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Compact and stable real-time dual-wavelength

digital holographic microscopy with a long-

working distance objective

RONGLI GUO

AND FAN WANG

School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, China

*guorongli@xatu.edu.cn

Abstract: We propose a compact dual wavelength digital holographic Microscopy (DHM)

based on a long working distance objective, which enabling quantitative phase imaging of

opaque samples with extended measurement range in one shot. The compactness of the

configuration is achieved by constructing a miniature modified Michelson interferometer

between the objective and the sample, and as a result it provides higher temporal stability than

conventional dual wavelength DHM. In the setup, the propagation directions of two reference

beams of different wavelengths can be independently adjusted, and thus two off axis

interferograms having orthogonal fringe directions can be simultaneously captured through a

monochrome CCD camera. The unambiguous vertical measurement range in optical path

length is extended to 8.338 μm, the length of a synthetic wavelength, by selecting two

wavelengths with a gap of 52 nm. The capability of the proposed setup is demonstrated with

measurements of a standard 1.8 μm height step as well as a moving micro staircase structure.

OCIS codes: (090.1995) Digital holography; (120.5050) Phase measurement; (180.6900) Three-dimensional

microscopy; (090.4220) Multiplex holography.

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Vol. 25, No. 20 | 2 Oct 2017 | OPTICS EXPRESS 24512

#303937

https://doi.org/10.1364/OE.25.024512

Received 2 Aug 2017; revised 22 Sep 2017; accepted 22 Sep 2017; published 26 Sep 2017

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1. Introduction

Digital holographic microscopy (DHM) is a powerful measuring technique which provides

quantitative phase information related to microscopic specimens [1–6]. Due to its noncontact,

wide-field and high precision nature, it has been widely used in surface micro-topography [7–

11] and biological cell imaging [12–14]. In single-wavelength DHM, usually the wrapped

phase within the range [-π π] is firstly constructed from a interferogram [3], and then a phase

unwrapping algorithm is applied to unwrap it to get continuous phase map [15], which is

proportional to the optical path lengths (OPL) of the tested specimen. In addition to the

drawback that the unwrapping algorithm is usually computationally demanding, the

maximum measurable OPL between adjacent sampling points of a specimen is restricted to

one time of wavelength, specifically, the maximum height difference is half the wavelength in

reflection mode when measuring abrupt steps; otherwise the algorithm will fail and result in

an error.

Vol. 25, No. 20 | 2 Oct 2017 | OPTICS EXPRESS 24513

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