工业缺陷检测项目数据-晶体管缺陷检测数据集.zip

Attribution ----------- If you use the dataset in scientific work, please cite: Paul Bergmann, Michael Fauser, David Sattlegger, and Carsten Steger, "A Comprehensive Real-World Dataset for Unsupervised Anomaly Detection", IEEE Conference on Computer Vision and Pattern Recognition, 2019 License ------- Copyright 2019 MVTec Software GmbH This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License. You should have received a copy of the license along with this work. If not, see <http://creativecommons.org/licenses/by-nc-sa/4.0/>. For using the data in a way that falls under the commercial use clause of the license, please contact us. Contact ------- If you have any questions or comments about the dataset, feel free to contact us via: paul.bergmann@mvtec.com, fauser@mvtec.com, sattlegger@mvtec.com, steger@mvtec.com