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RESEARCH AND DESIGN OF LOW JITTER, WIDE LOCKING-RANGE
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PHASE-LOCKED loops (PLLs) and delay-locked loops (DLLs) are often used in integrated circuits in order to compensate for clock distribution delays and to improve overall system timing. PLLs are also widely used in clock recovery and frequency synthesis. When compared to traditional implementations of PLLs and DLLs, an all-digital approach will be found more suitable for monolithic implementation on the same die with other digital circuits. A robust, process-independent performance is expected using all digital techniques.
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RESEARCH AND DESIGN OF LOW JITTER, WIDE LOCKING-RANGE
ALL-DIGITAL
PHASE-LOCKED AND DELAY-LOCKED LOOPS
A Dissertation
Presented in Partial Fulfillment of the Requirements for the
Degree of Doctor of Philosophy
with a
Major in Electrical Engineering
in the
College of Graduate Studies
University of Idaho
by
Feng Lin
March 2000
Major Professor: Russel Jacob Baker, Ph.D.
ii
AUTHORIZATION TO SUBMIT
DISSERTATION
This dissertation of Feng Lin, submitted for the degree of Doctor of Philosophy with a major
in Electrical Engineering and titled “Research and Design of Low Jitter, Wide Locking-
Range All-Digital Phase-Locked and Delay-Locked Loops,” has been reviewed in final form.
Permission, as indicated by the signatures and dates given below, is now granted to submit
final copies to the College of Graduate Studies for approval.
Major Professor _________________________________Date _________________
R. Jacob Baker
Committee Members _____________________________Date _________________
Harry Li
_____________________________Date _________________
Richard Wells
_____________________________Date _________________
James Frenzel
_____________________________Date _________________
Larry Stauffer
Department
Administrator ___________________________________Date _________________
Dave Egolf
Discipline’s
College Dean ____________________________________Date _________________
David E. Thompson
Final Approval and Acceptance by the College of Graduate Studies
____________________________________Date ________________
Charles R. Hatch
iii
Abstract
PHASE-LOCKED loops (PLLs) and delay-locked loops (DLLs) are often used in integrated
circuits in order to compensate for clock distribution delays and to improve overall system
timing. PLLs are also widely used in clock recovery and frequency synthesis. When
compared to traditional implementations of PLLs and DLLs, an all-digital approach will be
found more suitable for monolithic implementation on the same die with other digital
circuits. A robust, process-independent performance is expected using all digital techniques.
In this dissertation, several aspects of phase-locked and delay-locked loops are
investigated, including building blocks, loop dynamics, noise and jitter. General design
criteria are summarized for the all-digital implementation with the comparison to the
traditional approaches and popular charge-pump analog implementation.
An all-digital phase-locked loop (ADPLL) using a proposed register-controlled
oscillator (RCO) and all-digital phase frequency detector (PFD) is developed and fabricated
using 0.18um CMOS technology. The two-loop architecture, hierarchy pull-in process and
fine phase adjustment make this RCO-based ADPLL achieve less than 80-cycle lock time,
65MHz-385MHz lock range, 30ps RMS jitter and less than 2% duty cycle distortion when
the reference clock is at 200MHz. This ADPLL also shows stable operation when power
supply voltage is down to 1.4V, which gives more flexibility in low power applications
without significant design modification.
iv
A register-controlled symmetrical DLL (RSDLL), targeted for clock synchronization
and de-skewing in double-data rate synchronous DRAM, is implemented based on a
symmetrical register-controlled delay line. This RSDLL was fabricated using 0.21μm
CMOS technology and achieved 50ps RMS jitter when the operating frequency is in the
range of 125MHz to 250MHz. This approach eliminates extra circuitry for duty cycle
correction when using both rising and falling edges to latch data. Measurement results are
presented to verify its robust operation under different voltage and temperature conditions.
v
Acknowledgements
I’d like to thank my dissertation advisor Dr. Jacob Baker for his direction, encouragement in
this work. Micron Technology Inc. (MTI) funded this project, manufactured the chip and
provided measurement supports, which deserves my special thanks. I’d also like to thank
Brent Keeth and Ron Harrison for their valuable discussion; Aaron Schoenfeld for his test
setup; and Barbara Cobb, Jim Fabbri, Jeremy Gum, and Suzy Mcdonald for their layout
support of this work.
During the course of this degree, my wife Hui has been very supportive and
understanding. My mother Jingyi and father Chunxun deserve many thanks for their support
and help.
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