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EMVA Standard 1288

Standard for Characterization of Image

Sensors and Cameras

Release 3.0

November 29, 2010

Issued by

European Machine Vision Association

www.emva.org

Contents

1 Introduction and Scope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

2 Sensitivity, Linearity, and Noise . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

2.1 Linear Signal Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

2.2 Noise Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

2.3 Signal-to-Noise Ratio (SNR) . . . . . . . . . . . . . . . . . . . . . . . . . . 7

2.4 Signal Saturation and Absolute Sensitivity Threshold . . . . . . . . . . . . 7

3 Dark Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

3.1 Mean and Variance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

3.2 Temperature Dependence . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

4 Spatial Nonuniformity and Defect Pixels . . . . . . . . . . . . . . . . . . . . . . 8

4.1 Spatial Variances, DSNU, and PRNU . . . . . . . . . . . . . . . . . . . . . 9

4.2 Types of Nonuniformities . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

4.3 Defect Pixels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

4.3.1 Logarithmic Histograms. . . . . . . . . . . . . . . . . . . . . . . . . . 10

4.3.2 Accumulated Histograms. . . . . . . . . . . . . . . . . . . . . . . . . 11

4.4 Highpass Filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

5 Overview Measurement Setup and Methods . . . . . . . . . . . . . . . . . . . . 12

6 Methods for Sensitivity, Linearity, and Noise . . . . . . . . . . . . . . . . . . . . 12

6.1 Geometry of Homogeneous Light Source . . . . . . . . . . . . . . . . . . . . 12

6.2 Spectral Properties of Light Source . . . . . . . . . . . . . . . . . . . . . . . 13

6.3 Variation of Irradiation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

6.4 Calibration of Irradiation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

6.5 Measurement Conditions for Linearity and Sensitivity . . . . . . . . . . . . 15

6.6 Evaluation of the Measurements according to the Photon Transfer Method 15

Standard for Characterization

of Image Sensors and Cameras

Release 3.0, Nov. 29, 2010

6.7 Evaluation of Linearity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

7 Methods for Dark Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

7.1 Evaluation of Dark Current at One Temperature . . . . . . . . . . . . . . . 19

7.2 Evaluation of Dark Current with Temperatures . . . . . . . . . . . . . . . . 19

8 Methods for Spatial Nonuniformity and Defect Pixels . . . . . . . . . . . . . . . 21

8.1 Spatial Standard Deviation, DSNU, PRNU . . . . . . . . . . . . . . . . . . 21

8.2 Horizontal and Vertical Spectrograms . . . . . . . . . . . . . . . . . . . . . 24

8.3 Defect Pixel Characterization . . . . . . . . . . . . . . . . . . . . . . . . . . 25

9 Methods for Spectral Sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

9.1 Spectral Light Source Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

9.2 Measuring Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

9.3 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

9.4 Evaluation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

10 Publishing the Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29

10.1 Basic Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

10.2 The EMVA 1288 Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . 30

10.3 The EMVA 1288 Datasheet . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

10.4 Template Datasheet . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

A Bibliography . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

B Notation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

C Changes to Release A2.01 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

C.1 Added Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

C.2 Extension of Methods to Vary Irradiation . . . . . . . . . . . . . . . . . . . 33

C.3 Modiﬁcations in Conditions and Procedures . . . . . . . . . . . . . . . . . . 33

C.4 Limit for Minimal Temporal Standard Deviation; Introduction of Quantiza-

tion Noise . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

C.5 Highpass Filtering with Nonuniformity Measurements . . . . . . . . . . . . 35

2 of 36

 Copyright EMVA, 2010

Standard for Characterization

of Image Sensors and Cameras

Release 3.0, Nov. 29, 2010

Acknowledgements

Please refer to www.standard1288.org for the list of contributors to the Standard.

EMVA 1288 is an initiative driven by the industry and living from the personal initiative

of the supporting companies and institutions delegates as well as from the support of these

organizations. Thanks to this generosity the presented document can be provided free of

charge to the users of this standard. EMVA thanks those contributors in the name of the

whole vision community.

Rights and Trademarks

The European Machine Vision Association owns the ”EMVA, standard 1288 compliant” logo.

Any company can obtain a license to use the ”EMVA standard 1288 compliant” logo, free

of charge, with product speciﬁcations measured and presented according to the deﬁnitions

in EMVA standard 1288. The licensee guarantees that he meets the terms of use in the

relevant release of EMVA standard 1288. Licensed users will self-certify compliance of their

measurement setup, computation and representation with which the ”EMVA standard 1288

compliant” logo is used. The licensee has to check regularly compliance with the relevant

release of EMVA standard 1288, at least once a year. When displayed on line the logo has

to be featured with a link to EMVA standardization web page. EMVA will not be liable

for speciﬁcations not compliant with the standard and damage resulting there from. EMVA

keeps the right to withdraw the granted license any time and without giving reasons.

About this Standard

EMVA has started the initiative to deﬁne a uniﬁed method to measure, compute and present

speciﬁcation parameters and characterization data for cameras and image sensors used for

machine vision applications. The standard does not deﬁne what nature of data should be

disclosed. It is up to the component manufacturer to decide if he wishes to publish typical

data, data of an individual component, guaranteed data, or even guaranteed performance

over life time of the component. However the component manufacturer shall clearly indicate

what the nature of the presented data is. The standard is organized in diﬀerent sections,

each addressing a group of speciﬁcation parameters, assuming a certain physical behavior

of the sensor or camera under certain boundary conditions. Additional sections covering

more parameters and a wider range of sensor and camera products will be added succes-

sively. There are compulsory sections, of which all measurements must be made and of

which all required data and graphics must be included in a datasheet using the EMVA1288

logo. Further there are optional sections which may be skipped for a component where the

respective data is not relevant or the mathematical model is not applicable. Each datasheet

shall clearly indicate which sections of the EMVA1288 standard are enclosed.

It may be necessary for the manufacturer to indicate additional, component speciﬁc

information, not deﬁned in the standard, to fully describe the performance of image sensor

or camera products, or to describe physical behavior not covered by the mathematical models

of the standard. It is possible in accordance with the EMVA1288 standard to include such

data in the same datasheet. However the data obtained by procedures not described in the

current release of the EMVA1288 standard must be clearly designated and grouped in a

separate section. It is not permitted to use parameter designations deﬁned in any of the

EMVA1288 modules for such additional information not acquired or presented according

the EMVA1288 procedures.

The standard is intended to provide a concise deﬁnition and clear description of the

measurement process and to beneﬁt the Automated Vision Industry by providing fast, com-

prehensive and consistent access to speciﬁcation information for cameras and sensors. It will

be particularly beneﬁcial for those who wish to compare cameras or who wish to calculate

system performance based on the performance speciﬁcations of an image sensor or a camera.

 Copyright EMVA, 2010 3 of 36

Standard for Characterization

of Image Sensors and Cameras

Release 3.0, Nov. 29, 2010

1 Introduction and Scope

This release of the standard covers monochrome and color digital cameras with linear photo

response characteristics. It is valid for area scan and line scan cameras. Analog cameras

can be described according to this standard in conjunction with a frame grabber; similarly,

image sensors can be described as part of a camera. If not speciﬁed otherwise, the term

camera is used for all these items.

The standard text is parted into four sections describing the mathematical model and

parameters that characterize cameras and sensors with respect to

• Section 2: linearity, sensitivity, and noise for monochrome and color cameras,

• Section 3: dark current,

• Section 4: sensor array nonuniformities and defect pixels characterization,

a section with an overview of the required measuring setup (Section 5), and ﬁve sections

that detail the requirements for the measuring setup and the evaluation methods for

• Section 6: linearity, sensitivity, and noise,

• Section 7: dark current,

• Section 8: sensor array nonuniformities and defect pixels characterization,

• Section 9: spectral sensitivity,

The detailed setup is not regulated in order not to hinder progress and the ingenuity of

the implementers. It is, however, mandatory that the measuring setups meet the properties

speciﬁed by the standard. Section 10 ﬁnally describes how to produce the EMVA 1288

datasheets. Appendix B describes the notation and Appendix C details the changes to

release 2

It is important to note that the standard can only be applied if the camera under test can

actually be described by the mathematical model on which the standard is based. If these

conditions are not fulﬁlled, the computed parameters are meaningless with respect to the

camera under test and thus the standard cannot be applied. Currently, electron multiplying

cameras (EM CCD, [1, 2]) and cameras that are sensitive in the deep ultraviolet, where more

than one electron per absorbed photon is generated [5], are not covered by the standard.

The general assumptions include

1. The amount of photons collected by a pixel depends on the product of irradiance E

(units W/m

) and exposure time t

exp

(units s), i. e., the radiative energy density Et

exp

at the sensor plane.

2. The sensor is linear, i. e., the digital signal y increases linear with the number of photons

received.

3. All noise sources are wide-sense stationary and white with respect to time and space.

The parameters describing the noise are invariant with respect to time and space.

4. Only the total quantum eﬃciency is wavelength dependent. The eﬀects caused by light

of diﬀerent wavelengths can be linearly superimposed.

5. Only the dark current is temperature dependent.

These assumptions describe the properties of an ideal camera or sensor. A real sensor will

depart more or less from an ideal sensor. As long as the deviation is small, the description is

still valid and it is one of the tasks of the standard to describe the degree of deviation from

an ideal behavior. However, if the deviation is too large, the parameters derived may be too

uncertain or may even render meaningless. Then the camera cannot be characterized using

this standard. The standard can also not be used for cameras that clearly deviate from one

of these assumptions. For example, a camera with a logarithmic instead of a linear response

curve cannot be described with the present release of the standard.

4 of 36

 Copyright EMVA, 2010

Standard for Characterization

of Image Sensors and Cameras

Release 3.0, Nov. 29, 2010

A number of

photons

...

... hitting the

pixel area

during exposure time ...

... creating a number of

electrons

...

... forming a

charge

which is converted

by a

capacitor

to a

voltage

...

... being

amplified

...

... and

digitized

...

... resulting in the

digital gray value

quantum

efficiency

system

gain

number of

photons

number of

electrons

digital

grey value

dark noise

quantization noise

Figure 1: a Physical model of the camera and b Mathematical model of a single pixel.

2 Sensitivity, Linearity, and Noise

This section describes how to characterize the sensitivity, linearity, and temporal noise of

an image sensor or camera [3, 4, 6, 8].

2.1 Linear Signal Model

As illustrated in Fig. 1, a digital image sensor essentially converts photons hitting the pixel

area during the exposure time by a sequence of steps ﬁnally into a digital number. During

the exposure time on average µ

photons hit the whole area A of a single pixel. A fraction

η(λ) =

(1)

of them, the total quantum eﬃciency, is absorbed and accumulates µ

charge units.

The

total quantum eﬃciency as deﬁned here refers to the total area occupied by a single sensor

elementpixel not only the light sensitive area. Consequently, this deﬁnition includes the

eﬀects of ﬁll factor and microlenses. As expressed in Eq. (1), the quantum eﬃciency depends

on the wavelength of the photons irradiating the pixel.

The mean number of photons that hit a pixel with the area A during the exposure time

exp

can be computed from the irradiance E on the sensor surface in W/m

AEt

exp

hν

AEt

exp

hc/λ

, (2)

using the well-known quantization of the energy of electromagnetic radiation in units of

hν. With the values for the speed of light c = 2.99792458 · 10

m/s and Planck’s constant

h = 6.6260755 · 10

−34

Js, the photon irradiance is given by

[photons] = 5.034 · 10

· A[m

] · t

exp

[s] · λ[m] · E





, (3)

or in more handy units for image sensors

[photons] = 50.34 · A[µm

] · t

exp

[ms] · λ[µm] · E



µW



. (4)

These equations are used to convert the irradiance calibrated by radiometers in units of

W/cm

into photon ﬂuxes required to characterize imaging sensors.

The actual mechanism is diﬀerent for CMOS sensors, however, the mathematical model for CMOS is

the same as for CCD sensors

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