WafermapDisplay

WafermapDisplay =============== c# project providing a wafer map control This project aims to provide a way to visualize wafer map data in windows applications A wafer map is something specific to semiconductor industry and usually the data is coming from Wafer Probe using ATE A more detailed documentation is coming soon (as soon as I've got time to do it) Basically the useage should be quite self explaining In the meantime I'll just provide a snipped out of my test class: for (int waferNum = 0; waferNum < nrWafers; waferNum++) { // Create sample dataset int[,] data = new int[300, 300]; Random binGenerator = new Random(waferNum); for (int x = 0; x < 300; x++) { for (int y = 0; y < 300; y++) { data[x, y] = binGenerator.Next(8); } } WafermapImpl wmap = new WafermapImpl(); wmap.Dataset = data; wmap.Notchlocation = 90; wmap.MinimumSize = new Size(250,250); wmap.Interactive = true; //this.Controls.Add(wmap); flowLayoutPanel1.Controls.Add(wmap); } Here's the implementation class: class WafermapImpl : Wafermap { public override void dieEntered(int x, int y, int bincode) { // Do nothing } public override void dieClicked(int x, int y, int bincode, System.Windows.Forms.MouseButtons btn) { // Cast if (btn == MouseButtons.Left) { // Update dataset Dataset[x, y] = 2; // Show the changes updateDie(x, y, 2); } else { // Rotation test int rot=Rotation + 90; if (rot > 270) rot = rot - 360; Rotation = rot; Invalidate(); } } } The 2 overwrittern methods get called by the Wafermap class when a die is clicked or when the mouse pointer enters a die in the visualization