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Test Plan for Wireless Device
Over-the-Air Performance
CTIA 01.21 Test Methodology, SISO, Reverberation
Chamber
Version 7.0.0
April 2024
© 2001 - 2024 CTIA Certification. All Rights Reserved.
Any reproduction, modification, alteration, creation of a derivative work, or transmission of all or any part of this publication (“Test Plan”), in any form, by any
means, whether electronic or mechanical, including photocopying, recording, or via any information storage and retrieval system, without the prior written
permission of CTIA Certification, is unauthorized and strictly prohibited by federal copyright law. This Test Plan is solely for use within the CTIA Certification
Program. Any other use of this Test Plan is strictly prohibited unless authorized by CTIA Certification or its assigns in writing.
CTIA 01.21, Version 7.0.0
2 © 2001 - 2024 CTIA Certification. All Rights Reserved.
Use Instructions
All testing shall be performed in a CTIA Certification Authorized Test Lab and shall be initiated through
one of the following methods:
1. By submitting a PTCRB or IoT Network Certified device certification request at
https://certify.ptcrb.com/
2. By submitting an OTA Test Plan use request at https://certify.ctiacertification.org/
CTIA Certification LLC
1400 16th Street, NW
Suite 600
Washington, DC 20036
1.202.785.0081
programs@ctiacertification.org
ctiacertification.org/test-plans/
CTIA 01.21, Version 7.0.0
3 © 2001 - 2024 CTIA Certification. All Rights Reserved.
Table of Contents
Section 1 Reverberation Chamber Test Overview ............................................................................... 5
1.1 Equipment Required for Device Testing in Reverberation Chambers ................................. 6
1.1.1 The Reverberation Chamber ................................................................................................ 7
1.1.2 Measurement Antenna(s) ..................................................................................................... 7
1.1.3 Reference Antenna ............................................................................................................... 7
1.1.4 Vector Network Analyzer ...................................................................................................... 8
1.1.5 RF Absorber ......................................................................................................................... 8
1.1.6 Cables and Adapters ............................................................................................................ 8
1.2 Acronyms and Definitions ..................................................................................................... 8
1.3 Document References .......................................................................................................... 9
Section 2 Transmitter and Receiver Performance Assessment of IoT Devices ................................. 11
2.1 Test Procedure - Estimating the Reference Power Transfer Function and Corresponding
Uncertainty for a DUT Measurement .......................................................................................................... 11
2.2 Test Procedure – Total Radiated Power ............................................................................ 12
2.3 Test Procedure – Receiver Performance ........................................................................... 13
Section 3 Measurement Uncertainty .................................................................................................. 15
3.1 General Considerations ...................................................................................................... 15
3.2 TRP Tests ........................................................................................................................... 15
3.2.1 DUT Measurement ............................................................................................................. 15
3.2.2 Reference Measurement .................................................................................................... 16
3.2.3 Calculation of the Combined and Expanded Uncertainties for the Overall TRP
Measurement ...................................................................................................................... 17
3.3 TIS Tests ............................................................................................................................ 17
3.3.1 DUT Measurement ............................................................................................................. 18
3.3.2 Reference Measurement .................................................................................................... 19
3.3.3 Calculation of the Combined and Expanded Uncertainties for the Overall TIS
Measurement ...................................................................................................................... 20
3.4 Criteria—Measurement Uncertainty ................................................................................... 20
Revision History .................................................................................................................. 22
CTIA 01.21, Version 7.0.0
4 © 2001 - 2024 CTIA Certification. All Rights Reserved.
List of Figures
Figure 1.1-1 Typical Measurement Set-Up for Characterizing the Chamber Power Transfer Function in a
Reverberation Chamber. (a) Large-form-factor device. (b) Small-form-factor Device with Phantom .. 6
Figure 1.1.1-1 Test Volume For a Reverberation Chamber Using a Turntable, Where Aux1 And Aux2 Are
Defined In CTIA 01.73 [7] Section 6.2.2 ............................................................................................... 7
Figure 2.2-1 Example Setup for Total Radiated Power and Total Isotropic Sensitivity Measurements in a
Reverberation Chamber. RF Absorber (“RF abs”) Has Been Included to Broaden the Coherence
Bandwidth. (a) Setup for a Large-Form-Factor Device Test. (b) Setup for a Small-Form-Factor IoT
Device Test with a Phantom. .............................................................................................................. 12
List of Tables
Table 1.2-1 Glossary .................................................................................................................................... 9
Table 3.2.1-1 TRP Standard Uncertainties for the Contributions in the DUT Measurement Part ............. 16
Table 3.2.2-1 TRP Standard Uncertainties for the Contributions in the Reference Measurement Part .... 17
Table 3.3.1-1 TIS Standard Uncertainties for the Contributions in the DUT Measurement Part ............... 19
Table 3.3.2-1 TIS standard uncertainties for the contributions in the reference measurement part ......... 20
Table 3.4-1 Expanded Uncertainty Maximum Limits for Different Configurations for TRP and TIS ........... 21
CTIA 01.21, Version 7.0.0
5 © 2001 - 2024 CTIA Certification. All Rights Reserved.
Section 1 Reverberation Chamber Test Overview
Cellular-enabled machine-to-machine (M2M) and wireless-internet-of-things (W-IoT) devices can take on
many shapes and form factors, from health and fitness monitors worn on the wrist to vending machines
and car dashboards. The over-the-air (OTA) performance of larger IoT devices, those having a physical
dimension greater than 42 cm and smaller W-IoT devices, including tests conducted with phantoms, may
be evaluated using reverberation chambers, as described in Section 1.3 of CTIA 01.01 [1]. The exact
placement of the device within the valid test volume of a reverberation chamber is not critical. This can be
an advantage in some cases, for example, for large devices that may be heavy or awkward to position
precisely or for devices where the exact location of the radiating element is not known. When properly
configured, the reverberation chamber provides Total Radiated Power (TRP) and Total Isotropic
Sensitivity (TIS) values for SISO wireless devices with uncertainties comparable to anechoic chambers.
The reverberation chamber produces a multipath environment with a decaying time response. In loaded
reverberation chambers, instantaneous channels corresponding to individual, stepped, mode-stirring
states have a time and spatial dependence (also manifested as a frequency dependence). For most
metrics of interest, the ensemble of stepped mode-stirring states is averaged to provide statistically
determinable channel characteristics. By carefully loading the chamber, the frequency dependence can
be reduced to a level that allows viable wireless communication (e.g. approximating a flat-fading channel)
while still maintaining the statistical nature of the measurement result. That is the approach taken in this
test plan.
In stepped mode, each measurement is acquired over a static multipath channel that is assumed to be
relatively flat in frequency over the coherence bandwidth to be tested. No Doppler component or other
time dependent variations are present during each error rate measurement. Note that when the
reverberation chamber is continuously stirred, additional time-dependent fading occurs. Consequently,
TIS measurements are made using step-wise stirring to eliminate this additional temporal fading during
each TIS measurement.
The reverberation chamber configuration(s) necessary to allow accurate SISO testing of large-form-factor
IoT devices and small-form-factor IoT devices in free space or with phantoms is thoroughly described in
this document. In addition to proper configuration and validation steps, chamber pre-characterization is
described. Because the reverberation chamber must typically be loaded with RF absorber for wireless-
system tests ([2], [3], [4]) and the RF absorbing properties of the equipment under test may affect the
performance of the reverberation chamber ([5], [6]) the chamber’s power transfer function
characterization steps must be carried out under the loading conditions under which the DUT will be
tested. Pre-characterization allows the test lab to measure certain parameters in advance of the actual
device test in order to save time during actual DUT performance testing.
The testing requirements fall into three categories:
1. Procedures for configuring and pre-characterizing certain parameters of the test system.
2. Pre-characterizing certain parameters of the test system.
3. Estimating the power transfer function (path loss) of the test system for the DUT test and
measuring the performance of the wireless device.
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