May 2018
DEPARTMENT OF DEFENSE
TEST METHOD STANDARD
ELECTRICAL TESTS (LINEAR) FOR MICROCIRCUITS
PART 4: TEST METHODS 4000-4999
AMSC N/A FSC 5962
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.
This document and process conversion
measures necessary to comply with this
change shall be completed by 16 March
2020.
INCH - POUND
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MIL-STD-883-4
ii
FOREWORD
FOREWORD
1. This standard is approved for use by all Departments and Agencies of the Department of Defense.
2. This entire standard has been revised. This revision has resulted in many changes to the format, but the most
significant one is the splitting the document into parts. See MIL–STD–883 for the change summary.
3. Comment, suggestions, or questions on this document should be addressed to: Commander, Defense Logistics
Agency, ATTN: DLA Land and Maritime - VA, P.O. Box 3990, Columbus, OH 43218-3990, or by email to
[email protected]. Since contact information can change, you may want to verify the currency of this address
information using the ASSIST Online database at: https://assist.dla.mil.
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MIL-STD-883-4
iii
CONTENTS
PARAGRAPH Page
1. SCOPE ............................................................................................................................... 1
1.1 Purpose ............................................................................................................................ 1
1.2 Numbering system ........................................................................................................... 1
2. APPLICABLE DOCUMENTS ............................................................................................. 1
2.1 General ............................................................................................................................. 1
2.2 Government documents ................................................................................................... 1
2.3 Non-Government publications .......................................................................................... 3
2.4 Order of precedence ........................................................................................................ 5
3. DEFINITIONS ..................................................................................................................... 5
3.1 Abbreviations, symbols, and definitions............................................................................ 5
4. GENERAL REQUIREMENTS ............................................................................................ 8
4.1 General ............................................................................................................................. 8
4.2 Test circuits ...................................................................................................................... 8
4.3 Laboratory suitability ........................................................................................................ 8
4.4 Method of reference ......................................................................................................... 8
5. DETAIL REQUIREMENTS ................................................................................................. 8
6. NOTES ............................................................................................................................... 8
6.1 Intended use ..................................................................................................................... 8
6.2 International standardization agreement .......................................................................... 8
6.3 Subject term (key word) listing ......................................................................................... 8
6.4 Supersession data ............................................................................................................ 8
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MIL-STD-883-4
iv
ELECTRICAL TESTS (LINEAR)
Method 4001.1 Input offset voltage and current and bias current
Method 4002.1 Phase margin and slew rate measurements
Method 4003.2 Common mode input voltage range
Common mode rejection ratio
Supply voltage rejection ratio
Method 4004.2 Open loop performance
Method 4005.1 Output performance
Method 4006.2 Power gain and noise figure
Method 4007 Automatic gain control range
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MIL-STD-883-4
1
1. SCOPE
1.1 Purpose. Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital)
to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For
the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid
microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is
intended to apply only to microelectronic devices.
1.2 Numbering system. The test methods are designated by numbers assigned in accordance with the following
system:
1.2.1 Classification of tests. The electrical test methods included in this part of a multipart test method standard
are numbered 4001 to 4007 inclusive.
1.2.2 Test method revisions. Revisions are numbered consecutively using a period to separate the test method
number and the revision number. For example, 4001.2 designates the second revision of test method 4001.
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, and 5 of this standard. This
section does not include documents cited in other sections of this standard or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements documents cited in sections 3, 4, and 5 of this
standard, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-680 - Degreasing Solvent, Performance Specification For.
MIL-PRF-19500 - Semiconductor Devices, General Specification For.
MIL-PRF-38534 - Hybrid Microcircuits, General Specification For.
MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification For.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-202 - Electronic and Electrical Component Parts.
MIL-STD-750 - Test Methods for Semiconductor Devices.
MIL-STD-1686 - Electrostatic Discharge Control Program for Protection of Electrical and Electronic
Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive
Devices).
MIL-STD-1835 - Electronic Component Case Outlines.
MIL-STD-1916 - DOD Preferred Methods for Acceptance of Product.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-217 - Reliability Prediction of Electronic Equipment.
MIL-HDBK-505 - Definitions of Item Levels, Item Exchangeability, Models, and Related Terms.
MIL-HDBK-781 - Reliability Test Methods, Plans, and Environments for Engineering, Development
Qualification, and Production .
MIL-HDBK-1331 - Parameters to be Controlled for the Specification of Microcircuits.
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