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高速电子连接器线缆特性阻抗、反射系数、回波损耗、驻波测试标准
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高速电子连接器线缆特性阻抗、反射系数、回波损耗、驻波测试标准
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EIA
STANDARD
TP-108
Impedance, Reflection Coefficient,
Return Loss, and VSWR Measured in
the Time and Frequency Domain Test
Procedure for Electrical Connectors,
Cable Assemblies or Interconnection
EIA-364-108
ANSI/EIA-364-108-2000(R2007)
Approved: July 7, 2000
Reaffirmed: March 1, 2007
Systems
EIA-364-108
JULY 2000
ELECTRONIC COMPONENTS, ASSEMBLIES & MATERIALS
ASSOCIATION
THE ELECTRONIC COMPONENT SECTOR OF THE ELECTRONIC INDUSTRIES ALLIANCE
Copyright Electronic Components, Assemblies & Materials Association
Provided by IHS under license with ECA
Licensee=IHS Employees/1111111001, User=Japan, IHS
Not for Resale, 08/04/2008 03:13:06 MDT
No reproduction or networking permitted without license from IHS
--``,,,`,`,,`,,`````,``,`````,,`-`-`,,`,,`,`,,`---
NOTICE
EIA Engineering Standards and Publications are designed to serve the public interest through
eliminating misunderstandings between manufacturers and purchasers, facilitating
interchangeability and improvement of products, and assisting the purchaser in selecting and
obtaining with minimum delay the proper product for his particular need. Existence of such
Standards and Publications shall not in any respect preclude any member or nonmember of EIA
from manufacturing or selling products not conforming to such Standards and Publications, nor
shall the existence of such Standards and Publications preclude their voluntary use by those
other than EIA members, whether the standard is to be used either domestically or
internationally.
Standards and Publications are adopted by EIA in accordance with the American National
Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to
any patent owner, nor does it assume any obligation whatever to parties adopting the Standard
or Publication.
This EIA Standard is considered to have International Standardization implication, but the
International Electrotechnical Commission activity has not progressed to the point where a valid
comparison between the EIA Standard and the IEC document can be made.
This Standard does not purport to address all safety problems associated with its use or all
applicable regulatory requirements. It is the responsibility of the user of this Standard to
establish appropriate safety and health practices and to determine the applicability of regulatory
limitations before its use.
(From Standards Proposal No. 4454-A, formulated under the cognizance of the CE-2.0 National
Connector Standards Committee.)
Published by
©ELECTRONIC INDUSTRIES ALLIANCE 2000
Technology Strategy & Standards Department
2500 Wilson Boulevard
Arlington, VA 22201
PRICE: Please refer to the current
Catalog of EIA Electronic Industries Alliance Standards and Engineering Publications
or call Global Engineering Documents, USA and Canada (1-800-854-7179)
International (303-397-7956)
All rights reserved
Printed in U.S.A.
Copyright Electronic Components, Assemblies & Materials Association
Provided by IHS under license with ECA
Licensee=IHS Employees/1111111001, User=Japan, IHS
Not for Resale, 08/04/2008 03:13:06 MDT
No reproduction or networking permitted without license from IHS
--``,,,`,`,,`,,`````,``,`````,,`-`-`,,`,,`,`,,`---
PLEASE!
DON”T VIOLATE
THE
LAW!
This document is copyrighted by the EIA and may not be reproduced without
permission.
Organizations may obtain permission to reproduce a limited number of copies
through entering into a license agreement. For information, contact:
Global Engineering Documents
15 Inverness Way East
Englewood, CO 80112-5704 or call
U.S.A. and Canada 1-800-854-7179, International (303) 397-7956
Copyright Electronic Components, Assemblies & Materials Association
Provided by IHS under license with ECA
Licensee=IHS Employees/1111111001, User=Japan, IHS
Not for Resale, 08/04/2008 03:13:06 MDT
No reproduction or networking permitted without license from IHS
--``,,,`,`,,`,,`````,``,`````,,`-`-`,,`,,`,`,,`---
Copyright Electronic Components, Assemblies & Materials Association
Provided by IHS under license with ECA
Licensee=IHS Employees/1111111001, User=Japan, IHS
Not for Resale, 08/04/2008 03:13:06 MDT
No reproduction or networking permitted without license from IHS
--``,,,`,`,,`,,`````,``,`````,,`-`-`,,`,,`,`,,`---
i
CONTENTS
Clause Page
1 Introduction .............................................................................................................. 1
1.1 Scope ........................................................................................................................ 1
1.2 Object ....................................................................................................................... 1
1.3 Definitions ................................................................................................................ 1
2 Test resources ........................................................................................................... 3
2.1 Equipment ................................................................................................................ 3
2.2 Fixture ...................................................................................................................... 4
3 Test specimen ........................................................................................................... 6
3.1 Description ............................................................................................................... 6
4 Test procedure .......................................................................................................... 6
4.1 Time domain ............................................................................................................ 6
4.2 Frequency domain .................................................................................................... 8
5 Details to be specified .............................................................................................. 10
6 Test documentation .................................................................................................. 11
Figure
A.1 Example of rise time measurement points ............................................................... A-1
A.2 Example of TDR output; 2 curves (different rise times) and start and stop
specimen points ........................................................................................................ A-2
A.3 Example of analyzer output, impedance vs. log frequency plot ............................... A-3
C.1 Typical mother board test fixture ............................................................................. C-2
C.2 Typical daughter board test fixture ........................................................................... C-2
C.3 Example of near end reference trace ........................................................................ C-5
D.1 Example of an impedance profile of connector using a measurement system
rise time of 35 ps ...................................................................................................... D-1
D.2 Example of impedance profiles of cable under the rise time of 35 ps and 1 ns ....... D-2
E.1 Single-ended terminations ........................................................................................ E-1
E.2 Differential (balanced) terminations ........................................................................ E-2
G.1 Microstrip (a) and stripline (b) geometries ............................................................... G-1
G.2 Buried microstrip geometry ...................................................................................... G-2
Copyright Electronic Components, Assemblies & Materials Association
Provided by IHS under license with ECA
Licensee=IHS Employees/1111111001, User=Japan, IHS
Not for Resale, 08/04/2008 03:13:06 MDT
No reproduction or networking permitted without license from IHS
--``,,,`,`,,`,,`````,``,`````,,`-`-`,,`,,`,`,,`---
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