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MIL-STD-883-3.056326.pdf
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MIL-STD-883-3.056326.pdf
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MIL-STD-883-3
16 September 2019
SUPERSEDING
MIL-STD-883K
w/CHANGE 3
3 May 2018
DEPARTMENT OF DEFENSE
TEST METHOD STANDARD
ELECTRICAL TESTS (DIGITAL) FOR MICROCIRCUITS
PART 3: TEST METHODS 3000-3999
AMSC N/A FSC 5962
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.
This document and process conversion
measures necessary to comply with
this change shall be completed by 16
March 2020.
INCH - POUND
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MIL-STD-883-3
ii
FOREWORD
1. This standard is approved for use by all Departments and Agencies of the Department of Defense.
2. This entire standard has been revised. This revision has resulted in many changes to the format, but the most
significant one is the splitting the document into parts. See MIL–STD–883 for the change summary.
3. Comment, suggestions, or questions on this document should be addressed to: Commander, Defense Logistics
Agency, ATTN: DLA Land and Maritime - VA, P.O. Box 3990, Columbus, OH 43218-3990, or by email to
[email protected]. Since contact information can change, you may want to verify the currency of this address
information using the ASSIST Online database at: https://assist.dla.mil/.
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MIL-STD-883-3
iii
CONTENTS
PARAGRAPH Page
1. SCOPE ............................................................................................................................... 1
1.1 Purpose ............................................................................................................................ 1
1.2 Numbering system ........................................................................................................... 1
2. APPLICABLE DOCUMENTS ............................................................................................. 1
2.1 General ............................................................................................................................. 1
2.2 Government documents ................................................................................................... 1
2.3 Non-Government publications .......................................................................................... 3
2.4 Order of precedence ........................................................................................................ 5
3. DEFINITIONS ..................................................................................................................... 5
3.1 Abbreviations, symbols, and definitions............................................................................ 5
4. GENERAL REQUIREMENTS ............................................................................................ 8
4.1 General ............................................................................................................................. 8
4.2 Test circuits ...................................................................................................................... 8
4.3 Destructive tests ............................................................................................................... 8
4.4 Laboratory suitability ........................................................................................................ 8
4.5 Method of reference ......................................................................................................... 8
5. DETAIL REQUIREMENTS ................................................................................................. 8
6. NOTES ............................................................................................................................... 8
6.1 Intended use ..................................................................................................................... 8
6.2 International standardization agreement .......................................................................... 8
6.3 Subject term (key word) listing ......................................................................................... 8
6.4 Supersession data ............................................................................................................ 8
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MIL-STD-883-3
iv
ELECTRICAL TESTS (DIGITAL)
3001.1 Drive source, dynamic
3002.1 Load conditions
3003.1 Delay measurements
3004.1 Transition time measurements
3005.1 Power supply current
3006.1 High level output voltage
3007.1 Low level output voltage
3008.1 Breakdown voltage, input or output
3009.1 Input current, low level
3010.1 Input current, high level
3011.1 Output short circuit current
3012.1 Terminal capacitance
3013.2 Noise margin measurements for digital microelectronic devices
3014 Functional testing
3015.9 Electrostatic discharge sensitivity classification
3016.1 Activation time verification
3017 Microelectronics package digital signal transmission
3018 Crosstalk measurements for digital microelectronic device packages
3019.2 Ground and power supply impedance measurements for digital microelectronics device
packages
3020 High impedance (off-state) low-level output leakage current
3021 High impedance (off-state) high-level output leakage current
3022 Input clamp voltage
3023.2 Static latch-up measurements for digital CMOS microelectronic devices
3024 Simultaneous switching noise measurements for digital microelectronic devices
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MIL-STD-883-3
1
1. SCOPE
1.1 Purpose. Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital)
to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For
the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid
microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is
intended to apply only to microelectronic devices.
1.2 Numbering system. The test methods are designated by numbers assigned in accordance with the following
system:
1.2.1 Classification of tests. The electrical test methods included in this part of a multipart test method standard
are numbered 3001 to 3024 inclusive.
1.2.2 Test method revisions. Revisions are numbered consecutively using a period to separate the test method
number and the revision number. For example, 3001.2 designates the second revision of test method 3001.
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, and 5 of this standard. This
section does not include documents cited in other sections of this standard or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements documents cited in sections 3, 4, and 5 of this
standard, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-680 - Degreasing Solvent, Performance Specification For.
MIL-PRF-19500 - Semiconductor Devices, General Specification For.
MIL-PRF-38534 - Hybrid Microcircuits, General Specification For.
MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification For.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-202 - Electronic and Electrical Component Parts.
MIL-STD-750 - Test Methods for Semiconductor Devices.
MIL-STD-1686 - Electrostatic Discharge Control Program for Protection of Electrical and Electronic
Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive
Devices).
MIL-STD-1835 - Electronic Component Case Outlines.
MIL-STD-1916 - DOD Preferred Methods for Acceptance of Product.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-217 - Reliability Prediction of Electronic Equipment.
MIL-HDBK-505 - Definitions of Item Levels, Item Exchangeability, Models, and Related Terms.
MIL-HDBK-781 - Reliability Test Methods, Plans, and Environments for Engineering, Development
Qualification, and Production .
MIL-HDBK-1331 - Parameters to be Controlled for the Specification of Microcircuits.
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