Markov Random Field Modeling in Image Analysis

Advances in Pattern Recognition

For other titles published in this series, go to

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Stan Z. Li

Markov Random Field

Modeling in Image Analysis

Third Edition

123

Stan Z. Li

Series editor

Professor Sameer Singh, PhD

Research School of Informatics, Loughborough University, Loughborough, UK

ISBN: 978-1-84800-278-4 e-ISBN: 978-1-84800-279-1

DOI: 10.1007/978-1-84800-279-1

Advances in Pattern Recognition Series ISSN 1617-7916

British Library Cataloguing in Publication Data

A catalogue record for this book is available from the British Library

Library of Congress Control Number: 2008943235

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