-2-
IEC
61215-1:2021
©IEC
2021
CONTENTS
FOREWORD
4
INTRODUCTION
6
1
Scope
................................................................................................................................
7
2
Normative
references
........................................................................................................
7
3
Terms,
definitions
and
abbreviated
terms
.........................................................................
9
4
Test
samples
.................................................................................................................
11
5
Marking
and
documentation
.............................................................................................
13
5.1
Name
plate
.............................................................................................................
13
5.2
Documentation
........................................................................................................
13
5.2.1
Minimum
requirements
....................................................................................
13
5.2.2
Information
to
be
given
in
the
documentation
..................................................
13
5.2.3
Assembly
instructions
....................................................................................
15
6
Testing
...........................................................................................................................
15
7
Pass
criteria
....................................................................................................................
17
7.1
General
仃
7.2
Power
output
and
electric
circuitry
...........................................................................
18
7.2.1
Identification
of
rated
values
and
tolerances
...................................................
18
7.2.2
Verification
of
rated
label
values
f
Gate
No.
1
..............................................
20
7.2.3
Maximum
power
degradation
during
type
ap
proval
testing
f
Gate
No.
2
......
23
7.2.4
Electrical
circuitry
...............................................................................................
23
7.3
Visual
defects
.........................................................................................................
23
7.4
Electrical
safety
23
8
Major
visual
defects
.........................................................................................................
24
9
Report
............................................................................................................................
24
10
Modifications
.................................................................................................................
25
11
Test
flow
and
procedures
26
Annex
A
(informative)
Changes
from
previous
edition
...........................................................
28
A.1
General
....................................................................................................................
28
A.2
Procedures
for
bifacial
modules
...............................................................................
28
A.3
Use
of
representative
samples
.................................................................................
30
A.4
Addition
of
dynamic
mechanical
load
test
...............................................................
31
A.5
Addition
of
test
for
potential
induced
degradation
...................................................
31
A.6
Simulator
requirements
..........................................................................................
33
A.6.1
General
...........................................................................................................
33
A.6.
2
Rationale
for
changes
to
spectral
requirements
..............................................
34
A.6.
3
Rationale
for
changes
to
uniformity
requirements
...........................................
35
A.7
References
to
retest
guidelines
..............................................................................
36
A.8
Weight
on
junction
boxes
.........................................................................................
36
A.9
Correction
to
monolithically-integrated
hot-spot
enduranee
test
..............................
36
A.10
Number
of
modules
in
sequence
..............................................................................
38
A.1
1
Removal
of
nominal
module
operating
temperature
(NMOT)
...................................
39
A.12
Very
low
currents
during
thirkfilm
tests
...................................................................
40
A.13
Limit
bypass
diode
testing
to
three
diodes
...............................................................
40
A.14
Revert
the
insulation
test
to
2005
version
...............................................................
40
A.15
Bending
test
.............................................................................................................
41
